{"id":"https://openalex.org/W2059456074","doi":"https://doi.org/10.1007/bf00993088","title":"Self-timed is self-checking","display_name":"Self-timed is self-checking","publication_year":1995,"publication_date":"1995-04-01","ids":{"openalex":"https://openalex.org/W2059456074","doi":"https://doi.org/10.1007/bf00993088","mag":"2059456074"},"language":"en","primary_location":{"id":"doi:10.1007/bf00993088","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00993088","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044584972","display_name":"I. David","orcid":null},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":true,"raw_author_name":"Ilana David","raw_affiliation_strings":["Department of Electrical Engineering, Technion-Israel Institute of Technology, 32000, Haifa","Department of Electrical Engineering, Technion-Israel Institute of Technology, Haifa"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Technion-Israel Institute of Technology, 32000, Haifa","institution_ids":["https://openalex.org/I174306211"]},{"raw_affiliation_string":"Department of Electrical Engineering, Technion-Israel Institute of Technology, Haifa","institution_ids":["https://openalex.org/I174306211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010407295","display_name":"Ran Ginosar","orcid":null},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Ran Ginosar","raw_affiliation_strings":["Department of Electrical Engineering and Department of Computer Science, Technion-Israel Institute of Technology, 32000, Haifa","Department of Electrical Engineering and Department of Computer Science, Technion-Israel Institute of Technology, Haifa"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Department of Computer Science, Technion-Israel Institute of Technology, 32000, Haifa","institution_ids":["https://openalex.org/I174306211"]},{"raw_affiliation_string":"Department of Electrical Engineering and Department of Computer Science, Technion-Israel Institute of Technology, Haifa","institution_ids":["https://openalex.org/I174306211"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013954312","display_name":"Michael Yoeli","orcid":null},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Michael Yoeli","raw_affiliation_strings":["Department of Computer Science, Technion-Israel Institute of Technology, 32000, Haifa","Dept. of Comput. Sci., Technion-Israel Inst. of Technol., Haifa#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Technion-Israel Institute of Technology, 32000, Haifa","institution_ids":["https://openalex.org/I174306211"]},{"raw_affiliation_string":"Dept. of Comput. Sci., Technion-Israel Inst. of Technol., Haifa#TAB#","institution_ids":["https://openalex.org/I174306211"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5044584972"],"corresponding_institution_ids":["https://openalex.org/I174306211"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.5896,"has_fulltext":false,"cited_by_count":51,"citation_normalized_percentile":{"value":0.82344844,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"6","issue":"2","first_page":"219","last_page":"228"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6976173520088196},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5676847696304321},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.529938817024231},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.5101861953735352},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.4923173189163208},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3717527389526367},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3576989769935608},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3467443585395813},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1380552351474762},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1289188265800476}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6976173520088196},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5676847696304321},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.529938817024231},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.5101861953735352},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.4923173189163208},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3717527389526367},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3576989769935608},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3467443585395813},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1380552351474762},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1289188265800476},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/bf00993088","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00993088","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.54.6957","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.54.6957","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ftp://ftp.technion.ac.il/pub/supported/ee/VLSI/sd.ps","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8199999928474426,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1502716092","https://openalex.org/W1517994034","https://openalex.org/W1765538419","https://openalex.org/W1893762694","https://openalex.org/W1995776447","https://openalex.org/W2053214475","https://openalex.org/W2143436053","https://openalex.org/W2147779504","https://openalex.org/W6820537217"],"related_works":["https://openalex.org/W2746929098","https://openalex.org/W1970410908","https://openalex.org/W4296473373","https://openalex.org/W2515747490","https://openalex.org/W2782719366","https://openalex.org/W1518382973","https://openalex.org/W2542280163","https://openalex.org/W2533122910","https://openalex.org/W1976440785","https://openalex.org/W2059422871"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}