{"id":"https://openalex.org/W2077537277","doi":"https://doi.org/10.1007/bf00993317","title":"A three-stage partial scan design method to ease ATPG","display_name":"A three-stage partial scan design method to ease ATPG","publication_year":1995,"publication_date":"1995-01-01","ids":{"openalex":"https://openalex.org/W2077537277","doi":"https://doi.org/10.1007/bf00993317","mag":"2077537277"},"language":"en","primary_location":{"id":"doi:10.1007/bf00993317","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00993317","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055044508","display_name":"Shang-E Tai","orcid":null},"institutions":[{"id":"https://openalex.org/I1334877674","display_name":"Taiwan Semiconductor Manufacturing Company (United States)","ror":"https://ror.org/02rvfjx92","country_code":"US","type":"company","lineage":["https://openalex.org/I1334877674","https://openalex.org/I4210120917"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Shang-E Tai","raw_affiliation_strings":["Taiwan Semiconductor Manufacturing Company, 121 Park Avenue, Science-Based Industrial Park, Hsin-chu, Taiwan, R.O.C","[Taiwan Semiconductor Manufacturing Company, Hsin-Chu, Taiwan. R.O.C.]"],"affiliations":[{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, 121 Park Avenue, Science-Based Industrial Park, Hsin-chu, Taiwan, R.O.C","institution_ids":[]},{"raw_affiliation_string":"[Taiwan Semiconductor Manufacturing Company, Hsin-Chu, Taiwan. R.O.C.]","institution_ids":["https://openalex.org/I1334877674"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110201813","display_name":"Debashis Bhattacharya","orcid":null},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Debashis Bhattacharya","raw_affiliation_strings":["Department of Electrical Engineering, Yale University, Yale Station, P.O.Box 2157, 06520, New Haven, CT","Department of Electrical Engineering, Yale University, New Haven#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Yale University, Yale Station, P.O.Box 2157, 06520, New Haven, CT","institution_ids":["https://openalex.org/I32971472"]},{"raw_affiliation_string":"Department of Electrical Engineering, Yale University, New Haven#TAB#","institution_ids":["https://openalex.org/I32971472"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5055044508"],"corresponding_institution_ids":["https://openalex.org/I1334877674"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.5282,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.68417291,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"7","issue":"1-2","first_page":"95","last_page":"104"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.987500011920929,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.639818012714386},{"id":"https://openalex.org/keywords/stage","display_name":"Stage (stratigraphy)","score":0.4883808493614197},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46421340107917786},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.32520008087158203},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26355165243148804},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12491461634635925},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.0814487636089325},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.06190338730812073}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.639818012714386},{"id":"https://openalex.org/C146357865","wikidata":"https://www.wikidata.org/wiki/Q1123245","display_name":"Stage (stratigraphy)","level":2,"score":0.4883808493614197},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46421340107917786},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32520008087158203},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26355165243148804},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12491461634635925},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0814487636089325},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.06190338730812073},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bf00993317","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00993317","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2004437077","https://openalex.org/W2014119074","https://openalex.org/W2025641101","https://openalex.org/W2108561948","https://openalex.org/W2113524639","https://openalex.org/W2127673274","https://openalex.org/W2134626087","https://openalex.org/W2135129887","https://openalex.org/W2147517890","https://openalex.org/W2152406824","https://openalex.org/W2160162958","https://openalex.org/W2171599508","https://openalex.org/W2401610261"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2131559056","https://openalex.org/W4254560580","https://openalex.org/W2127167802","https://openalex.org/W2080984854","https://openalex.org/W2323083271","https://openalex.org/W2019500818","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2009690023"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}