{"id":"https://openalex.org/W164184898","doi":"https://doi.org/10.1007/bf03219903","title":"Yield and reliability issues in nanoelectronic technologies","display_name":"Yield and reliability issues in nanoelectronic technologies","publication_year":2006,"publication_date":"2006-12-01","ids":{"openalex":"https://openalex.org/W164184898","doi":"https://doi.org/10.1007/bf03219903","mag":"164184898"},"language":"en","primary_location":{"id":"doi:10.1007/bf03219903","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf03219903","pdf_url":null,"source":{"id":"https://openalex.org/S164884734","display_name":"Annals of Telecommunications","issn_l":"0003-4347","issn":["0003-4347","1958-9395"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"annals of telecommunications - annales des t\u00e9l\u00e9communications","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013542218","display_name":"Denis Teixeira Franco","orcid":null},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210165912","display_name":"Laboratoire Traitement et Communication de l\u2019Information","ror":"https://ror.org/057er4c39","country_code":"FR","type":"facility","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102","https://openalex.org/I4210165912"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Denis Teixeira Franco","raw_affiliation_strings":["D\u00e9partement Communication et \u00c9lectronique, GET/T\u00e9l\u00e9com Paris, CNRS LTCI (UMR 5141), 75634, Paris Cedex 13, France","D\u00e9partement communication et \u00e9lectronique, GET/T\u00e9l\u00e9com Paris, CNRS LTCI (UMR 5141), Paris Cedex 13, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"D\u00e9partement Communication et \u00c9lectronique, GET/T\u00e9l\u00e9com Paris, CNRS LTCI (UMR 5141), 75634, Paris Cedex 13, France","institution_ids":["https://openalex.org/I12356871","https://openalex.org/I1294671590","https://openalex.org/I4210165912"]},{"raw_affiliation_string":"D\u00e9partement communication et \u00e9lectronique, GET/T\u00e9l\u00e9com Paris, CNRS LTCI (UMR 5141), Paris Cedex 13, France","institution_ids":["https://openalex.org/I12356871","https://openalex.org/I1294671590","https://openalex.org/I4210165912"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084528721","display_name":"J.-F. Naviner","orcid":"https://orcid.org/0000-0001-8445-9860"},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210165912","display_name":"Laboratoire Traitement et Communication de l\u2019Information","ror":"https://ror.org/057er4c39","country_code":"FR","type":"facility","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102","https://openalex.org/I4210165912"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Jean-Fran\u00e7ois Naviner","raw_affiliation_strings":["D\u00e9partement Communication et \u00c9lectronique, GET/T\u00e9l\u00e9com Paris, CNRS LTCI (UMR 5141), 75634, Paris Cedex 13, France","D\u00e9partement communication et \u00e9lectronique, GET/T\u00e9l\u00e9com Paris, CNRS LTCI (UMR 5141), Paris Cedex 13, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"D\u00e9partement Communication et \u00c9lectronique, GET/T\u00e9l\u00e9com Paris, CNRS LTCI (UMR 5141), 75634, Paris Cedex 13, France","institution_ids":["https://openalex.org/I12356871","https://openalex.org/I1294671590","https://openalex.org/I4210165912"]},{"raw_affiliation_string":"D\u00e9partement communication et \u00e9lectronique, GET/T\u00e9l\u00e9com Paris, CNRS LTCI (UMR 5141), Paris Cedex 13, France","institution_ids":["https://openalex.org/I12356871","https://openalex.org/I1294671590","https://openalex.org/I4210165912"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018022196","display_name":"L\u00edrida Naviner","orcid":"https://orcid.org/0000-0002-6320-4153"},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210165912","display_name":"Laboratoire Traitement et Communication de l\u2019Information","ror":"https://ror.org/057er4c39","country_code":"FR","type":"facility","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102","https://openalex.org/I4210165912"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Lirida Naviner","raw_affiliation_strings":["D\u00e9partement Communication et \u00c9lectronique, GET/T\u00e9l\u00e9com Paris, CNRS LTCI (UMR 5141), 75634, Paris Cedex 13, France","D\u00e9partement communication et \u00e9lectronique, GET/T\u00e9l\u00e9com Paris, CNRS LTCI (UMR 5141), Paris Cedex 13, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"D\u00e9partement Communication et \u00c9lectronique, GET/T\u00e9l\u00e9com Paris, CNRS LTCI (UMR 5141), 75634, Paris Cedex 13, France","institution_ids":["https://openalex.org/I12356871","https://openalex.org/I1294671590","https://openalex.org/I4210165912"]},{"raw_affiliation_string":"D\u00e9partement communication et \u00e9lectronique, GET/T\u00e9l\u00e9com Paris, CNRS LTCI (UMR 5141), Paris Cedex 13, France","institution_ids":["https://openalex.org/I12356871","https://openalex.org/I1294671590","https://openalex.org/I4210165912"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2790,"currency":"USD","value_usd":2790},"apc_paid":null,"fwci":1.6932,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.83120668,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"61","issue":"11-12","first_page":"1422","last_page":"1457"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.6676813364028931},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6141529083251953},{"id":"https://openalex.org/keywords/moores-law","display_name":"Moore's law","score":0.5816124677658081},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.49910879135131836},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4931790232658386},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4787425398826599},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45384472608566284},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4364282786846161},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.4265247583389282},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.379673033952713},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34684866666793823},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.3417532444000244},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.326992392539978},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2557486295700073}],"concepts":[{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.6676813364028931},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6141529083251953},{"id":"https://openalex.org/C206891323","wikidata":"https://www.wikidata.org/wiki/Q178655","display_name":"Moore's law","level":2,"score":0.5816124677658081},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.49910879135131836},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4931790232658386},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4787425398826599},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45384472608566284},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4364282786846161},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.4265247583389282},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.379673033952713},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34684866666793823},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.3417532444000244},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.326992392539978},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2557486295700073},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bf03219903","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf03219903","pdf_url":null,"source":{"id":"https://openalex.org/S164884734","display_name":"Annals of Telecommunications","issn_l":"0003-4347","issn":["0003-4347","1958-9395"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"annals of telecommunications - annales des t\u00e9l\u00e9communications","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6200000047683716,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":65,"referenced_works":["https://openalex.org/W1481069167","https://openalex.org/W1501584870","https://openalex.org/W1511865672","https://openalex.org/W1564617507","https://openalex.org/W1591072154","https://openalex.org/W1924100166","https://openalex.org/W1966450067","https://openalex.org/W1983430832","https://openalex.org/W1997984202","https://openalex.org/W2017521824","https://openalex.org/W2022829874","https://openalex.org/W2027933765","https://openalex.org/W2028757088","https://openalex.org/W2046768325","https://openalex.org/W2048125104","https://openalex.org/W2060144159","https://openalex.org/W2062988300","https://openalex.org/W2065199696","https://openalex.org/W2068664700","https://openalex.org/W2093453170","https://openalex.org/W2097325076","https://openalex.org/W2099708835","https://openalex.org/W2099971661","https://openalex.org/W2100507967","https://openalex.org/W2111299528","https://openalex.org/W2112375479","https://openalex.org/W2115004507","https://openalex.org/W2115554176","https://openalex.org/W2115567121","https://openalex.org/W2119147938","https://openalex.org/W2119287593","https://openalex.org/W2120034842","https://openalex.org/W2122386818","https://openalex.org/W2122442616","https://openalex.org/W2122666364","https://openalex.org/W2122819799","https://openalex.org/W2128181612","https://openalex.org/W2129300315","https://openalex.org/W2134700234","https://openalex.org/W2134887864","https://openalex.org/W2136293553","https://openalex.org/W2138586957","https://openalex.org/W2139399616","https://openalex.org/W2140049648","https://openalex.org/W2144622167","https://openalex.org/W2145977167","https://openalex.org/W2146029118","https://openalex.org/W2147099267","https://openalex.org/W2148987260","https://openalex.org/W2151789282","https://openalex.org/W2152652532","https://openalex.org/W2159596684","https://openalex.org/W2160451204","https://openalex.org/W2160840734","https://openalex.org/W2162307912","https://openalex.org/W2163863796","https://openalex.org/W2166113653","https://openalex.org/W2168313733","https://openalex.org/W2168688575","https://openalex.org/W2170337384","https://openalex.org/W2917987420","https://openalex.org/W3143632333","https://openalex.org/W4235380296","https://openalex.org/W4235987558","https://openalex.org/W4238736398"],"related_works":["https://openalex.org/W2796521923","https://openalex.org/W4252661958","https://openalex.org/W3215142653","https://openalex.org/W2359999068","https://openalex.org/W2062086413","https://openalex.org/W2083648228","https://openalex.org/W2084720890","https://openalex.org/W95651076","https://openalex.org/W2385361013","https://openalex.org/W2532017461"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}