{"id":"https://openalex.org/W2968290676","doi":"https://doi.org/10.1007/978-981-32-9767-8_47","title":"Statistical Variation Aware Leakage and Total Power Estimation of 16\u00a0nm VLSI Digital Circuits Based on Regression Models","display_name":"Statistical Variation Aware Leakage and Total Power Estimation of 16\u00a0nm VLSI Digital Circuits Based on Regression Models","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2968290676","doi":"https://doi.org/10.1007/978-981-32-9767-8_47","mag":"2968290676"},"language":"en","primary_location":{"id":"doi:10.1007/978-981-32-9767-8_47","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-32-9767-8_47","pdf_url":null,"source":{"id":"https://openalex.org/S2764900261","display_name":"Communications in computer and information science","issn_l":"1865-0929","issn":["1865-0929","1865-0937"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Computer and Information Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021745462","display_name":"Deepthi Amuru","orcid":"https://orcid.org/0000-0003-0793-3244"},"institutions":[{"id":"https://openalex.org/I64189192","display_name":"International Institute of Information Technology, Hyderabad","ror":"https://ror.org/05f11g639","country_code":"IN","type":"education","lineage":["https://openalex.org/I64189192"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Deepthi Amuru","raw_affiliation_strings":["International Institute of Information Technology, Hyderabad, India"],"affiliations":[{"raw_affiliation_string":"International Institute of Information Technology, Hyderabad, India","institution_ids":["https://openalex.org/I64189192"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109414323","display_name":"Andleeb Zahra","orcid":null},"institutions":[{"id":"https://openalex.org/I861853513","display_name":"Sapienza University of Rome","ror":"https://ror.org/02be6w209","country_code":"IT","type":"education","lineage":["https://openalex.org/I861853513"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Andleeb Zahra","raw_affiliation_strings":["DIET, Sapienza University of Rome, Rome, Italy"],"affiliations":[{"raw_affiliation_string":"DIET, Sapienza University of Rome, Rome, Italy","institution_ids":["https://openalex.org/I861853513"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060396811","display_name":"Zia Abbas","orcid":"https://orcid.org/0000-0002-3747-3640"},"institutions":[{"id":"https://openalex.org/I64189192","display_name":"International Institute of Information Technology, Hyderabad","ror":"https://ror.org/05f11g639","country_code":"IN","type":"education","lineage":["https://openalex.org/I64189192"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Zia Abbas","raw_affiliation_strings":["International Institute of Information Technology, Hyderabad, India"],"affiliations":[{"raw_affiliation_string":"International Institute of Information Technology, Hyderabad, India","institution_ids":["https://openalex.org/I64189192"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5021745462"],"corresponding_institution_ids":["https://openalex.org/I64189192"],"apc_list":null,"apc_paid":null,"fwci":2.2329,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.86828507,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"565","last_page":"578"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.639585018157959},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.6051561832427979},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.5783095955848694},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5734974145889282},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5218763947486877},{"id":"https://openalex.org/keywords/linear-regression","display_name":"Linear regression","score":0.5201616287231445},{"id":"https://openalex.org/keywords/regression-analysis","display_name":"Regression analysis","score":0.5050709843635559},{"id":"https://openalex.org/keywords/polynomial-regression","display_name":"Polynomial regression","score":0.500443696975708},{"id":"https://openalex.org/keywords/multivariate-statistics","display_name":"Multivariate statistics","score":0.49915266036987305},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4858643412590027},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.4563806653022766},{"id":"https://openalex.org/keywords/regression","display_name":"Regression","score":0.44708919525146484},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.44542235136032104},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4339098036289215},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4132137596607208},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.393293559551239},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.391231507062912},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.32952171564102173},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.31877750158309937},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2080148458480835},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.1554160714149475},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1518419086933136},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.12495946884155273}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.639585018157959},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6051561832427979},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.5783095955848694},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5734974145889282},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5218763947486877},{"id":"https://openalex.org/C48921125","wikidata":"https://www.wikidata.org/wiki/Q10861030","display_name":"Linear regression","level":2,"score":0.5201616287231445},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.5050709843635559},{"id":"https://openalex.org/C120068334","wikidata":"https://www.wikidata.org/wiki/Q45343","display_name":"Polynomial regression","level":3,"score":0.500443696975708},{"id":"https://openalex.org/C161584116","wikidata":"https://www.wikidata.org/wiki/Q1952580","display_name":"Multivariate statistics","level":2,"score":0.49915266036987305},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4858643412590027},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.4563806653022766},{"id":"https://openalex.org/C83546350","wikidata":"https://www.wikidata.org/wiki/Q1139051","display_name":"Regression","level":2,"score":0.44708919525146484},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.44542235136032104},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4339098036289215},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4132137596607208},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.393293559551239},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.391231507062912},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.32952171564102173},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.31877750158309937},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2080148458480835},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.1554160714149475},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1518419086933136},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.12495946884155273},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-981-32-9767-8_47","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-32-9767-8_47","pdf_url":null,"source":{"id":"https://openalex.org/S2764900261","display_name":"Communications in computer and information science","issn_l":"1865-0929","issn":["1865-0929","1865-0937"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Computer and Information Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.49000000953674316,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W604474622","https://openalex.org/W1829868563","https://openalex.org/W1968204888","https://openalex.org/W1982303956","https://openalex.org/W2033700531","https://openalex.org/W2080586212","https://openalex.org/W2115834537","https://openalex.org/W2116798985","https://openalex.org/W2154776925","https://openalex.org/W2159619318","https://openalex.org/W2164665731","https://openalex.org/W2170918065","https://openalex.org/W2173889950","https://openalex.org/W4285719527","https://openalex.org/W4292283308"],"related_works":["https://openalex.org/W2204879205","https://openalex.org/W2096437374","https://openalex.org/W1943174035","https://openalex.org/W1928481607","https://openalex.org/W3135165657","https://openalex.org/W1485582195","https://openalex.org/W57337972","https://openalex.org/W2007131406","https://openalex.org/W2912670917","https://openalex.org/W2157982046"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":5},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}