{"id":"https://openalex.org/W2037135499","doi":"https://doi.org/10.1007/bf00972083","title":"Sensitivity analysis in economics based test strategy planning","display_name":"Sensitivity analysis in economics based test strategy planning","publication_year":1994,"publication_date":"1994-01-01","ids":{"openalex":"https://openalex.org/W2037135499","doi":"https://doi.org/10.1007/bf00972083","mag":"2037135499"},"language":"en","primary_location":{"id":"doi:10.1007/bf00972083","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00972083","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070712794","display_name":"Jochen Dick","orcid":null},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J. H. Dick","raw_affiliation_strings":["Siemens-Nixdorf-Informationssysteme AG, P.O. Box 830951, 8000, Munich 83, Germany","Siemens-Nixdorf-Informationssysteme AG, Munich 83, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens-Nixdorf-Informationssysteme AG, P.O. Box 830951, 8000, Munich 83, Germany","institution_ids":["https://openalex.org/I1325886976"]},{"raw_affiliation_string":"Siemens-Nixdorf-Informationssysteme AG, Munich 83, Germany","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063681095","display_name":"E. Trischler","orcid":null},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"E. Trischler","raw_affiliation_strings":["Siemens-Nixdorf-Informationssysteme AG, P.O. Box 830951, 8000, Munich 83, Germany","Siemens-Nixdorf-Informationssysteme AG, Munich 83, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens-Nixdorf-Informationssysteme AG, P.O. Box 830951, 8000, Munich 83, Germany","institution_ids":["https://openalex.org/I1325886976"]},{"raw_affiliation_string":"Siemens-Nixdorf-Informationssysteme AG, Munich 83, Germany","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037404120","display_name":"C. Dislis","orcid":null},"institutions":[{"id":"https://openalex.org/I59433898","display_name":"Brunel University of London","ror":"https://ror.org/00dn4t376","country_code":"GB","type":"education","lineage":["https://openalex.org/I124357947","https://openalex.org/I59433898"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"C. Dislis","raw_affiliation_strings":["Brunel University, UB8 3PH, Uxbridge, Middlesex, UK","Brunel University Uxbridge UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brunel University, UB8 3PH, Uxbridge, Middlesex, UK","institution_ids":["https://openalex.org/I59433898"]},{"raw_affiliation_string":"Brunel University Uxbridge UK","institution_ids":["https://openalex.org/I59433898"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111802677","display_name":"A.P. Ambler","orcid":null},"institutions":[{"id":"https://openalex.org/I59433898","display_name":"Brunel University of London","ror":"https://ror.org/00dn4t376","country_code":"GB","type":"education","lineage":["https://openalex.org/I124357947","https://openalex.org/I59433898"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"A. P. Ambler","raw_affiliation_strings":["Brunel University, UB8 3PH, Uxbridge, Middlesex, UK","Brunel University Uxbridge UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brunel University, UB8 3PH, Uxbridge, Middlesex, UK","institution_ids":["https://openalex.org/I59433898"]},{"raw_affiliation_string":"Brunel University Uxbridge UK","institution_ids":["https://openalex.org/I59433898"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.22745467,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"5","issue":"2-3","first_page":"239","last_page":"251"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14025","display_name":"Educational Technology and Assessment","score":0.4097000062465668,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14025","display_name":"Educational Technology and Assessment","score":0.4097000062465668,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.8391581177711487},{"id":"https://openalex.org/keywords/activity-based-costing","display_name":"Activity-based costing","score":0.7035283446311951},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5561563968658447},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5239130258560181},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5014574527740479},{"id":"https://openalex.org/keywords/econometrics","display_name":"Econometrics","score":0.3291284739971161},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3000342845916748},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20924881100654602},{"id":"https://openalex.org/keywords/economics","display_name":"Economics","score":0.13125193119049072},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.1312142312526703},{"id":"https://openalex.org/keywords/accounting","display_name":"Accounting","score":0.09035423398017883}],"concepts":[{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.8391581177711487},{"id":"https://openalex.org/C164624739","wikidata":"https://www.wikidata.org/wiki/Q754331","display_name":"Activity-based costing","level":2,"score":0.7035283446311951},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5561563968658447},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5239130258560181},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5014574527740479},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.3291284739971161},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3000342845916748},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20924881100654602},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.13125193119049072},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1312142312526703},{"id":"https://openalex.org/C121955636","wikidata":"https://www.wikidata.org/wiki/Q4116214","display_name":"Accounting","level":1,"score":0.09035423398017883},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bf00972083","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00972083","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W20618122","https://openalex.org/W189637012","https://openalex.org/W632963620","https://openalex.org/W653085201","https://openalex.org/W1499276839","https://openalex.org/W1975819870","https://openalex.org/W1977561601","https://openalex.org/W1977847298","https://openalex.org/W2014208555","https://openalex.org/W2021310805","https://openalex.org/W2063452682","https://openalex.org/W2094273702","https://openalex.org/W2114205609","https://openalex.org/W2128753259","https://openalex.org/W2795789245","https://openalex.org/W2801781822","https://openalex.org/W4301500518","https://openalex.org/W6601659043"],"related_works":["https://openalex.org/W2605744074","https://openalex.org/W160549140","https://openalex.org/W2146384898","https://openalex.org/W131430968","https://openalex.org/W1576087171","https://openalex.org/W46356052","https://openalex.org/W2170111705","https://openalex.org/W2184244453","https://openalex.org/W1967878368","https://openalex.org/W2371447906"],"abstract_inverted_index":null,"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2}],"updated_date":"2026-06-19T15:47:20.252518","created_date":"2025-10-10T00:00:00"}