{"id":"https://openalex.org/W4379875491","doi":"https://doi.org/10.1007/s00034-023-02415-1","title":"Rank-Awareness Sparse Blind Deconvolution Using Modulated Input","display_name":"Rank-Awareness Sparse Blind Deconvolution Using Modulated Input","publication_year":2023,"publication_date":"2023-06-08","ids":{"openalex":"https://openalex.org/W4379875491","doi":"https://doi.org/10.1007/s00034-023-02415-1"},"language":"en","primary_location":{"id":"doi:10.1007/s00034-023-02415-1","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1007/s00034-023-02415-1","pdf_url":null,"source":{"id":"https://openalex.org/S20109229","display_name":"Circuits Systems and Signal Processing","issn_l":"0278-081X","issn":["0278-081X","1531-5878"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320186","host_organization_name":"Birkh\u00e4user","host_organization_lineage":["https://openalex.org/P4310320186","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Birkh\u00e4user","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Circuits, Systems, and Signal Processing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102978239","display_name":"Jingchao Zhang","orcid":"https://orcid.org/0000-0002-3850-4947"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingchao Zhang","raw_affiliation_strings":["Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, 150086, China","Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, 150086, China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082151648","display_name":"Qian Cao","orcid":"https://orcid.org/0000-0002-1732-8817"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qian Cao","raw_affiliation_strings":["Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, 150086, China","Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, 150086, China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035318679","display_name":"Yinuo Su","orcid":"https://orcid.org/0009-0004-7423-6849"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yinuo Su","raw_affiliation_strings":["Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, 150086, China","Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, 150086, China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006333473","display_name":"Liyan Qiao","orcid":"https://orcid.org/0000-0002-7397-3458"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Liyan Qiao","raw_affiliation_strings":["Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, 150086, China","Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, 150086, China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5006333473"],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":0.21,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.44731091,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":"42","issue":"11","first_page":"6684","last_page":"6700"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11447","display_name":"Blind Source Separation Techniques","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/blind-deconvolution","display_name":"Blind deconvolution","score":0.9079232215881348},{"id":"https://openalex.org/keywords/deconvolution","display_name":"Deconvolution","score":0.8216638565063477},{"id":"https://openalex.org/keywords/sparse-approximation","display_name":"Sparse approximation","score":0.6223396062850952},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6024974584579468},{"id":"https://openalex.org/keywords/rank","display_name":"Rank (graph theory)","score":0.5127912163734436},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.5005044937133789},{"id":"https://openalex.org/keywords/compressed-sensing","display_name":"Compressed sensing","score":0.45074230432510376},{"id":"https://openalex.org/keywords/wiener-deconvolution","display_name":"Wiener deconvolution","score":0.42682361602783203},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41694480180740356},{"id":"https://openalex.org/keywords/demodulation","display_name":"Demodulation","score":0.41584813594818115},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.41207724809646606}],"concepts":[{"id":"https://openalex.org/C30044814","wikidata":"https://www.wikidata.org/wiki/Q11334452","display_name":"Blind deconvolution","level":3,"score":0.9079232215881348},{"id":"https://openalex.org/C174576160","wikidata":"https://www.wikidata.org/wiki/Q1183700","display_name":"Deconvolution","level":2,"score":0.8216638565063477},{"id":"https://openalex.org/C124066611","wikidata":"https://www.wikidata.org/wiki/Q28684319","display_name":"Sparse approximation","level":2,"score":0.6223396062850952},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6024974584579468},{"id":"https://openalex.org/C164226766","wikidata":"https://www.wikidata.org/wiki/Q7293202","display_name":"Rank (graph theory)","level":2,"score":0.5127912163734436},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.5005044937133789},{"id":"https://openalex.org/C124851039","wikidata":"https://www.wikidata.org/wiki/Q2665459","display_name":"Compressed sensing","level":2,"score":0.45074230432510376},{"id":"https://openalex.org/C15652857","wikidata":"https://www.wikidata.org/wiki/Q599016","display_name":"Wiener deconvolution","level":4,"score":0.42682361602783203},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41694480180740356},{"id":"https://openalex.org/C195251586","wikidata":"https://www.wikidata.org/wiki/Q1185939","display_name":"Demodulation","level":3,"score":0.41584813594818115},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.41207724809646606},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s00034-023-02415-1","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1007/s00034-023-02415-1","pdf_url":null,"source":{"id":"https://openalex.org/S20109229","display_name":"Circuits Systems and Signal Processing","issn_l":"0278-081X","issn":["0278-081X","1531-5878"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320186","host_organization_name":"Birkh\u00e4user","host_organization_lineage":["https://openalex.org/P4310320186","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Birkh\u00e4user","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Circuits, Systems, and Signal Processing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3732500361","display_name":null,"funder_award_id":"LBH-Z16087","funder_id":"https://openalex.org/F4320322295","funder_display_name":"Postdoctoral Foundation of Hei Long Jiang Province"},{"id":"https://openalex.org/G4272923490","display_name":null,"funder_award_id":"LH2022F019","funder_id":"https://openalex.org/F4320323085","funder_display_name":"Natural Science Foundation of Heilongjiang Province"},{"id":"https://openalex.org/G6657486246","display_name":null,"funder_award_id":"61701138","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322295","display_name":"Postdoctoral Foundation of Hei Long Jiang Province","ror":"https://ror.org/0426zh255"},{"id":"https://openalex.org/F4320323085","display_name":"Natural Science Foundation of Heilongjiang Province","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1987075379","https://openalex.org/W2045260838","https://openalex.org/W2101255151","https://openalex.org/W2135780853","https://openalex.org/W2140867429","https://openalex.org/W2141116650","https://openalex.org/W2142263374","https://openalex.org/W2145096794","https://openalex.org/W2149014962","https://openalex.org/W2160717452","https://openalex.org/W2516015953","https://openalex.org/W2533057217","https://openalex.org/W2586325539","https://openalex.org/W2958629450","https://openalex.org/W2995373699","https://openalex.org/W3008904489","https://openalex.org/W3087723003","https://openalex.org/W3109101710","https://openalex.org/W3157991651","https://openalex.org/W3202921856","https://openalex.org/W4250955649","https://openalex.org/W4299944093"],"related_works":["https://openalex.org/W4242983818","https://openalex.org/W2059639161","https://openalex.org/W584962943","https://openalex.org/W2059641814","https://openalex.org/W2348457039","https://openalex.org/W2141591465","https://openalex.org/W4321635651","https://openalex.org/W2139898842","https://openalex.org/W2589098082","https://openalex.org/W2155513095"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-04-10T15:06:20.359241","created_date":"2025-10-10T00:00:00"}