{"id":"https://openalex.org/W2913655692","doi":"https://doi.org/10.1007/bf01293265","title":"Provably good pattern generators for a random pattern test","display_name":"Provably good pattern generators for a random pattern test","publication_year":1994,"publication_date":"1994-05-01","ids":{"openalex":"https://openalex.org/W2913655692","doi":"https://doi.org/10.1007/bf01293265","mag":"2913655692"},"language":"en","primary_location":{"id":"doi:10.1007/bf01293265","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf01293265","pdf_url":null,"source":{"id":"https://openalex.org/S89324355","display_name":"Algorithmica","issn_l":"0178-4617","issn":["0178-4617","1432-0541"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Algorithmica","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029058636","display_name":"Thomas H. Spencer","orcid":null},"institutions":[{"id":"https://openalex.org/I122266389","display_name":"University of Nebraska at Omaha","ror":"https://ror.org/04yrkc140","country_code":"US","type":"education","lineage":["https://openalex.org/I122266389"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Thomas H. Spencer","raw_affiliation_strings":["Department of Mathematics and Computer Science, University of Nebraska at Omaha, 8182, Omaha, NE, USA"],"affiliations":[{"raw_affiliation_string":"Department of Mathematics and Computer Science, University of Nebraska at Omaha, 8182, Omaha, NE, USA","institution_ids":["https://openalex.org/I122266389"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5029058636"],"corresponding_institution_ids":["https://openalex.org/I122266389"],"apc_list":{"value":2290,"currency":"EUR","value_usd":2890},"apc_paid":null,"fwci":1.6942,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.87832295,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"11","issue":"5","first_page":"429","last_page":"442"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11269","display_name":"Algorithms and Data Compression","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11269","display_name":"Algorithms and Data Compression","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10601","display_name":"Handwritten Text Recognition Techniques","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12072","display_name":"Machine Learning and Algorithms","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pseudorandom-number-generator","display_name":"Pseudorandom number generator","score":0.8562426567077637},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.6897115111351013},{"id":"https://openalex.org/keywords/digital-pattern-generator","display_name":"Digital pattern generator","score":0.6878323554992676},{"id":"https://openalex.org/keywords/random-seed","display_name":"Random seed","score":0.6417771577835083},{"id":"https://openalex.org/keywords/random-number-generation","display_name":"Random number generation","score":0.595684826374054},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5299758911132812},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5268672108650208},{"id":"https://openalex.org/keywords/theory-of-computation","display_name":"Theory of computation","score":0.5230240225791931},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5124695897102356},{"id":"https://openalex.org/keywords/random-testing","display_name":"Random testing","score":0.4800885319709778},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.46009036898612976},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4289090633392334},{"id":"https://openalex.org/keywords/self-shrinking-generator","display_name":"Self-shrinking generator","score":0.41759732365608215},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.408810019493103},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.28107690811157227},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.16394633054733276},{"id":"https://openalex.org/keywords/induction-generator","display_name":"Induction generator","score":0.15951544046401978},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.15801885724067688},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.1476391851902008},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.0777091383934021},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07557505369186401}],"concepts":[{"id":"https://openalex.org/C140642157","wikidata":"https://www.wikidata.org/wiki/Q1623338","display_name":"Pseudorandom number generator","level":2,"score":0.8562426567077637},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.6897115111351013},{"id":"https://openalex.org/C151346624","wikidata":"https://www.wikidata.org/wiki/Q5276129","display_name":"Digital pattern generator","level":3,"score":0.6878323554992676},{"id":"https://openalex.org/C26263659","wikidata":"https://www.wikidata.org/wiki/Q1886131","display_name":"Random seed","level":3,"score":0.6417771577835083},{"id":"https://openalex.org/C201866948","wikidata":"https://www.wikidata.org/wiki/Q228206","display_name":"Random number generation","level":2,"score":0.595684826374054},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5299758911132812},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5268672108650208},{"id":"https://openalex.org/C24858836","wikidata":"https://www.wikidata.org/wiki/Q844718","display_name":"Theory of computation","level":2,"score":0.5230240225791931},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5124695897102356},{"id":"https://openalex.org/C106159264","wikidata":"https://www.wikidata.org/wiki/Q17146789","display_name":"Random testing","level":4,"score":0.4800885319709778},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.46009036898612976},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4289090633392334},{"id":"https://openalex.org/C207768971","wikidata":"https://www.wikidata.org/wiki/Q17084187","display_name":"Self-shrinking generator","level":4,"score":0.41759732365608215},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.408810019493103},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.28107690811157227},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.16394633054733276},{"id":"https://openalex.org/C98716924","wikidata":"https://www.wikidata.org/wiki/Q752750","display_name":"Induction generator","level":3,"score":0.15951544046401978},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.15801885724067688},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.1476391851902008},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.0777091383934021},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07557505369186401},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bf01293265","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf01293265","pdf_url":null,"source":{"id":"https://openalex.org/S89324355","display_name":"Algorithmica","issn_l":"0178-4617","issn":["0178-4617","1432-0541"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Algorithmica","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1554502957","https://openalex.org/W1990311419","https://openalex.org/W1992987852","https://openalex.org/W2004437077","https://openalex.org/W2019038806","https://openalex.org/W2028352556","https://openalex.org/W2041753256","https://openalex.org/W2052207834","https://openalex.org/W2061106457","https://openalex.org/W2064759901","https://openalex.org/W2071114738","https://openalex.org/W2075488055","https://openalex.org/W2079568675","https://openalex.org/W2087115651","https://openalex.org/W2107324709","https://openalex.org/W2138109426","https://openalex.org/W2752853835","https://openalex.org/W3150645827","https://openalex.org/W4234345682","https://openalex.org/W4240907844","https://openalex.org/W6601753937","https://openalex.org/W6669417358"],"related_works":["https://openalex.org/W1510406419","https://openalex.org/W2054151414","https://openalex.org/W1969805644","https://openalex.org/W1167757406","https://openalex.org/W2062045810","https://openalex.org/W2169620991","https://openalex.org/W1560428411","https://openalex.org/W2914680728","https://openalex.org/W1583056432","https://openalex.org/W2096205671"],"abstract_inverted_index":null,"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}