{"id":"https://openalex.org/W1997550941","doi":"https://doi.org/10.1007/bf00137567","title":"Signature analysis for fault detection of mixed-signal ICs based on dynamic power-supply current","display_name":"Signature analysis for fault detection of mixed-signal ICs based on dynamic power-supply current","publication_year":1996,"publication_date":"1996-01-01","ids":{"openalex":"https://openalex.org/W1997550941","doi":"https://doi.org/10.1007/bf00137567","mag":"1997550941"},"language":"en","primary_location":{"id":"doi:10.1007/bf00137567","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00137567","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5097199574","display_name":"Javier Arg\ufffdelles","orcid":null},"institutions":[{"id":"https://openalex.org/I13134134","display_name":"Universidad de Cantabria","ror":"https://ror.org/046ffzj20","country_code":"ES","type":"education","lineage":["https://openalex.org/I13134134"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Javier Arg\ufffdelles","raw_affiliation_strings":["System Engineering and Automatics Department, University of Cantabria, Electronic Technology, Santander, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"System Engineering and Automatics Department, University of Cantabria, Electronic Technology, Santander, Spain","institution_ids":["https://openalex.org/I13134134"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103831882","display_name":"Salvador Bracho","orcid":null},"institutions":[{"id":"https://openalex.org/I13134134","display_name":"Universidad de Cantabria","ror":"https://ror.org/046ffzj20","country_code":"ES","type":"education","lineage":["https://openalex.org/I13134134"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Salvador Bracho","raw_affiliation_strings":["System Engineering and Automatics Department, University of Cantabria, Electronic Technology, ETSIIT Avda de los Castros s/n, 39005, Santander, Spain","System Engineering and Automatics Department, University of Cantabria, Electronic Technology, Santander, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"System Engineering and Automatics Department, University of Cantabria, Electronic Technology, ETSIIT Avda de los Castros s/n, 39005, Santander, Spain","institution_ids":["https://openalex.org/I13134134"]},{"raw_affiliation_string":"System Engineering and Automatics Department, University of Cantabria, Electronic Technology, Santander, Spain","institution_ids":["https://openalex.org/I13134134"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.7864,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.75532715,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"9","issue":"1-2","first_page":"89","last_page":"107"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6017345786094666},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5219947099685669},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.5185202360153198},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5114675760269165},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.49980854988098145},{"id":"https://openalex.org/keywords/signature","display_name":"Signature (topology)","score":0.4997868537902832},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4905628561973572},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.472549170255661},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.44709745049476624},{"id":"https://openalex.org/keywords/current-sensor","display_name":"Current sensor","score":0.4448786973953247},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4320128560066223},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4266393184661865},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4050053656101227},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39768892526626587},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.3881862759590149},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3662158250808716},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07684764266014099}],"concepts":[{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6017345786094666},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5219947099685669},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.5185202360153198},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5114675760269165},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.49980854988098145},{"id":"https://openalex.org/C2779696439","wikidata":"https://www.wikidata.org/wiki/Q7512811","display_name":"Signature (topology)","level":2,"score":0.4997868537902832},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4905628561973572},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.472549170255661},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.44709745049476624},{"id":"https://openalex.org/C55000061","wikidata":"https://www.wikidata.org/wiki/Q24894777","display_name":"Current sensor","level":3,"score":0.4448786973953247},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4320128560066223},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4266393184661865},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4050053656101227},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39768892526626587},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.3881862759590149},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3662158250808716},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07684764266014099},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bf00137567","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00137567","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6299999952316284}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1674308584","https://openalex.org/W1990633974","https://openalex.org/W2032152253","https://openalex.org/W2050846814","https://openalex.org/W2063588247","https://openalex.org/W2068332337","https://openalex.org/W2093193081","https://openalex.org/W2111237755","https://openalex.org/W2111261370","https://openalex.org/W2132077882","https://openalex.org/W2153610276","https://openalex.org/W2180333551","https://openalex.org/W2200082863","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2031235560","https://openalex.org/W2161335888","https://openalex.org/W2114773158","https://openalex.org/W2548106609","https://openalex.org/W1852277090","https://openalex.org/W1957521530","https://openalex.org/W2266281062","https://openalex.org/W2119043935","https://openalex.org/W67308010","https://openalex.org/W4318953393"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-19T15:47:20.252518","created_date":"2025-10-10T00:00:00"}