{"id":"https://openalex.org/W3097553233","doi":"https://doi.org/10.1007/s00034-020-01572-x","title":"A Statistical Approach of Analog Circuit Fault Detection Utilizing Kolmogorov\u2013Smirnov Test Method","display_name":"A Statistical Approach of Analog Circuit Fault Detection Utilizing Kolmogorov\u2013Smirnov Test Method","publication_year":2020,"publication_date":"2020-11-05","ids":{"openalex":"https://openalex.org/W3097553233","doi":"https://doi.org/10.1007/s00034-020-01572-x","mag":"3097553233"},"language":"en","primary_location":{"id":"doi:10.1007/s00034-020-01572-x","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00034-020-01572-x","pdf_url":null,"source":{"id":"https://openalex.org/S20109229","display_name":"Circuits Systems and Signal Processing","issn_l":"0278-081X","issn":["0278-081X","1531-5878"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320186","host_organization_name":"Birkh\u00e4user","host_organization_lineage":["https://openalex.org/P4310320186","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Birkh\u00e4user","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Circuits, Systems, and Signal Processing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090488624","display_name":"Supriyo Srimani","orcid":"https://orcid.org/0000-0002-9463-0286"},"institutions":[{"id":"https://openalex.org/I98365261","display_name":"Indian Institute of Engineering Science and Technology, Shibpur","ror":"https://ror.org/02ytfzr55","country_code":"IN","type":"education","lineage":["https://openalex.org/I98365261"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Supriyo Srimani","raw_affiliation_strings":["School of VLSI Technology, Indian Institute of Engineering Science and Technology, Shibpur, Howrah, West Bengal, 711103, India"],"affiliations":[{"raw_affiliation_string":"School of VLSI Technology, Indian Institute of Engineering Science and Technology, Shibpur, Howrah, West Bengal, 711103, India","institution_ids":["https://openalex.org/I98365261"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085085013","display_name":"Manas Kumar Parai","orcid":"https://orcid.org/0000-0003-3659-5408"},"institutions":[{"id":"https://openalex.org/I98365261","display_name":"Indian Institute of Engineering Science and Technology, Shibpur","ror":"https://ror.org/02ytfzr55","country_code":"IN","type":"education","lineage":["https://openalex.org/I98365261"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Manas Parai","raw_affiliation_strings":["School of VLSI Technology, Indian Institute of Engineering Science and Technology, Shibpur, Howrah, West Bengal, 711103, India"],"affiliations":[{"raw_affiliation_string":"School of VLSI Technology, Indian Institute of Engineering Science and Technology, Shibpur, Howrah, West Bengal, 711103, India","institution_ids":["https://openalex.org/I98365261"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102786486","display_name":"Kasturi Ghosh","orcid":"https://orcid.org/0000-0001-8173-496X"},"institutions":[{"id":"https://openalex.org/I98365261","display_name":"Indian Institute of Engineering Science and Technology, Shibpur","ror":"https://ror.org/02ytfzr55","country_code":"IN","type":"education","lineage":["https://openalex.org/I98365261"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Kasturi Ghosh","raw_affiliation_strings":["School of VLSI Technology, Indian Institute of Engineering Science and Technology, Shibpur, Howrah, West Bengal, 711103, India"],"affiliations":[{"raw_affiliation_string":"School of VLSI Technology, Indian Institute of Engineering Science and Technology, Shibpur, Howrah, West Bengal, 711103, India","institution_ids":["https://openalex.org/I98365261"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5082934529","display_name":"Hafizur Rahaman","orcid":"https://orcid.org/0000-0001-9012-5437"},"institutions":[{"id":"https://openalex.org/I98365261","display_name":"Indian Institute of Engineering Science and Technology, Shibpur","ror":"https://ror.org/02ytfzr55","country_code":"IN","type":"education","lineage":["https://openalex.org/I98365261"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Hafizur Rahaman","raw_affiliation_strings":["School of VLSI Technology, Indian Institute of Engineering Science and Technology, Shibpur, Howrah, West Bengal, 711103, India"],"affiliations":[{"raw_affiliation_string":"School of VLSI Technology, Indian Institute of Engineering Science and Technology, Shibpur, Howrah, West Bengal, 711103, India","institution_ids":["https://openalex.org/I98365261"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5090488624"],"corresponding_institution_ids":["https://openalex.org/I98365261"],"apc_list":null,"apc_paid":null,"fwci":3.045,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.91921056,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"40","issue":"5","first_page":"2091","last_page":"2113"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.6267816424369812},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5906752347946167},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4789348542690277},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.46780967712402344},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.45727115869522095},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.4516439437866211},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4316056966781616},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4260634183883667},{"id":"https://openalex.org/keywords/analogue-filter","display_name":"Analogue filter","score":0.4174308180809021},{"id":"https://openalex.org/keywords/field-programmable-analog-array","display_name":"Field-programmable analog array","score":0.41615742444992065},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.412203848361969},{"id":"https://openalex.org/keywords/analog-signal","display_name":"Analog signal","score":0.3505086600780487},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30025485157966614},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2523178458213806},{"id":"https://openalex.org/keywords/digital-filter","display_name":"Digital filter","score":0.2046845257282257},{"id":"https://openalex.org/keywords/analog-multiplier","display_name":"Analog multiplier","score":0.1603335440158844},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.13812151551246643},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11103606224060059}],"concepts":[{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.6267816424369812},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5906752347946167},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4789348542690277},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.46780967712402344},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.45727115869522095},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.4516439437866211},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4316056966781616},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4260634183883667},{"id":"https://openalex.org/C176046018","wikidata":"https://www.wikidata.org/wiki/Q359205","display_name":"Analogue filter","level":4,"score":0.4174308180809021},{"id":"https://openalex.org/C149128552","wikidata":"https://www.wikidata.org/wiki/Q380201","display_name":"Field-programmable analog array","level":5,"score":0.41615742444992065},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.412203848361969},{"id":"https://openalex.org/C13412647","wikidata":"https://www.wikidata.org/wiki/Q174948","display_name":"Analog signal","level":3,"score":0.3505086600780487},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30025485157966614},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2523178458213806},{"id":"https://openalex.org/C36390408","wikidata":"https://www.wikidata.org/wiki/Q1163067","display_name":"Digital filter","level":3,"score":0.2046845257282257},{"id":"https://openalex.org/C98142538","wikidata":"https://www.wikidata.org/wiki/Q485005","display_name":"Analog multiplier","level":4,"score":0.1603335440158844},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.13812151551246643},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11103606224060059},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s00034-020-01572-x","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00034-020-01572-x","pdf_url":null,"source":{"id":"https://openalex.org/S20109229","display_name":"Circuits Systems and Signal Processing","issn_l":"0278-081X","issn":["0278-081X","1531-5878"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320186","host_organization_name":"Birkh\u00e4user","host_organization_lineage":["https://openalex.org/P4310320186","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Birkh\u00e4user","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Circuits, Systems, and Signal Processing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","display_name":"Climate action","score":0.7099999785423279}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W270212756","https://openalex.org/W1492218661","https://openalex.org/W1978603266","https://openalex.org/W1984354089","https://openalex.org/W1987937249","https://openalex.org/W2022230218","https://openalex.org/W2023170340","https://openalex.org/W2032409150","https://openalex.org/W2033680132","https://openalex.org/W2049838825","https://openalex.org/W2064538619","https://openalex.org/W2070638918","https://openalex.org/W2090446526","https://openalex.org/W2095804055","https://openalex.org/W2099425240","https://openalex.org/W2102201073","https://openalex.org/W2108768061","https://openalex.org/W2109810511","https://openalex.org/W2112501613","https://openalex.org/W2116080338","https://openalex.org/W2133952565","https://openalex.org/W2149653842","https://openalex.org/W2159449186","https://openalex.org/W2761915076","https://openalex.org/W2796770216","https://openalex.org/W3153172827","https://openalex.org/W4302191818"],"related_works":["https://openalex.org/W2028682231","https://openalex.org/W2254292019","https://openalex.org/W2111086519","https://openalex.org/W2185815555","https://openalex.org/W3080406202","https://openalex.org/W1981652693","https://openalex.org/W2902416951","https://openalex.org/W2109999133","https://openalex.org/W2953375731","https://openalex.org/W2136192029"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":5}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}