{"id":"https://openalex.org/W2852483642","doi":"https://doi.org/10.1007/s00034-018-0895-4","title":"500 MHz 90 nm CMOS 2\u00a0 $$\\times $$ \u00d7 \u00a0VDD Digital Output Buffer Immunity to Process and Voltage Variations","display_name":"500 MHz 90 nm CMOS 2\u00a0 $$\\times $$ \u00d7 \u00a0VDD Digital Output Buffer Immunity to Process and Voltage Variations","publication_year":2018,"publication_date":"2018-07-09","ids":{"openalex":"https://openalex.org/W2852483642","doi":"https://doi.org/10.1007/s00034-018-0895-4","mag":"2852483642"},"language":"en","primary_location":{"id":"doi:10.1007/s00034-018-0895-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00034-018-0895-4","pdf_url":null,"source":{"id":"https://openalex.org/S20109229","display_name":"Circuits Systems and Signal Processing","issn_l":"0278-081X","issn":["0278-081X","1531-5878"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320186","host_organization_name":"Birkh\u00e4user","host_organization_lineage":["https://openalex.org/P4310320186","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Birkh\u00e4user","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Circuits, Systems, and Signal Processing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077220045","display_name":"Chua\u2010Chin Wang","orcid":"https://orcid.org/0000-0002-2426-2879"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Chua-Chin Wang","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, 80424, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, 80424, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105989439","display_name":"Tsung-Yi Tsai","orcid":null},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tsung-Yi Tsai","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, 80424, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, 80424, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050437425","display_name":"Yu-Lin Deng","orcid":null},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yu-Lin Deng","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, 80424, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, 80424, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070314228","display_name":"Tzung-Je Lee","orcid":"https://orcid.org/0000-0001-6870-7406"},"institutions":[{"id":"https://openalex.org/I91951123","display_name":"Cheng Shiu University","ror":"https://ror.org/011bdtx65","country_code":"TW","type":"education","lineage":["https://openalex.org/I91951123"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tzung-Je Lee","raw_affiliation_strings":["Department of Computer Science and Information Engineering, Cheng Shiu University, Kaohsiung, 83347, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Engineering, Cheng Shiu University, Kaohsiung, 83347, Taiwan","institution_ids":["https://openalex.org/I91951123"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5077220045"],"corresponding_institution_ids":["https://openalex.org/I142974352"],"apc_list":null,"apc_paid":null,"fwci":0.4436,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.61253014,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"38","issue":"2","first_page":"556","last_page":"568"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.7359008193016052},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7129552364349365},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.7074934840202332},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.7027671337127686},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.5774385929107666},{"id":"https://openalex.org/keywords/slew-rate","display_name":"Slew rate","score":0.5722013115882874},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5049422383308411},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.4975910484790802},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.47460025548934937},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4446380138397217},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4150618314743042},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.3906469941139221},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3341095447540283},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3329690396785736},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.33245813846588135},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.2080560028553009},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.20167240500450134},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18486365675926208}],"concepts":[{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.7359008193016052},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7129552364349365},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.7074934840202332},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.7027671337127686},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.5774385929107666},{"id":"https://openalex.org/C82517063","wikidata":"https://www.wikidata.org/wiki/Q1591315","display_name":"Slew rate","level":3,"score":0.5722013115882874},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5049422383308411},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.4975910484790802},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.47460025548934937},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4446380138397217},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4150618314743042},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.3906469941139221},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3341095447540283},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3329690396785736},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.33245813846588135},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.2080560028553009},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.20167240500450134},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18486365675926208},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s00034-018-0895-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00034-018-0895-4","pdf_url":null,"source":{"id":"https://openalex.org/S20109229","display_name":"Circuits Systems and Signal Processing","issn_l":"0278-081X","issn":["0278-081X","1531-5878"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320186","host_organization_name":"Birkh\u00e4user","host_organization_lineage":["https://openalex.org/P4310320186","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Birkh\u00e4user","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Circuits, Systems, and Signal Processing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.550000011920929,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1561782264","https://openalex.org/W1988628021","https://openalex.org/W2072102935","https://openalex.org/W2100581498","https://openalex.org/W2140229217","https://openalex.org/W2550539578","https://openalex.org/W3047826795"],"related_works":["https://openalex.org/W2370820504","https://openalex.org/W2133199116","https://openalex.org/W2347289947","https://openalex.org/W4389955510","https://openalex.org/W2364640622","https://openalex.org/W2390376289","https://openalex.org/W2372270451","https://openalex.org/W1970992322","https://openalex.org/W2542178378","https://openalex.org/W2078126217"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}