{"id":"https://openalex.org/W2070950217","doi":"https://doi.org/10.1007/bf00133390","title":"ITA: An algorithm for I DDQ testability analysis","display_name":"ITA: An algorithm for I DDQ testability analysis","publication_year":1996,"publication_date":"1996-06-01","ids":{"openalex":"https://openalex.org/W2070950217","doi":"https://doi.org/10.1007/bf00133390","mag":"2070950217"},"language":"en","primary_location":{"id":"doi:10.1007/bf00133390","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00133390","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032683868","display_name":"M.G. McNamer","orcid":null},"institutions":[{"id":"https://openalex.org/I180297670","display_name":"RTI International","ror":"https://ror.org/052tfza37","country_code":"US","type":"funder","lineage":["https://openalex.org/I180297670"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Michael G. McNamer","raw_affiliation_strings":["Center for Digital Systems Engineering, Research Triangle Institute, P.O. Box 12194, 27709-2194, RTP, NC, USA","Center for Digital Systems Engineering, Research Triangle Institute, RTP, USA"],"affiliations":[{"raw_affiliation_string":"Center for Digital Systems Engineering, Research Triangle Institute, P.O. Box 12194, 27709-2194, RTP, NC, USA","institution_ids":["https://openalex.org/I180297670"]},{"raw_affiliation_string":"Center for Digital Systems Engineering, Research Triangle Institute, RTP, USA","institution_ids":["https://openalex.org/I180297670"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076014723","display_name":"H. Troy Nagle","orcid":"https://orcid.org/0000-0003-2323-9818"},"institutions":[{"id":"https://openalex.org/I137902535","display_name":"North Carolina State University","ror":"https://ror.org/04tj63d06","country_code":"US","type":"education","lineage":["https://openalex.org/I137902535"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. Troy Nagle","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, North Carolina State University, 27695-7911, Raleigh, NC, USA","Dept. of electrical and computer engineering, North Carolina State University, Raleigh, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, North Carolina State University, 27695-7911, Raleigh, NC, USA","institution_ids":["https://openalex.org/I137902535"]},{"raw_affiliation_string":"Dept. of electrical and computer engineering, North Carolina State University, Raleigh, USA#TAB#","institution_ids":["https://openalex.org/I137902535"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5032683868"],"corresponding_institution_ids":["https://openalex.org/I180297670"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16539373,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"8","issue":"3","first_page":"287","last_page":"298"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.8418108224868774},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6046075224876404},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5806857347488403},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.5253913998603821},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.5142795443534851},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.48965221643447876},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.48613569140434265},{"id":"https://openalex.org/keywords/independence","display_name":"Independence (probability theory)","score":0.47475460171699524},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4609411954879761},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3602268099784851},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3464208245277405},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3245004117488861},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.2812530994415283},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.21207517385482788},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11818677186965942},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.09922963380813599}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.8418108224868774},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6046075224876404},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5806857347488403},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.5253913998603821},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.5142795443534851},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.48965221643447876},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.48613569140434265},{"id":"https://openalex.org/C35651441","wikidata":"https://www.wikidata.org/wiki/Q625303","display_name":"Independence (probability theory)","level":2,"score":0.47475460171699524},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4609411954879761},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3602268099784851},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3464208245277405},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3245004117488861},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.2812530994415283},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.21207517385482788},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11818677186965942},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09922963380813599},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bf00133390","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf00133390","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W60738651","https://openalex.org/W203017550","https://openalex.org/W1543281322","https://openalex.org/W1972379155","https://openalex.org/W1973017703","https://openalex.org/W2011747084","https://openalex.org/W2033919623","https://openalex.org/W2050956910","https://openalex.org/W2126693329","https://openalex.org/W2138148070","https://openalex.org/W2152406824","https://openalex.org/W2154418718","https://openalex.org/W2159301721","https://openalex.org/W2169033838","https://openalex.org/W4252856907"],"related_works":["https://openalex.org/W2393524141","https://openalex.org/W2365130684","https://openalex.org/W2370255574","https://openalex.org/W2106502108","https://openalex.org/W2783560053","https://openalex.org/W2169676947","https://openalex.org/W2098899017","https://openalex.org/W2169576796","https://openalex.org/W1493811107","https://openalex.org/W2151980349"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}