{"id":"https://openalex.org/W1978332779","doi":"https://doi.org/10.1007/s00034-010-9197-1","title":"CMOS Readout Circuit with New Background Suppression Technique for Room-Temperature Infrared FPA Applications","display_name":"CMOS Readout Circuit with New Background Suppression Technique for Room-Temperature Infrared FPA Applications","publication_year":2010,"publication_date":"2010-05-11","ids":{"openalex":"https://openalex.org/W1978332779","doi":"https://doi.org/10.1007/s00034-010-9197-1","mag":"1978332779"},"language":"en","primary_location":{"id":"doi:10.1007/s00034-010-9197-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00034-010-9197-1","pdf_url":null,"source":{"id":"https://openalex.org/S20109229","display_name":"Circuits Systems and Signal Processing","issn_l":"0278-081X","issn":["0278-081X","1531-5878"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320186","host_organization_name":"Birkh\u00e4user","host_organization_lineage":["https://openalex.org/P4310320186","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Birkh\u00e4user","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Circuits, Systems and Signal Processing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076281343","display_name":"X. Y. Li","orcid":"https://orcid.org/0000-0002-2451-4992"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"X. Y. Li","raw_affiliation_strings":["Tianjin University ASIC Design Center, School of Electronic Information and Engineering, Tianjin University, Tianjin, 300072, China","Tianjin University ASIC Design Center, School of Electronic Information and Engineering, Tianjin University, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tianjin University ASIC Design Center, School of Electronic Information and Engineering, Tianjin University, Tianjin, 300072, China","institution_ids":["https://openalex.org/I162868743"]},{"raw_affiliation_string":"Tianjin University ASIC Design Center, School of Electronic Information and Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075062667","display_name":"Suying Yao","orcid":null},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"S. Y. Yao","raw_affiliation_strings":["Tianjin University ASIC Design Center, School of Electronic Information and Engineering, Tianjin University, Tianjin, 300072, China","Tianjin University ASIC Design Center, School of Electronic Information and Engineering, Tianjin University, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tianjin University ASIC Design Center, School of Electronic Information and Engineering, Tianjin University, Tianjin, 300072, China","institution_ids":["https://openalex.org/I162868743"]},{"raw_affiliation_string":"Tianjin University ASIC Design Center, School of Electronic Information and Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037049534","display_name":"Yue Zhao","orcid":"https://orcid.org/0000-0003-0342-2797"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Y. Q. Zhao","raw_affiliation_strings":["Tianjin University ASIC Design Center, School of Electronic Information and Engineering, Tianjin University, Tianjin, 300072, China","Tianjin University ASIC Design Center, School of Electronic Information and Engineering, Tianjin University, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tianjin University ASIC Design Center, School of Electronic Information and Engineering, Tianjin University, Tianjin, 300072, China","institution_ids":["https://openalex.org/I162868743"]},{"raw_affiliation_string":"Tianjin University ASIC Design Center, School of Electronic Information and Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5076281343"],"corresponding_institution_ids":["https://openalex.org/I162868743"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.2539,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.64277007,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"29","issue":"6","first_page":"1027","last_page":"1040"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9830999970436096,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.7401871681213379},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.729813814163208},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5317631363868713},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.497285395860672},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4854758083820343},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.47503355145454407},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.4680694341659546},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4434422552585602},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.4236086905002594},{"id":"https://openalex.org/keywords/infrared-detector","display_name":"Infrared detector","score":0.4225635230541229},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.33219194412231445},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1691986322402954}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.7401871681213379},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.729813814163208},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5317631363868713},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.497285395860672},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4854758083820343},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.47503355145454407},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.4680694341659546},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4434422552585602},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.4236086905002594},{"id":"https://openalex.org/C2779818494","wikidata":"https://www.wikidata.org/wiki/Q909168","display_name":"Infrared detector","level":3,"score":0.4225635230541229},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.33219194412231445},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1691986322402954}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s00034-010-9197-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00034-010-9197-1","pdf_url":null,"source":{"id":"https://openalex.org/S20109229","display_name":"Circuits Systems and Signal Processing","issn_l":"0278-081X","issn":["0278-081X","1531-5878"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320186","host_organization_name":"Birkh\u00e4user","host_organization_lineage":["https://openalex.org/P4310320186","https://openalex.org/P4310319900"],"host_organization_lineage_names":["Birkh\u00e4user","Springer Science+Business Media"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Circuits, Systems and Signal Processing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5799999833106995,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1529288801","https://openalex.org/W1553556905","https://openalex.org/W1564201208","https://openalex.org/W1566916904","https://openalex.org/W1980054827","https://openalex.org/W1990683517","https://openalex.org/W2011856464","https://openalex.org/W2036353177","https://openalex.org/W2057233208","https://openalex.org/W2081026633","https://openalex.org/W2106796569","https://openalex.org/W2110178499","https://openalex.org/W2141392753","https://openalex.org/W2154075949","https://openalex.org/W2154664257","https://openalex.org/W3147616483","https://openalex.org/W6840634833"],"related_works":["https://openalex.org/W3200817179","https://openalex.org/W1960166976","https://openalex.org/W1992708211","https://openalex.org/W2380067098","https://openalex.org/W1548152478","https://openalex.org/W2137172615","https://openalex.org/W2106247205","https://openalex.org/W2543503210","https://openalex.org/W4238016235","https://openalex.org/W4389383638"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}