{"id":"https://openalex.org/W2040397222","doi":"https://doi.org/10.1007/bf00993086","title":"Reducing the CMOS RAM test complexity withI DDQ and voltage testing","display_name":"Reducing the CMOS RAM test complexity withI DDQ and voltage testing","publication_year":1995,"publication_date":"1995-04-01","ids":{"openalex":"https://openalex.org/W2040397222","doi":"https://doi.org/10.1007/bf00993086","mag":"2040397222"},"language":"en","primary_location":{"id":"doi:10.1007/bf00993086","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00993086","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086259491","display_name":"Manoj Sachdev","orcid":"https://orcid.org/0000-0002-8256-9828"},"institutions":[{"id":"https://openalex.org/I4210122849","display_name":"Philips (Netherlands)","ror":"https://ror.org/02p2bgp27","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]},{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Manoj Sachdev","raw_affiliation_strings":["Philips Research Laboratories, P.O. Box 80000, 5600 JA, Eindhoven, The Netherlands","Philips' Research Laboratories, Eindhoven The Netherlands"],"affiliations":[{"raw_affiliation_string":"Philips Research Laboratories, P.O. Box 80000, 5600 JA, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I109147379","https://openalex.org/I4210122849"]},{"raw_affiliation_string":"Philips' Research Laboratories, Eindhoven The Netherlands","institution_ids":["https://openalex.org/I4210122849"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5086259491"],"corresponding_institution_ids":["https://openalex.org/I109147379","https://openalex.org/I4210122849"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":2.4834,"has_fulltext":false,"cited_by_count":30,"citation_normalized_percentile":{"value":0.89581624,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"6","issue":"2","first_page":"191","last_page":"202"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.617247462272644},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6102323532104492},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5210249423980713},{"id":"https://openalex.org/keywords/bridging","display_name":"Bridging (networking)","score":0.5146487951278687},{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.4369359612464905},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.38622957468032837},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3684791624546051},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3344714045524597},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.28236716985702515},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.26287269592285156},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21943747997283936}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.617247462272644},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6102323532104492},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5210249423980713},{"id":"https://openalex.org/C174348530","wikidata":"https://www.wikidata.org/wiki/Q188635","display_name":"Bridging (networking)","level":2,"score":0.5146487951278687},{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.4369359612464905},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.38622957468032837},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3684791624546051},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3344714045524597},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.28236716985702515},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.26287269592285156},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21943747997283936},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bf00993086","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00993086","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7900000214576721,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W86453134","https://openalex.org/W1969919140","https://openalex.org/W2009380948","https://openalex.org/W2011042059","https://openalex.org/W2039947128","https://openalex.org/W2090877534","https://openalex.org/W2096462688","https://openalex.org/W2106935654","https://openalex.org/W2111820313","https://openalex.org/W2112727903","https://openalex.org/W2114420072","https://openalex.org/W2121930602","https://openalex.org/W2151509198","https://openalex.org/W2151905636","https://openalex.org/W2154418718","https://openalex.org/W2544675285","https://openalex.org/W2798981073","https://openalex.org/W3104443652","https://openalex.org/W6630925263"],"related_works":["https://openalex.org/W2010752054","https://openalex.org/W2174547182","https://openalex.org/W2543657828","https://openalex.org/W3147443654","https://openalex.org/W2102383741","https://openalex.org/W4231292603","https://openalex.org/W2114024801","https://openalex.org/W2098239884","https://openalex.org/W1970654607","https://openalex.org/W2134896942"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}