{"id":"https://openalex.org/W4206778551","doi":"https://doi.org/10.1007/s00034-021-01912-5","title":"A Reliable and Temperature Variation Tolerant 7T SRAM Cell with Single Bitline Configuration for Low Voltage Application","display_name":"A Reliable and Temperature Variation Tolerant 7T SRAM Cell with Single Bitline Configuration for Low Voltage Application","publication_year":2022,"publication_date":"2022-01-13","ids":{"openalex":"https://openalex.org/W4206778551","doi":"https://doi.org/10.1007/s00034-021-01912-5"},"language":"en","primary_location":{"id":"doi:10.1007/s00034-021-01912-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00034-021-01912-5","pdf_url":null,"source":{"id":"https://openalex.org/S20109229","display_name":"Circuits Systems and Signal Processing","issn_l":"0278-081X","issn":["0278-081X","1531-5878"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320186","host_organization_name":"Birkh\u00e4user","host_organization_lineage":["https://openalex.org/P4310320186","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Birkh\u00e4user","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Circuits, Systems, and Signal Processing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062185668","display_name":"Bhawna Rawat","orcid":"https://orcid.org/0000-0001-5953-0477"},"institutions":[{"id":"https://openalex.org/I863896202","display_name":"Delhi Technological University","ror":"https://ror.org/01ztcvt22","country_code":"IN","type":"education","lineage":["https://openalex.org/I863896202"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Bhawna Rawat","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Delhi Technological University, Delhi, 110042, India"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Delhi Technological University, Delhi, 110042, India","institution_ids":["https://openalex.org/I863896202"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014514657","display_name":"Poornima Mittal","orcid":"https://orcid.org/0000-0002-6815-8627"},"institutions":[{"id":"https://openalex.org/I863896202","display_name":"Delhi Technological University","ror":"https://ror.org/01ztcvt22","country_code":"IN","type":"education","lineage":["https://openalex.org/I863896202"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Poornima Mittal","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Delhi Technological University, Delhi, 110042, India"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Delhi Technological University, Delhi, 110042, India","institution_ids":["https://openalex.org/I863896202"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5062185668"],"corresponding_institution_ids":["https://openalex.org/I863896202"],"apc_list":null,"apc_paid":null,"fwci":1.6623,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.82967566,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"41","issue":"5","first_page":"2779","last_page":"2801"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.643428385257721},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.6426692605018616},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6135337352752686},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.588263988494873},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5565900206565857},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5168305039405823},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5102262496948242},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.503701388835907},{"id":"https://openalex.org/keywords/process-corners","display_name":"Process corners","score":0.4144502580165863},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3713957667350769},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.36038947105407715},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.34088534116744995},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3346569836139679},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17125210165977478},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1257171630859375}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.643428385257721},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.6426692605018616},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6135337352752686},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.588263988494873},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5565900206565857},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5168305039405823},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5102262496948242},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.503701388835907},{"id":"https://openalex.org/C192615534","wikidata":"https://www.wikidata.org/wiki/Q7247268","display_name":"Process corners","level":3,"score":0.4144502580165863},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3713957667350769},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.36038947105407715},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.34088534116744995},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3346569836139679},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17125210165977478},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1257171630859375},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s00034-021-01912-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00034-021-01912-5","pdf_url":null,"source":{"id":"https://openalex.org/S20109229","display_name":"Circuits Systems and Signal Processing","issn_l":"0278-081X","issn":["0278-081X","1531-5878"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320186","host_organization_name":"Birkh\u00e4user","host_organization_lineage":["https://openalex.org/P4310320186","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Birkh\u00e4user","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Circuits, Systems, and Signal Processing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8899999856948853}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W607837572","https://openalex.org/W1500368279","https://openalex.org/W1518804149","https://openalex.org/W1546317266","https://openalex.org/W1554225655","https://openalex.org/W1967279416","https://openalex.org/W1988935511","https://openalex.org/W2000410358","https://openalex.org/W2004965314","https://openalex.org/W2011150608","https://openalex.org/W2045074698","https://openalex.org/W2095953597","https://openalex.org/W2106339466","https://openalex.org/W2126770830","https://openalex.org/W2130409180","https://openalex.org/W2131833150","https://openalex.org/W2141274564","https://openalex.org/W2344272183","https://openalex.org/W2344542627","https://openalex.org/W2398811060","https://openalex.org/W2593164811","https://openalex.org/W2763785170","https://openalex.org/W2780034630","https://openalex.org/W2789915455","https://openalex.org/W2793541650","https://openalex.org/W2804691385","https://openalex.org/W2889235776","https://openalex.org/W2891804795","https://openalex.org/W2930986966","https://openalex.org/W2951246649","https://openalex.org/W2972648758","https://openalex.org/W2977397337","https://openalex.org/W2984615473","https://openalex.org/W3007520149","https://openalex.org/W3035058508","https://openalex.org/W3118627452","https://openalex.org/W3133154551","https://openalex.org/W4214569831","https://openalex.org/W6600359293"],"related_works":["https://openalex.org/W2119312496","https://openalex.org/W4247460323","https://openalex.org/W2107909712","https://openalex.org/W2153162275","https://openalex.org/W2079259690","https://openalex.org/W789543267","https://openalex.org/W2075972383","https://openalex.org/W2094295436","https://openalex.org/W2537086382","https://openalex.org/W2108986771"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":3}],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}