{"id":"https://openalex.org/W2070345913","doi":"https://doi.org/10.1007/bf00971939","title":"Testability analysis in high level data path synthesis","display_name":"Testability analysis in high level data path synthesis","publication_year":1993,"publication_date":"1993-02-01","ids":{"openalex":"https://openalex.org/W2070345913","doi":"https://doi.org/10.1007/bf00971939","mag":"2070345913"},"language":"en","primary_location":{"id":"doi:10.1007/bf00971939","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00971939","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075779389","display_name":"J. Steensma","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Johannes Steensma","raw_affiliation_strings":["IMEC, Kapeldreef 75, B-3001, Leuven, Belgium","IMEC, Leuven, Belgium,"],"affiliations":[{"raw_affiliation_string":"IMEC, Kapeldreef 75, B-3001, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"IMEC, Leuven, Belgium,","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020851867","display_name":"Werner Geurts","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Werner Geurts","raw_affiliation_strings":["IMEC, Kapeldreef 75, B-3001, Leuven, Belgium","IMEC, Leuven, Belgium,"],"affiliations":[{"raw_affiliation_string":"IMEC, Kapeldreef 75, B-3001, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"IMEC, Leuven, Belgium,","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033235745","display_name":"Francky Catthoor","orcid":"https://orcid.org/0000-0002-3599-8515"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Francky Catthoor","raw_affiliation_strings":["IMEC, Kapeldreef 75, B-3001, Leuven, Belgium","IMEC, Leuven, Belgium,"],"affiliations":[{"raw_affiliation_string":"IMEC, Kapeldreef 75, B-3001, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"IMEC, Leuven, Belgium,","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113499292","display_name":"Hugo De Man","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Hugo De Man","raw_affiliation_strings":["IMEC, Kapeldreef 75, B-3001, Leuven, Belgium","IMEC, Leuven, Belgium,"],"affiliations":[{"raw_affiliation_string":"IMEC, Kapeldreef 75, B-3001, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"IMEC, Leuven, Belgium,","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5075779389"],"corresponding_institution_ids":["https://openalex.org/I4210114974"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.7751,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.76740139,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"4","issue":"1","first_page":"43","last_page":"56"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.9090070724487305},{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.7939567565917969},{"id":"https://openalex.org/keywords/controllability","display_name":"Controllability","score":0.693550169467926},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6298646330833435},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.5736037492752075},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.5101597905158997},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5039052367210388},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.43076038360595703},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.4286136031150818},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3084011375904083},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.18802154064178467},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17622080445289612},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1439571976661682}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.9090070724487305},{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.7939567565917969},{"id":"https://openalex.org/C48209547","wikidata":"https://www.wikidata.org/wiki/Q1331104","display_name":"Controllability","level":2,"score":0.693550169467926},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6298646330833435},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.5736037492752075},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.5101597905158997},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5039052367210388},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.43076038360595703},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.4286136031150818},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3084011375904083},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.18802154064178467},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17622080445289612},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1439571976661682},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bf00971939","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00971939","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1594309182","https://openalex.org/W1599337064","https://openalex.org/W1977294468","https://openalex.org/W1979324833","https://openalex.org/W2077945076","https://openalex.org/W2089775145","https://openalex.org/W2093032919","https://openalex.org/W2099012357","https://openalex.org/W2103538449","https://openalex.org/W2111618025","https://openalex.org/W2119837103","https://openalex.org/W2121758824","https://openalex.org/W2128037820","https://openalex.org/W2128395439","https://openalex.org/W2133269209","https://openalex.org/W2146816098","https://openalex.org/W2155173634","https://openalex.org/W2157082548","https://openalex.org/W2159081664","https://openalex.org/W2163442697","https://openalex.org/W4230104651","https://openalex.org/W4231650527","https://openalex.org/W4242518814"],"related_works":["https://openalex.org/W1986570998","https://openalex.org/W2332386680","https://openalex.org/W1983142522","https://openalex.org/W2782529250","https://openalex.org/W2037921533","https://openalex.org/W2508171592","https://openalex.org/W2801563517","https://openalex.org/W2130864543","https://openalex.org/W2068126039","https://openalex.org/W2041749520"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}