{"id":"https://openalex.org/W1965344016","doi":"https://doi.org/10.1007/bf00134942","title":"An introduction to the boundary scan standard: ANSI/IEEE Std 1149.1","display_name":"An introduction to the boundary scan standard: ANSI/IEEE Std 1149.1","publication_year":1991,"publication_date":"1991-03-01","ids":{"openalex":"https://openalex.org/W1965344016","doi":"https://doi.org/10.1007/bf00134942","mag":"1965344016"},"language":"en","primary_location":{"id":"doi:10.1007/bf00134942","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00134942","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012523522","display_name":"Colin Maunder","orcid":null},"institutions":[{"id":"https://openalex.org/I1332878012","display_name":"BT Group (United Kingdom)","ror":"https://ror.org/00kv9pj15","country_code":"GB","type":"company","lineage":["https://openalex.org/I1332878012"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"C. M. Maunder","raw_affiliation_strings":["British Telecom Research Laboratories, IP5 7RE, Martlesham Heath, Ipswich, UK","British Telecom Res. Labs., Martlesham Heath, UK"],"affiliations":[{"raw_affiliation_string":"British Telecom Research Laboratories, IP5 7RE, Martlesham Heath, Ipswich, UK","institution_ids":["https://openalex.org/I1332878012"]},{"raw_affiliation_string":"British Telecom Res. Labs., Martlesham Heath, UK","institution_ids":["https://openalex.org/I1332878012"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031893234","display_name":"Rodham E. Tulloss","orcid":"https://orcid.org/0000-0003-2479-9075"},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. E. Tulloss","raw_affiliation_strings":["AT&T Bell Laboratories, Engineering Research Center, 08540, Princeton, New Jersey, USA","AT&T Bell Labs Engineering Research Center, Princeton, USA"],"affiliations":[{"raw_affiliation_string":"AT&T Bell Laboratories, Engineering Research Center, 08540, Princeton, New Jersey, USA","institution_ids":["https://openalex.org/I1283103587"]},{"raw_affiliation_string":"AT&T Bell Labs Engineering Research Center, Princeton, USA","institution_ids":["https://openalex.org/I1283103587"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5012523522"],"corresponding_institution_ids":["https://openalex.org/I1332878012"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.15040184,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"2","issue":"1","first_page":"27","last_page":"42"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9685999751091003,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9685999751091003,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9261000156402588,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.8206414580345154},{"id":"https://openalex.org/keywords/miniaturization","display_name":"Miniaturization","score":0.7333632707595825},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5687147974967957},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5302680730819702},{"id":"https://openalex.org/keywords/principal","display_name":"Principal (computer security)","score":0.5254684686660767},{"id":"https://openalex.org/keywords/ansi-c","display_name":"ANSI C","score":0.5121631622314453},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.5057320594787598},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4704258441925049},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4652901887893677},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4508473873138428},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.44308075308799744},{"id":"https://openalex.org/keywords/task-group","display_name":"Task group","score":0.4328475296497345},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.42940181493759155},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4285890758037567},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3844265937805176},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34254318475723267},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29084593057632446},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.19830423593521118},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.18160712718963623},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.16619712114334106},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.14358842372894287},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.11001333594322205},{"id":"https://openalex.org/keywords/engineering-management","display_name":"Engineering management","score":0.09725585579872131}],"concepts":[{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.8206414580345154},{"id":"https://openalex.org/C57528182","wikidata":"https://www.wikidata.org/wiki/Q1271842","display_name":"Miniaturization","level":2,"score":0.7333632707595825},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5687147974967957},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5302680730819702},{"id":"https://openalex.org/C144559511","wikidata":"https://www.wikidata.org/wiki/Q2986279","display_name":"Principal (computer security)","level":2,"score":0.5254684686660767},{"id":"https://openalex.org/C158100120","wikidata":"https://www.wikidata.org/wiki/Q1931402","display_name":"ANSI C","level":3,"score":0.5121631622314453},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.5057320594787598},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4704258441925049},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4652901887893677},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4508473873138428},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.44308075308799744},{"id":"https://openalex.org/C2985126265","wikidata":"https://www.wikidata.org/wiki/Q1637368","display_name":"Task group","level":2,"score":0.4328475296497345},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.42940181493759155},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4285890758037567},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3844265937805176},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34254318475723267},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29084593057632446},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.19830423593521118},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.18160712718963623},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.16619712114334106},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.14358842372894287},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.11001333594322205},{"id":"https://openalex.org/C110354214","wikidata":"https://www.wikidata.org/wiki/Q6314146","display_name":"Engineering management","level":1,"score":0.09725585579872131},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bf00134942","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00134942","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W327215","https://openalex.org/W93602473","https://openalex.org/W2117040048"],"related_works":["https://openalex.org/W1852363244","https://openalex.org/W2166065438","https://openalex.org/W2145319894","https://openalex.org/W2168601023","https://openalex.org/W1975458101","https://openalex.org/W2127184179","https://openalex.org/W2380857293","https://openalex.org/W2137651210","https://openalex.org/W2117171289","https://openalex.org/W2356618237"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}