{"id":"https://openalex.org/W2012061329","doi":"https://doi.org/10.1007/bf00137562","title":"Behavior model of mixed ADC systems","display_name":"Behavior model of mixed ADC systems","publication_year":1996,"publication_date":"1996-01-01","ids":{"openalex":"https://openalex.org/W2012061329","doi":"https://doi.org/10.1007/bf00137562","mag":"2012061329"},"language":"en","primary_location":{"id":"doi:10.1007/bf00137562","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00137562","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019003930","display_name":"A. Gertners","orcid":null},"institutions":[{"id":"https://openalex.org/I201787326","display_name":"Riga Technical University","ror":"https://ror.org/00twb6c09","country_code":"LV","type":"education","lineage":["https://openalex.org/I201787326"]}],"countries":["LV"],"is_corresponding":true,"raw_author_name":"A. Gertners","raw_affiliation_strings":["Department of Computer Engineering, Riga Technical University, Ausekla 9, LV-1010, Riga, Latvia","Department of Computer Engineering, Riga Technical University, Riga, Latvia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Riga Technical University, Ausekla 9, LV-1010, Riga, Latvia","institution_ids":["https://openalex.org/I201787326"]},{"raw_affiliation_string":"Department of Computer Engineering, Riga Technical University, Riga, Latvia","institution_ids":["https://openalex.org/I201787326"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053558211","display_name":"V. Zagursky","orcid":null},"institutions":[{"id":"https://openalex.org/I201787326","display_name":"Riga Technical University","ror":"https://ror.org/00twb6c09","country_code":"LV","type":"education","lineage":["https://openalex.org/I201787326"]}],"countries":["LV"],"is_corresponding":false,"raw_author_name":"V. Zagursky","raw_affiliation_strings":["Department of Computer Engineering, Riga Technical University, Ausekla 9, LV-1010, Riga, Latvia","Department of Computer Engineering, Riga Technical University, Riga, Latvia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Riga Technical University, Ausekla 9, LV-1010, Riga, Latvia","institution_ids":["https://openalex.org/I201787326"]},{"raw_affiliation_string":"Department of Computer Engineering, Riga Technical University, Riga, Latvia","institution_ids":["https://openalex.org/I201787326"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5098090029","display_name":"D Z. Saldava","orcid":null},"institutions":[{"id":"https://openalex.org/I201787326","display_name":"Riga Technical University","ror":"https://ror.org/00twb6c09","country_code":"LV","type":"education","lineage":["https://openalex.org/I201787326"]}],"countries":["LV"],"is_corresponding":false,"raw_author_name":"D Z. Saldava","raw_affiliation_strings":["Department of Computer Engineering, Riga Technical University, Ausekla 9, LV-1010, Riga, Latvia","Department of Computer Engineering, Riga Technical University, Riga, Latvia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Riga Technical University, Ausekla 9, LV-1010, Riga, Latvia","institution_ids":["https://openalex.org/I201787326"]},{"raw_affiliation_string":"Department of Computer Engineering, Riga Technical University, Riga, Latvia","institution_ids":["https://openalex.org/I201787326"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5019003930"],"corresponding_institution_ids":["https://openalex.org/I201787326"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.15361791,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"9","issue":"1-2","first_page":"19","last_page":"27"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11236","display_name":"Control Systems and Identification","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11236","display_name":"Control Systems and Identification","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.7512168884277344},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5881965160369873},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.5508308410644531},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5464637279510498},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5448129773139954},{"id":"https://openalex.org/keywords/ideal","display_name":"Ideal (ethics)","score":0.5290942192077637},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5123790502548218},{"id":"https://openalex.org/keywords/macro","display_name":"Macro","score":0.48990386724472046},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09726494550704956},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08752262592315674}],"concepts":[{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.7512168884277344},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5881965160369873},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.5508308410644531},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5464637279510498},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5448129773139954},{"id":"https://openalex.org/C2776639384","wikidata":"https://www.wikidata.org/wiki/Q840396","display_name":"Ideal (ethics)","level":2,"score":0.5290942192077637},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5123790502548218},{"id":"https://openalex.org/C166955791","wikidata":"https://www.wikidata.org/wiki/Q629579","display_name":"Macro","level":2,"score":0.48990386724472046},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09726494550704956},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08752262592315674},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bf00137562","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00137562","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1965324089","https://openalex.org/W1970457131","https://openalex.org/W1987576091","https://openalex.org/W2115844704","https://openalex.org/W2140291270","https://openalex.org/W2153118196","https://openalex.org/W2161825580","https://openalex.org/W2913465992","https://openalex.org/W4241286597","https://openalex.org/W6608885098"],"related_works":["https://openalex.org/W2030816003","https://openalex.org/W4239992647","https://openalex.org/W2076325756","https://openalex.org/W81423522","https://openalex.org/W2150013480","https://openalex.org/W2488264085","https://openalex.org/W1509860481","https://openalex.org/W4386206750","https://openalex.org/W1989362889","https://openalex.org/W1605713622"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-06-19T15:47:20.252518","created_date":"2025-10-10T00:00:00"}