{"id":"https://openalex.org/W86453134","doi":"https://doi.org/10.1007/bf00135333","title":"I DDQ testing: A review","display_name":"I DDQ testing: A review","publication_year":1992,"publication_date":"1992-12-01","ids":{"openalex":"https://openalex.org/W86453134","doi":"https://doi.org/10.1007/bf00135333","mag":"86453134"},"language":"en","primary_location":{"id":"doi:10.1007/bf00135333","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00135333","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028507779","display_name":"J.M. Soden","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jerry M. Soden","raw_affiliation_strings":["Department 2275, Sandia National Laboratories, Albuquerque, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department 2275, Sandia National Laboratories, Albuquerque, USA","institution_ids":["https://openalex.org/I4210104735"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111892655","display_name":"C.F. Hawkins","orcid":null},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Charles F. Hawkins","raw_affiliation_strings":["Electrical and Computer Engr. Dept., The University of New Mexico, Albuquerque, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engr. Dept., The University of New Mexico, Albuquerque, USA","institution_ids":["https://openalex.org/I169521973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108360320","display_name":"R. K. Gulati","orcid":null},"institutions":[{"id":"https://openalex.org/I4210136396","display_name":"Microelectronics Research Development (United States)","ror":"https://ror.org/0338vpb86","country_code":"US","type":"company","lineage":["https://openalex.org/I4210136396"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ravi K. Gulati","raw_affiliation_strings":["Ford Microelectronics, Inc., Colorado Springs, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ford Microelectronics, Inc., Colorado Springs, USA","institution_ids":["https://openalex.org/I4210136396"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004780696","display_name":"Weiwei Mao","orcid":"https://orcid.org/0000-0001-7528-2207"},"institutions":[{"id":"https://openalex.org/I4210136396","display_name":"Microelectronics Research Development (United States)","ror":"https://ror.org/0338vpb86","country_code":"US","type":"company","lineage":["https://openalex.org/I4210136396"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Weiwei Mao","raw_affiliation_strings":["Ford Microelectronics, Inc., Colorado Springs, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ford Microelectronics, Inc., Colorado Springs, USA","institution_ids":["https://openalex.org/I4210136396"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":6.4005,"has_fulltext":false,"cited_by_count":154,"citation_normalized_percentile":{"value":0.96814233,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"3","issue":"4","first_page":"291","last_page":"303"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5374242663383484},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41144731640815735},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2313404083251953}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5374242663383484},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41144731640815735},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2313404083251953}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bf00135333","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00135333","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":59,"referenced_works":["https://openalex.org/W122496158","https://openalex.org/W186179651","https://openalex.org/W1511344426","https://openalex.org/W1512510441","https://openalex.org/W1574927748","https://openalex.org/W1581630807","https://openalex.org/W1632381123","https://openalex.org/W1848099926","https://openalex.org/W1913902722","https://openalex.org/W1948474265","https://openalex.org/W1967417417","https://openalex.org/W1968406480","https://openalex.org/W1969919140","https://openalex.org/W1970654607","https://openalex.org/W1973017703","https://openalex.org/W1976241929","https://openalex.org/W1989421560","https://openalex.org/W2005613320","https://openalex.org/W2007169319","https://openalex.org/W2009380948","https://openalex.org/W2011747084","https://openalex.org/W2015873919","https://openalex.org/W2017716268","https://openalex.org/W2037964522","https://openalex.org/W2046817879","https://openalex.org/W2048274027","https://openalex.org/W2050956910","https://openalex.org/W2058277122","https://openalex.org/W2064338941","https://openalex.org/W2102383741","https://openalex.org/W2107479796","https://openalex.org/W2111156521","https://openalex.org/W2112935600","https://openalex.org/W2116577427","https://openalex.org/W2118658141","https://openalex.org/W2119779484","https://openalex.org/W2128392716","https://openalex.org/W2130475334","https://openalex.org/W2134332340","https://openalex.org/W2136159433","https://openalex.org/W2136657530","https://openalex.org/W2142030290","https://openalex.org/W2142925338","https://openalex.org/W2143645707","https://openalex.org/W2144945598","https://openalex.org/W2146509701","https://openalex.org/W2153099500","https://openalex.org/W2154418718","https://openalex.org/W2157748808","https://openalex.org/W2159301721","https://openalex.org/W2160968649","https://openalex.org/W2161612880","https://openalex.org/W2168971185","https://openalex.org/W2408376193","https://openalex.org/W2574616222","https://openalex.org/W4240506841","https://openalex.org/W4245095268","https://openalex.org/W4255251068","https://openalex.org/W6739084212"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2478288626","https://openalex.org/W4391913857","https://openalex.org/W2350741829","https://openalex.org/W2530322880"],"abstract_inverted_index":null,"counts_by_year":[{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}