{"id":"https://openalex.org/W1544316284","doi":"https://doi.org/10.1007/bfb0036133","title":"Model based implementation of a manipulation system with artificial skills","display_name":"Model based implementation of a manipulation system with artificial skills","publication_year":2006,"publication_date":"2006-01-25","ids":{"openalex":"https://openalex.org/W1544316284","doi":"https://doi.org/10.1007/bfb0036133","mag":"1544316284"},"language":"en","primary_location":{"id":"doi:10.1007/bfb0036133","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bfb0036133","pdf_url":null,"source":{"id":"https://openalex.org/S49978999","display_name":"Lecture notes in control and information sciences","issn_l":"0170-8643","issn":["0170-8643","1610-7411"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Control and Information Sciences","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044340470","display_name":"Tsukasa Ogasawara","orcid":"https://orcid.org/0000-0001-9767-6039"},"institutions":[{"id":"https://openalex.org/I4210131479","display_name":"Electrotechnical Institute","ror":"https://ror.org/03f5avr03","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210131479"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"T. Ogasawara","raw_affiliation_strings":["Electrotechnical Laboratory, Tsukuba, Ibaraki, Japan","Electrotechnical Laboratory"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrotechnical Laboratory, Tsukuba, Ibaraki, Japan","institution_ids":[]},{"raw_affiliation_string":"Electrotechnical Laboratory","institution_ids":["https://openalex.org/I4210131479"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001963047","display_name":"K. Kitagaki","orcid":"https://orcid.org/0000-0003-0067-0410"},"institutions":[{"id":"https://openalex.org/I4210131479","display_name":"Electrotechnical Institute","ror":"https://ror.org/03f5avr03","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210131479"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"K. Kitagaki","raw_affiliation_strings":["Electrotechnical Laboratory, Tsukuba, Ibaraki, Japan","Electrotechnical Laboratory"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrotechnical Laboratory, Tsukuba, Ibaraki, Japan","institution_ids":[]},{"raw_affiliation_string":"Electrotechnical Laboratory","institution_ids":["https://openalex.org/I4210131479"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056125044","display_name":"Takashi Suehiro","orcid":"https://orcid.org/0000-0002-1477-4280"},"institutions":[{"id":"https://openalex.org/I4210131479","display_name":"Electrotechnical Institute","ror":"https://ror.org/03f5avr03","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210131479"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"T. Suehiro","raw_affiliation_strings":["Electrotechnical Laboratory, Tsukuba, Ibaraki, Japan","Electrotechnical Laboratory"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrotechnical Laboratory, Tsukuba, Ibaraki, Japan","institution_ids":[]},{"raw_affiliation_string":"Electrotechnical Laboratory","institution_ids":["https://openalex.org/I4210131479"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010687195","display_name":"T. Hasegawa","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131479","display_name":"Electrotechnical Institute","ror":"https://ror.org/03f5avr03","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210131479"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"T. Hasegawa","raw_affiliation_strings":["Electrotechnical Laboratory, Tsukuba, Ibaraki, Japan","Electrotechnical Laboratory"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrotechnical Laboratory, Tsukuba, Ibaraki, Japan","institution_ids":[]},{"raw_affiliation_string":"Electrotechnical Laboratory","institution_ids":["https://openalex.org/I4210131479"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110498621","display_name":"K. Takase","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131479","display_name":"Electrotechnical Institute","ror":"https://ror.org/03f5avr03","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210131479"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"K. Takase","raw_affiliation_strings":["Electrotechnical Laboratory, Tsukuba, Ibaraki, Japan","Electrotechnical Laboratory"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrotechnical Laboratory, Tsukuba, Ibaraki, Japan","institution_ids":[]},{"raw_affiliation_string":"Electrotechnical Laboratory","institution_ids":["https://openalex.org/I4210131479"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.10056926,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"89","last_page":"98"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10653","display_name":"Robot Manipulation and Learning","score":0.9868999719619751,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10586","display_name":"Robotic Path Planning Algorithms","score":0.9527000188827515,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7453514933586121},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.6569011807441711},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6522799134254456},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4330100119113922},{"id":"https://openalex.org/keywords/human\u2013computer-interaction","display_name":"Human\u2013computer interaction","score":0.395048052072525},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3544090986251831},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.190015971660614},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11970841884613037}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7453514933586121},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.6569011807441711},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6522799134254456},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4330100119113922},{"id":"https://openalex.org/C107457646","wikidata":"https://www.wikidata.org/wiki/Q207434","display_name":"Human\u2013computer interaction","level":1,"score":0.395048052072525},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3544090986251831},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.190015971660614},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11970841884613037},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bfb0036133","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bfb0036133","pdf_url":null,"source":{"id":"https://openalex.org/S49978999","display_name":"Lecture notes in control and information sciences","issn_l":"0170-8643","issn":["0170-8643","1610-7411"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Control and Information Sciences","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.550000011920929,"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W8712683","https://openalex.org/W2125711809","https://openalex.org/W2157629959","https://openalex.org/W2515977288","https://openalex.org/W6826086441"],"related_works":["https://openalex.org/W2770593030","https://openalex.org/W3154990682","https://openalex.org/W2560201613","https://openalex.org/W2171975302","https://openalex.org/W2022352247","https://openalex.org/W2488129135","https://openalex.org/W4312219546","https://openalex.org/W2377538627","https://openalex.org/W3196817267","https://openalex.org/W1976600725"],"abstract_inverted_index":null,"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}