{"id":"https://openalex.org/W1984411625","doi":"https://doi.org/10.1007/bf00993130","title":"A switch-level test generation system for synchronous and asynchronous circuits","display_name":"A switch-level test generation system for synchronous and asynchronous circuits","publication_year":1995,"publication_date":"1995-02-01","ids":{"openalex":"https://openalex.org/W1984411625","doi":"https://doi.org/10.1007/bf00993130","mag":"1984411625"},"language":"en","primary_location":{"id":"doi:10.1007/bf00993130","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00993130","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059535551","display_name":"K.L. Einspahr","orcid":null},"institutions":[{"id":"https://openalex.org/I4210143216","display_name":"Concordia University","ror":"https://ror.org/03nvtfm43","country_code":"US","type":"education","lineage":["https://openalex.org/I4210143216"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Kent L. Einspahr","raw_affiliation_strings":["Dept. of Computer Science, Concordia College, 68434, Seward, NE","Dept. of Computer Science, Concordia College, Seward"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Science, Concordia College, 68434, Seward, NE","institution_ids":["https://openalex.org/I4210143216"]},{"raw_affiliation_string":"Dept. of Computer Science, Concordia College, Seward","institution_ids":["https://openalex.org/I4210143216"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113538569","display_name":"Sharad Seth","orcid":null},"institutions":[{"id":"https://openalex.org/I114395901","display_name":"University of Nebraska\u2013Lincoln","ror":"https://ror.org/043mer456","country_code":"US","type":"education","lineage":["https://openalex.org/I114395901"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sharad C. Seth","raw_affiliation_strings":["Dept. of Computer Science and Engineering, University of Nebraska, 68588, Lincoln, NE","Department of Computer Science and Engineering, University of Nebraska - Lincoln"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Science and Engineering, University of Nebraska, 68588, Lincoln, NE","institution_ids":["https://openalex.org/I114395901"]},{"raw_affiliation_string":"Department of Computer Science and Engineering, University of Nebraska - Lincoln","institution_ids":["https://openalex.org/I114395901"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5059535551"],"corresponding_institution_ids":["https://openalex.org/I4210143216"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.4139,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.65791632,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"6","issue":"1","first_page":"59","last_page":"73"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/asynchronous-circuit","display_name":"Asynchronous circuit","score":0.7376534342765808},{"id":"https://openalex.org/keywords/asynchronous-communication","display_name":"Asynchronous communication","score":0.6975234150886536},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6593263149261475},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5751739740371704},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.5372806191444397},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.46096253395080566},{"id":"https://openalex.org/keywords/asynchronous-system","display_name":"Asynchronous system","score":0.45572629570961},{"id":"https://openalex.org/keywords/clock-signal","display_name":"Clock signal","score":0.4477795660495758},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44445881247520447},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.4268742501735687},{"id":"https://openalex.org/keywords/synchronous-circuit","display_name":"Synchronous circuit","score":0.4235073924064636},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.4229910373687744},{"id":"https://openalex.org/keywords/frame","display_name":"Frame (networking)","score":0.41573256254196167},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.35820943117141724},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.33154910802841187},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24838873744010925},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17522069811820984}],"concepts":[{"id":"https://openalex.org/C87695204","wikidata":"https://www.wikidata.org/wiki/Q629971","display_name":"Asynchronous circuit","level":5,"score":0.7376534342765808},{"id":"https://openalex.org/C151319957","wikidata":"https://www.wikidata.org/wiki/Q752739","display_name":"Asynchronous communication","level":2,"score":0.6975234150886536},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6593263149261475},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5751739740371704},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.5372806191444397},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.46096253395080566},{"id":"https://openalex.org/C7923308","wikidata":"https://www.wikidata.org/wiki/Q4812211","display_name":"Asynchronous system","level":5,"score":0.45572629570961},{"id":"https://openalex.org/C137059387","wikidata":"https://www.wikidata.org/wiki/Q426882","display_name":"Clock signal","level":3,"score":0.4477795660495758},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44445881247520447},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.4268742501735687},{"id":"https://openalex.org/C42196554","wikidata":"https://www.wikidata.org/wiki/Q1186179","display_name":"Synchronous circuit","level":4,"score":0.4235073924064636},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.4229910373687744},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.41573256254196167},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.35820943117141724},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.33154910802841187},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24838873744010925},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17522069811820984},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bf00993130","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00993130","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7300000190734863}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W3849209","https://openalex.org/W1802562210","https://openalex.org/W1838428798","https://openalex.org/W1966842980","https://openalex.org/W1968406480","https://openalex.org/W1983253480","https://openalex.org/W1983731190","https://openalex.org/W1989359346","https://openalex.org/W1991369874","https://openalex.org/W2010065567","https://openalex.org/W2059454390","https://openalex.org/W2102673603","https://openalex.org/W2106392679","https://openalex.org/W2110210775","https://openalex.org/W2115203638","https://openalex.org/W2118940934","https://openalex.org/W2149107969","https://openalex.org/W2158037877","https://openalex.org/W2170418452","https://openalex.org/W3147227382","https://openalex.org/W4230769673","https://openalex.org/W4236261315","https://openalex.org/W4247592337"],"related_works":["https://openalex.org/W364924225","https://openalex.org/W2384756109","https://openalex.org/W4312516786","https://openalex.org/W2237508561","https://openalex.org/W1993985975","https://openalex.org/W142020038","https://openalex.org/W803506773","https://openalex.org/W2078264798","https://openalex.org/W1671389381","https://openalex.org/W2184151347"],"abstract_inverted_index":null,"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}