{"id":"https://openalex.org/W2089697830","doi":"https://doi.org/10.1007/bf00987037","title":"An analysis of self-diagnosis model by conditional fault set","display_name":"An analysis of self-diagnosis model by conditional fault set","publication_year":1985,"publication_date":"1985-10-01","ids":{"openalex":"https://openalex.org/W2089697830","doi":"https://doi.org/10.1007/bf00987037","mag":"2089697830"},"language":"en","primary_location":{"id":"doi:10.1007/bf00987037","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00987037","pdf_url":null,"source":{"id":"https://openalex.org/S148521650","display_name":"International Journal of Parallel Programming","issn_l":"0885-7458","issn":["0885-7458","1573-7640"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Computer & Information Sciences","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101482888","display_name":"Yoshihisa Ishida","orcid":"https://orcid.org/0000-0002-3543-1025"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Y. Ishida","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113103957","display_name":"N. Adachi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"N. Adachi","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5110163488","display_name":"H. Tokumaru","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"H. Tokumaru","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5101482888"],"corresponding_institution_ids":[],"apc_list":{"value":2290,"currency":"EUR","value_usd":2890},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.26065411,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":"5","first_page":"243","last_page":"259"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.7205739617347717},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.6637606620788574},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5749421119689941},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4819221794605255},{"id":"https://openalex.org/keywords/hamming-distance","display_name":"Hamming distance","score":0.4555562138557434},{"id":"https://openalex.org/keywords/upper-and-lower-bounds","display_name":"Upper and lower bounds","score":0.43417614698410034},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43360739946365356},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4213627576828003},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4202977418899536},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.416831910610199},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09721553325653076},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07233935594558716},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.07097667455673218}],"concepts":[{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.7205739617347717},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.6637606620788574},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5749421119689941},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4819221794605255},{"id":"https://openalex.org/C193319292","wikidata":"https://www.wikidata.org/wiki/Q272172","display_name":"Hamming distance","level":2,"score":0.4555562138557434},{"id":"https://openalex.org/C77553402","wikidata":"https://www.wikidata.org/wiki/Q13222579","display_name":"Upper and lower bounds","level":2,"score":0.43417614698410034},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43360739946365356},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4213627576828003},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4202977418899536},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.416831910610199},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09721553325653076},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07233935594558716},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.07097667455673218},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bf00987037","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00987037","pdf_url":null,"source":{"id":"https://openalex.org/S148521650","display_name":"International Journal of Parallel Programming","issn_l":"0885-7458","issn":["0885-7458","1573-7640"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Computer & Information Sciences","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5899999737739563,"display_name":"Climate action","id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1975538610","https://openalex.org/W1975564985","https://openalex.org/W2000733950","https://openalex.org/W2020218525","https://openalex.org/W2037529689","https://openalex.org/W2038645231","https://openalex.org/W2060953022","https://openalex.org/W2066158680","https://openalex.org/W2073271665","https://openalex.org/W2144599263","https://openalex.org/W2150233937"],"related_works":["https://openalex.org/W3203142394","https://openalex.org/W4302615923","https://openalex.org/W2542937328","https://openalex.org/W1974101135","https://openalex.org/W2351061015","https://openalex.org/W2017509870","https://openalex.org/W4251141768","https://openalex.org/W4360952157","https://openalex.org/W3015581511","https://openalex.org/W2168683897"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}