{"id":"https://openalex.org/W2053471559","doi":"https://doi.org/10.1007/s00034-013-9626-z","title":"Dual-Miller Parallel Compensation for Low-Power Three-Stage Amplifier with a Wide Range of Capacitive Loads","display_name":"Dual-Miller Parallel Compensation for Low-Power Three-Stage Amplifier with a Wide Range of Capacitive Loads","publication_year":2013,"publication_date":"2013-07-08","ids":{"openalex":"https://openalex.org/W2053471559","doi":"https://doi.org/10.1007/s00034-013-9626-z","mag":"2053471559"},"language":"en","primary_location":{"id":"doi:10.1007/s00034-013-9626-z","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00034-013-9626-z","pdf_url":null,"source":{"id":"https://openalex.org/S20109229","display_name":"Circuits Systems and Signal Processing","issn_l":"0278-081X","issn":["0278-081X","1531-5878"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320186","host_organization_name":"Birkh\u00e4user","host_organization_lineage":["https://openalex.org/P4310320186","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Birkh\u00e4user","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Circuits, Systems, and Signal Processing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024925845","display_name":"Pengfei Liao","orcid":"https://orcid.org/0000-0001-9857-0076"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Pengfei Liao","raw_affiliation_strings":["State Key laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P.R. China","Univ. of Electronic Sci. and Tech. of China"],"affiliations":[{"raw_affiliation_string":"State Key laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P.R. China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]},{"raw_affiliation_string":"Univ. of Electronic Sci. and Tech. of China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054488515","display_name":"Ping Luo","orcid":"https://orcid.org/0000-0002-8840-6739"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ping Luo","raw_affiliation_strings":["State Key laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P.R. China","Univ. of Electronic Sci. and Tech. of China"],"affiliations":[{"raw_affiliation_string":"State Key laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P.R. China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]},{"raw_affiliation_string":"Univ. of Electronic Sci. and Tech. of China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061074926","display_name":"Shaowei Zhen","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shaowei Zhen","raw_affiliation_strings":["State Key laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P.R. China","Univ. of Electronic Sci. and Tech. of China"],"affiliations":[{"raw_affiliation_string":"State Key laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P.R. China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]},{"raw_affiliation_string":"Univ. of Electronic Sci. and Tech. of China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100320398","display_name":"Bo Zhang","orcid":"https://orcid.org/0000-0003-1288-1549"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Zhang","raw_affiliation_strings":["State Key laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P.R. China","Univ. of Electronic Sci. and Tech. of China"],"affiliations":[{"raw_affiliation_string":"State Key laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P.R. China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]},{"raw_affiliation_string":"Univ. of Electronic Sci. and Tech. of China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5024925845"],"corresponding_institution_ids":["https://openalex.org/I150229711","https://openalex.org/I4210124847"],"apc_list":null,"apc_paid":null,"fwci":0.6141,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.70209582,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"33","issue":"1","first_page":"287","last_page":"297"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.6560372114181519},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.6267492771148682},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.625396728515625},{"id":"https://openalex.org/keywords/frequency-compensation","display_name":"Frequency compensation","score":0.6045047044754028},{"id":"https://openalex.org/keywords/operational-transconductance-amplifier","display_name":"Operational transconductance amplifier","score":0.602417528629303},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.5533773303031921},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5450366735458374},{"id":"https://openalex.org/keywords/direct-coupled-amplifier","display_name":"Direct-coupled amplifier","score":0.48468831181526184},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.4468393325805664},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.43741580843925476},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39277368783950806},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.373943030834198},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33713024854660034},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.3203965127468109},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2311311960220337},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10099440813064575}],"concepts":[{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.6560372114181519},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.6267492771148682},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.625396728515625},{"id":"https://openalex.org/C131782439","wikidata":"https://www.wikidata.org/wiki/Q1455581","display_name":"Frequency compensation","level":4,"score":0.6045047044754028},{"id":"https://openalex.org/C58117264","wikidata":"https://www.wikidata.org/wiki/Q1239595","display_name":"Operational transconductance amplifier","level":5,"score":0.602417528629303},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.5533773303031921},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5450366735458374},{"id":"https://openalex.org/C172218469","wikidata":"https://www.wikidata.org/wiki/Q4477697","display_name":"Direct-coupled amplifier","level":5,"score":0.48468831181526184},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.4468393325805664},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.43741580843925476},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39277368783950806},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.373943030834198},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33713024854660034},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.3203965127468109},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2311311960220337},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10099440813064575},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s00034-013-9626-z","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00034-013-9626-z","pdf_url":null,"source":{"id":"https://openalex.org/S20109229","display_name":"Circuits Systems and Signal Processing","issn_l":"0278-081X","issn":["0278-081X","1531-5878"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320186","host_organization_name":"Birkh\u00e4user","host_organization_lineage":["https://openalex.org/P4310320186","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Birkh\u00e4user","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Circuits, Systems, and Signal Processing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8299999833106995}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1536945048","https://openalex.org/W1964629396","https://openalex.org/W1968300101","https://openalex.org/W1974779192","https://openalex.org/W2011100675","https://openalex.org/W2014643058","https://openalex.org/W2016148407","https://openalex.org/W2020763844","https://openalex.org/W2021570329","https://openalex.org/W2028823710","https://openalex.org/W2031649171","https://openalex.org/W2056587553","https://openalex.org/W2076027811","https://openalex.org/W2081968211","https://openalex.org/W2102029541","https://openalex.org/W2125776391","https://openalex.org/W2126259048","https://openalex.org/W2130500333","https://openalex.org/W2131126928","https://openalex.org/W2142641748","https://openalex.org/W2147121405","https://openalex.org/W2154237706","https://openalex.org/W2161309745","https://openalex.org/W2162599988","https://openalex.org/W2167217451","https://openalex.org/W2167225414","https://openalex.org/W4245182418","https://openalex.org/W6600927616"],"related_works":["https://openalex.org/W2379608080","https://openalex.org/W2098517669","https://openalex.org/W3106125200","https://openalex.org/W2167952956","https://openalex.org/W2351584259","https://openalex.org/W2921550143","https://openalex.org/W2072759904","https://openalex.org/W2080717696","https://openalex.org/W2505524053","https://openalex.org/W2387944606"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2015,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}