{"id":"https://openalex.org/W1555771860","doi":"https://doi.org/10.1007/bfb0032598","title":"Visual probe mark inspection, using hardware implementation of artificial neural networks, in VLSI production","display_name":"Visual probe mark inspection, using hardware implementation of artificial neural networks, in VLSI production","publication_year":1997,"publication_date":"1997-01-01","ids":{"openalex":"https://openalex.org/W1555771860","doi":"https://doi.org/10.1007/bfb0032598","mag":"1555771860"},"language":"en","primary_location":{"id":"doi:10.1007/bfb0032598","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bfb0032598","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006395128","display_name":"Ghislain de Tr\u00e9miolles","orcid":null},"institutions":[{"id":"https://openalex.org/I204730241","display_name":"Universit\u00e9 Paris Cit\u00e9","ror":"https://ror.org/05f82e368","country_code":"FR","type":"education","lineage":["https://openalex.org/I204730241"]},{"id":"https://openalex.org/I4210113338","display_name":"Centre Hospitalier Sud Francilien","ror":"https://ror.org/0246mbd04","country_code":"FR","type":"healthcare","lineage":["https://openalex.org/I4210113338"]},{"id":"https://openalex.org/I4210112067","display_name":"IBM (France)","ror":"https://ror.org/02wnbr922","country_code":"FR","type":"company","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210112067"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Ghislain de Tr\u00e9miolles","raw_affiliation_strings":["Division R\u00e9seaux Neuronaux Laboratoire d'Etude et de Recherche en Instrumentation, Signaux et Syst\u00e8mes (LERISS), Universit\u00e9 PARIS XII, IUT de Cr\u00e9teil - S\u00e9nart, Rue Pierre Point, F-77127, Lieusaint, France","Laboratoire d'Etude et de D\u00e9veloppement de Corbeil Essonnes, IBM France, 224, boulevard John Kennedy, F-91105, Corbeil Essonnes Cedex, France","IBM France","Universit\u00e9 PARIS XII, IUT de Cr\u00e9teil - S\u00e9nart"],"affiliations":[{"raw_affiliation_string":"Division R\u00e9seaux Neuronaux Laboratoire d'Etude et de Recherche en Instrumentation, Signaux et Syst\u00e8mes (LERISS), Universit\u00e9 PARIS XII, IUT de Cr\u00e9teil - S\u00e9nart, Rue Pierre Point, F-77127, Lieusaint, France","institution_ids":[]},{"raw_affiliation_string":"Laboratoire d'Etude et de D\u00e9veloppement de Corbeil Essonnes, IBM France, 224, boulevard John Kennedy, F-91105, Corbeil Essonnes Cedex, France","institution_ids":["https://openalex.org/I4210113338"]},{"raw_affiliation_string":"IBM France","institution_ids":["https://openalex.org/I4210112067"]},{"raw_affiliation_string":"Universit\u00e9 PARIS XII, IUT de Cr\u00e9teil - S\u00e9nart","institution_ids":["https://openalex.org/I204730241"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080463525","display_name":"Pascal Tannhof","orcid":null},"institutions":[{"id":"https://openalex.org/I4210113338","display_name":"Centre Hospitalier Sud Francilien","ror":"https://ror.org/0246mbd04","country_code":"FR","type":"healthcare","lineage":["https://openalex.org/I4210113338"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["FR","US"],"is_corresponding":false,"raw_author_name":"Pascal Tannhof","raw_affiliation_strings":["Laboratoire d'Etude et de D\u00e9veloppement de Corbeil Essonnes, IBM France, 224, boulevard John Kennedy, F-91105, Corbeil Essonnes Cedex, France","[IBM, France]"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Etude et de D\u00e9veloppement de Corbeil Essonnes, IBM France, 224, boulevard John Kennedy, F-91105, Corbeil Essonnes Cedex, France","institution_ids":["https://openalex.org/I4210113338"]},{"raw_affiliation_string":"[IBM, France]","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041219519","display_name":"Brendan Plougonven","orcid":null},"institutions":[{"id":"https://openalex.org/I4210113338","display_name":"Centre Hospitalier Sud Francilien","ror":"https://ror.org/0246mbd04","country_code":"FR","type":"healthcare","lineage":["https://openalex.org/I4210113338"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["FR","US"],"is_corresponding":false,"raw_author_name":"Brendan Plougonven","raw_affiliation_strings":["Laboratoire d'Etude et de D\u00e9veloppement de Corbeil Essonnes, IBM France, 224, boulevard John Kennedy, F-91105, Corbeil Essonnes Cedex, France","[IBM, France]"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Etude et de D\u00e9veloppement de Corbeil Essonnes, IBM France, 224, boulevard John Kennedy, F-91105, Corbeil Essonnes Cedex, France","institution_ids":["https://openalex.org/I4210113338"]},{"raw_affiliation_string":"[IBM, France]","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077224837","display_name":"Claude Demarigny","orcid":null},"institutions":[{"id":"https://openalex.org/I4210113338","display_name":"Centre Hospitalier Sud Francilien","ror":"https://ror.org/0246mbd04","country_code":"FR","type":"healthcare","lineage":["https://openalex.org/I4210113338"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["FR","US"],"is_corresponding":false,"raw_author_name":"Claude Demarigny","raw_affiliation_strings":["Laboratoire d'Etude et de D\u00e9veloppement de Corbeil Essonnes, IBM France, 224, boulevard John Kennedy, F-91105, Corbeil Essonnes Cedex, France","[IBM, France]"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Etude et de D\u00e9veloppement de Corbeil Essonnes, IBM France, 224, boulevard John Kennedy, F-91105, Corbeil Essonnes Cedex, France","institution_ids":["https://openalex.org/I4210113338"]},{"raw_affiliation_string":"[IBM, France]","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5107467080","display_name":"Kurosh Madani","orcid":null},"institutions":[{"id":"https://openalex.org/I204730241","display_name":"Universit\u00e9 Paris Cit\u00e9","ror":"https://ror.org/05f82e368","country_code":"FR","type":"education","lineage":["https://openalex.org/I204730241"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Kurosh Madani","raw_affiliation_strings":["Division R\u00e9seaux Neuronaux Laboratoire d'Etude et de Recherche en Instrumentation, Signaux et Syst\u00e8mes (LERISS), Universit\u00e9 PARIS XII, IUT de Cr\u00e9teil - S\u00e9nart, Rue Pierre Point, F-77127, Lieusaint, France","Universit\u00e9 PARIS XII, IUT de Cr\u00e9teil - S\u00e9nart"],"affiliations":[{"raw_affiliation_string":"Division R\u00e9seaux Neuronaux Laboratoire d'Etude et de Recherche en Instrumentation, Signaux et Syst\u00e8mes (LERISS), Universit\u00e9 PARIS XII, IUT de Cr\u00e9teil - S\u00e9nart, Rue Pierre Point, F-77127, Lieusaint, France","institution_ids":[]},{"raw_affiliation_string":"Universit\u00e9 PARIS XII, IUT de Cr\u00e9teil - S\u00e9nart","institution_ids":["https://openalex.org/I204730241"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5006395128"],"corresponding_institution_ids":["https://openalex.org/I204730241","https://openalex.org/I4210112067","https://openalex.org/I4210113338"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":4.4304,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.93888242,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1374","last_page":"1383"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7813131809234619},{"id":"https://openalex.org/keywords/ibm","display_name":"IBM","score":0.735893964767456},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6572643518447876},{"id":"https://openalex.org/keywords/adaptability","display_name":"Adaptability","score":0.6241620182991028},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.6035122275352478},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5741175413131714},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.43010014295578003},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.4278792142868042},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4274097979068756},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4212934970855713},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3781982362270355},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.37098729610443115},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3294351100921631},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09644335508346558}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7813131809234619},{"id":"https://openalex.org/C70388272","wikidata":"https://www.wikidata.org/wiki/Q5968558","display_name":"IBM","level":2,"score":0.735893964767456},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6572643518447876},{"id":"https://openalex.org/C177606310","wikidata":"https://www.wikidata.org/wiki/Q5674297","display_name":"Adaptability","level":2,"score":0.6241620182991028},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.6035122275352478},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5741175413131714},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.43010014295578003},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.4278792142868042},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4274097979068756},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4212934970855713},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3781982362270355},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.37098729610443115},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3294351100921631},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09644335508346558},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bfb0032598","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bfb0032598","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1575456563","https://openalex.org/W1581052470","https://openalex.org/W1649159759","https://openalex.org/W2018131164","https://openalex.org/W2071648799","https://openalex.org/W2178871721"],"related_works":["https://openalex.org/W2357124094","https://openalex.org/W2387399993","https://openalex.org/W2389739210","https://openalex.org/W2348924972","https://openalex.org/W2365736347","https://openalex.org/W2047454415","https://openalex.org/W2070040999","https://openalex.org/W2387293848","https://openalex.org/W2250140200","https://openalex.org/W1979216758"],"abstract_inverted_index":null,"counts_by_year":[{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}