{"id":"https://openalex.org/W1987611073","doi":"https://doi.org/10.1007/bf00137569","title":"A BIST-DFT technique for DC test of analog modules","display_name":"A BIST-DFT technique for DC test of analog modules","publication_year":1996,"publication_date":"1996-01-01","ids":{"openalex":"https://openalex.org/W1987611073","doi":"https://doi.org/10.1007/bf00137569","mag":"1987611073"},"language":"en","primary_location":{"id":"doi:10.1007/bf00137569","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00137569","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070456977","display_name":"C. Dufaza","orcid":null},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Christian Dufaza","raw_affiliation_strings":["Laboratoire d'Informatique, de Robotique et de Micro-\u00e9lectronique de Montpellier, UMR 9928 CNRS, Universit\u00e9 Montpellier II, 161 rue Ada, 5, Montpellier, France","Laboratoire d'Informatique, de Robotique et de Micro-\u00e9lectronique de Montpellier, UMR 9928 CNRS, Universit\u00e9 Montpellier II, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Informatique, de Robotique et de Micro-\u00e9lectronique de Montpellier, UMR 9928 CNRS, Universit\u00e9 Montpellier II, 161 rue Ada, 5, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]},{"raw_affiliation_string":"Laboratoire d'Informatique, de Robotique et de Micro-\u00e9lectronique de Montpellier, UMR 9928 CNRS, Universit\u00e9 Montpellier II, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074236076","display_name":"H. Ihs","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Hassan Ihs","raw_affiliation_strings":["Laboratoire d'Informatique, de Robotique et de Micro-\u00e9lectronique de Montpellier, UMR 9928 CNRS, Universit\u00e9 Montpellier II, 161 rue Ada, 5, Montpellier, France","Laboratoire d'Informatique, de Robotique et de Micro-\u00e9lectronique de Montpellier, UMR 9928 CNRS, Universit\u00e9 Montpellier II, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Informatique, de Robotique et de Micro-\u00e9lectronique de Montpellier, UMR 9928 CNRS, Universit\u00e9 Montpellier II, 161 rue Ada, 5, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]},{"raw_affiliation_string":"Laboratoire d'Informatique, de Robotique et de Micro-\u00e9lectronique de Montpellier, UMR 9928 CNRS, Universit\u00e9 Montpellier II, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5070456977"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210101743"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.10455623,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"9","issue":"1-2","first_page":"117","last_page":"133"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.6925830841064453},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5834817290306091},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5808150768280029},{"id":"https://openalex.org/keywords/spectrum-analyzer","display_name":"Spectrum analyzer","score":0.5670393705368042},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.46950507164001465},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4594884514808655},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.45875290036201477},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4547419548034668},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.4439314007759094},{"id":"https://openalex.org/keywords/analogue-filter","display_name":"Analogue filter","score":0.4409680664539337},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4288698434829712},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.42390161752700806},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3628827929496765},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2948560118675232},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.19458836317062378},{"id":"https://openalex.org/keywords/digital-filter","display_name":"Digital filter","score":0.10448035597801208},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.0801476538181305}],"concepts":[{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.6925830841064453},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5834817290306091},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5808150768280029},{"id":"https://openalex.org/C158007255","wikidata":"https://www.wikidata.org/wiki/Q1055222","display_name":"Spectrum analyzer","level":2,"score":0.5670393705368042},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.46950507164001465},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4594884514808655},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.45875290036201477},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4547419548034668},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.4439314007759094},{"id":"https://openalex.org/C176046018","wikidata":"https://www.wikidata.org/wiki/Q359205","display_name":"Analogue filter","level":4,"score":0.4409680664539337},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4288698434829712},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.42390161752700806},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3628827929496765},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2948560118675232},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.19458836317062378},{"id":"https://openalex.org/C36390408","wikidata":"https://www.wikidata.org/wiki/Q1163067","display_name":"Digital filter","level":3,"score":0.10448035597801208},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0801476538181305},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bf00137569","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00137569","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1672697766","https://openalex.org/W1763924106","https://openalex.org/W1895333871","https://openalex.org/W1914315892","https://openalex.org/W1921561960","https://openalex.org/W1992477284","https://openalex.org/W1997902048","https://openalex.org/W2066058136","https://openalex.org/W2068718420","https://openalex.org/W2081076119","https://openalex.org/W2106816366","https://openalex.org/W2115946481","https://openalex.org/W2119877269","https://openalex.org/W2122770098","https://openalex.org/W2129748997","https://openalex.org/W2131346107","https://openalex.org/W2149980863","https://openalex.org/W2151815409","https://openalex.org/W2165728972","https://openalex.org/W2583333603","https://openalex.org/W2613783142","https://openalex.org/W4229544539","https://openalex.org/W4238367825","https://openalex.org/W4239418687"],"related_works":["https://openalex.org/W2499505660","https://openalex.org/W1909129617","https://openalex.org/W2137594223","https://openalex.org/W2181490004","https://openalex.org/W2167327848","https://openalex.org/W3037468513","https://openalex.org/W2030185406","https://openalex.org/W4244211680","https://openalex.org/W2561828749","https://openalex.org/W3166315890"],"abstract_inverted_index":null,"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}