{"id":"https://openalex.org/W2065694176","doi":"https://doi.org/10.1007/bf00993136","title":"Constrained state assignment of easily testable FSMs","display_name":"Constrained state assignment of easily testable FSMs","publication_year":1995,"publication_date":"1995-02-01","ids":{"openalex":"https://openalex.org/W2065694176","doi":"https://doi.org/10.1007/bf00993136","mag":"2065694176"},"language":"en","primary_location":{"id":"doi:10.1007/bf00993136","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00993136","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110127057","display_name":"Mar\ufffda J. Avedillo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210147934","display_name":"Centro Nacional de Microelectr\u00f3nica","ror":"https://ror.org/03ycqrz18","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934"]},{"id":"https://openalex.org/I134820265","display_name":"Consejo Superior de Investigaciones Cient\u00edficas","ror":"https://ror.org/02gfc7t72","country_code":"ES","type":"funder","lineage":["https://openalex.org/I134820265"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"Mar\ufffda J. Avedillo","raw_affiliation_strings":["Departamento de Dise\u00f1o Anal\u00f3gico, Centro Nacional de Microelectr\u00f3nica, Edif. CICA, Avda. Reina Mercedes s/n, 41012, Sevilla, Spain","Departamento de Dise\u00f1o Anal\u00f3gico, Centro Nacional de Microelectr\u00f3nica, Edif. CICA, Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Departamento de Dise\u00f1o Anal\u00f3gico, Centro Nacional de Microelectr\u00f3nica, Edif. CICA, Avda. Reina Mercedes s/n, 41012, Sevilla, Spain","institution_ids":["https://openalex.org/I4210147934"]},{"raw_affiliation_string":"Departamento de Dise\u00f1o Anal\u00f3gico, Centro Nacional de Microelectr\u00f3nica, Edif. CICA, Sevilla, Spain","institution_ids":["https://openalex.org/I134820265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054229228","display_name":"Jos\u00e9 M. Quintana","orcid":"https://orcid.org/0000-0003-2170-7876"},"institutions":[{"id":"https://openalex.org/I134820265","display_name":"Consejo Superior de Investigaciones Cient\u00edficas","ror":"https://ror.org/02gfc7t72","country_code":"ES","type":"funder","lineage":["https://openalex.org/I134820265"]},{"id":"https://openalex.org/I4210147934","display_name":"Centro Nacional de Microelectr\u00f3nica","ror":"https://ror.org/03ycqrz18","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Jos\ufffd M. Quintana","raw_affiliation_strings":["Departamento de Dise\u00f1o Anal\u00f3gico, Centro Nacional de Microelectr\u00f3nica, Edif. CICA, Avda. Reina Mercedes s/n, 41012, Sevilla, Spain","Departamento de Dise\u00f1o Anal\u00f3gico, Centro Nacional de Microelectr\u00f3nica, Edif. CICA, Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Departamento de Dise\u00f1o Anal\u00f3gico, Centro Nacional de Microelectr\u00f3nica, Edif. CICA, Avda. Reina Mercedes s/n, 41012, Sevilla, Spain","institution_ids":["https://openalex.org/I4210147934"]},{"raw_affiliation_string":"Departamento de Dise\u00f1o Anal\u00f3gico, Centro Nacional de Microelectr\u00f3nica, Edif. CICA, Sevilla, Spain","institution_ids":["https://openalex.org/I134820265"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016693928","display_name":"J.L. Huertas","orcid":"https://orcid.org/0000-0001-8230-9543"},"institutions":[{"id":"https://openalex.org/I4210147934","display_name":"Centro Nacional de Microelectr\u00f3nica","ror":"https://ror.org/03ycqrz18","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934"]},{"id":"https://openalex.org/I134820265","display_name":"Consejo Superior de Investigaciones Cient\u00edficas","ror":"https://ror.org/02gfc7t72","country_code":"ES","type":"funder","lineage":["https://openalex.org/I134820265"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Jos\ufffd L. Huertas","raw_affiliation_strings":["Departamento de Dise\u00f1o Anal\u00f3gico, Centro Nacional de Microelectr\u00f3nica, Edif. CICA, Avda. Reina Mercedes s/n, 41012, Sevilla, Spain","Departamento de Dise\u00f1o Anal\u00f3gico, Centro Nacional de Microelectr\u00f3nica, Edif. CICA, Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Departamento de Dise\u00f1o Anal\u00f3gico, Centro Nacional de Microelectr\u00f3nica, Edif. CICA, Avda. Reina Mercedes s/n, 41012, Sevilla, Spain","institution_ids":["https://openalex.org/I4210147934"]},{"raw_affiliation_string":"Departamento de Dise\u00f1o Anal\u00f3gico, Centro Nacional de Microelectr\u00f3nica, Edif. CICA, Sevilla, Spain","institution_ids":["https://openalex.org/I134820265"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5110127057"],"corresponding_institution_ids":["https://openalex.org/I134820265","https://openalex.org/I4210147934"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.15850754,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"6","issue":"1","first_page":"133","last_page":"138"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.8467453718185425},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.7753230333328247},{"id":"https://openalex.org/keywords/finite-state-machine","display_name":"Finite-state machine","score":0.571431040763855},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5664752721786499},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4829629957675934},{"id":"https://openalex.org/keywords/state-information","display_name":"State information","score":0.43956315517425537},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.35787034034729004},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.261405885219574}],"concepts":[{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.8467453718185425},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.7753230333328247},{"id":"https://openalex.org/C167822520","wikidata":"https://www.wikidata.org/wiki/Q176452","display_name":"Finite-state machine","level":2,"score":0.571431040763855},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5664752721786499},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4829629957675934},{"id":"https://openalex.org/C2985963534","wikidata":"https://www.wikidata.org/wiki/Q7603704","display_name":"State information","level":3,"score":0.43956315517425537},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.35787034034729004},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.261405885219574},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1007/bf00993136","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00993136","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.24.2574","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.24.2574","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.imse.cnm.es/~josem/Pubs/JETTA_CSA95.pdf","raw_type":"text"},{"id":"pmh:oai:digital.csic.es:10261/84826","is_oa":false,"landing_page_url":"http://hdl.handle.net/10261/84826","pdf_url":null,"source":{"id":"https://openalex.org/S4306400616","display_name":"DIGITAL.CSIC (Spanish National Research Council (CSIC))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I134820265","host_organization_name":"Consejo Superior de Investigaciones Cient\u00edficas","host_organization_lineage":["https://openalex.org/I134820265"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Art\u00edculo"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1996501408","https://openalex.org/W2052804609","https://openalex.org/W2105761964","https://openalex.org/W2123900388","https://openalex.org/W2124175555","https://openalex.org/W2128859179"],"related_works":["https://openalex.org/W2891321650","https://openalex.org/W4386229729","https://openalex.org/W2038653056","https://openalex.org/W4387024110","https://openalex.org/W2765148997","https://openalex.org/W2752254925","https://openalex.org/W3114527505","https://openalex.org/W3198835888","https://openalex.org/W2386767533","https://openalex.org/W2065694176"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}