{"id":"https://openalex.org/W4210954402","doi":"https://doi.org/10.1007/978-981-16-8129-5_53","title":"Reliability Impacts of ICT Failures on Synchrophasor Based Dynamic Thermal Rating System","display_name":"Reliability Impacts of ICT Failures on Synchrophasor Based Dynamic Thermal Rating System","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4210954402","doi":"https://doi.org/10.1007/978-981-16-8129-5_53"},"language":"en","primary_location":{"id":"doi:10.1007/978-981-16-8129-5_53","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-16-8129-5_53","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025406913","display_name":"Bilkisu Jimada-Ojuolape","orcid":"https://orcid.org/0000-0001-8592-8438"},"institutions":[{"id":"https://openalex.org/I139322472","display_name":"Universiti Sains Malaysia","ror":"https://ror.org/02rgb2k63","country_code":"MY","type":"education","lineage":["https://openalex.org/I139322472"]},{"id":"https://openalex.org/I98243723","display_name":"Kwara State University","ror":"https://ror.org/05np2xn95","country_code":"NG","type":"education","lineage":["https://openalex.org/I98243723"]}],"countries":["MY","NG"],"is_corresponding":false,"raw_author_name":"Bilkisu Jimada-Ojuolape","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Kwara State University (KWASU), Malete, 241104, Kwara State, Nigeria","School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia (USM), 14300, Nibong Tebal, Penang, Malaysia","School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia (USM), Nibong Tebal, Malaysia","Department of Electrical and Computer Engineering, Kwara State University (KWASU), Malete, Nigeria"],"raw_orcid":"https://orcid.org/0000-0001-8592-8438","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Kwara State University (KWASU), Malete, 241104, Kwara State, Nigeria","institution_ids":["https://openalex.org/I98243723"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia (USM), 14300, Nibong Tebal, Penang, Malaysia","institution_ids":["https://openalex.org/I139322472"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia (USM), Nibong Tebal, Malaysia","institution_ids":["https://openalex.org/I139322472"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Kwara State University (KWASU), Malete, Nigeria","institution_ids":["https://openalex.org/I98243723"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042023563","display_name":"Jiashen Teh","orcid":"https://orcid.org/0000-0001-9741-6245"},"institutions":[{"id":"https://openalex.org/I139322472","display_name":"Universiti Sains Malaysia","ror":"https://ror.org/02rgb2k63","country_code":"MY","type":"education","lineage":["https://openalex.org/I139322472"]}],"countries":["MY"],"is_corresponding":true,"raw_author_name":"Jiashen Teh","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia (USM), 14300, Nibong Tebal, Penang, Malaysia","School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia (USM), Nibong Tebal, Malaysia"],"raw_orcid":"https://orcid.org/0000-0001-9741-6245","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia (USM), 14300, Nibong Tebal, Penang, Malaysia","institution_ids":["https://openalex.org/I139322472"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia (USM), Nibong Tebal, Malaysia","institution_ids":["https://openalex.org/I139322472"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5042023563"],"corresponding_institution_ids":["https://openalex.org/I139322472"],"apc_list":null,"apc_paid":null,"fwci":0.8492,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.63432716,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"337","last_page":"343"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7140786647796631},{"id":"https://openalex.org/keywords/information-and-communications-technology","display_name":"Information and Communications Technology","score":0.7129566073417664},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6139017939567566},{"id":"https://openalex.org/keywords/phasor","display_name":"Phasor","score":0.5515218377113342},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.5200580954551697},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4955977201461792},{"id":"https://openalex.org/keywords/software-deployment","display_name":"Software deployment","score":0.4887657165527344},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.48312804102897644},{"id":"https://openalex.org/keywords/telecommunications-network","display_name":"Telecommunications network","score":0.43344366550445557},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4127707779407501},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2010146677494049},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15284395217895508}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7140786647796631},{"id":"https://openalex.org/C67363961","wikidata":"https://www.wikidata.org/wiki/Q5268834","display_name":"Information and Communications Technology","level":2,"score":0.7129566073417664},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6139017939567566},{"id":"https://openalex.org/C176605952","wikidata":"https://www.wikidata.org/wiki/Q827674","display_name":"Phasor","level":4,"score":0.5515218377113342},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.5200580954551697},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4955977201461792},{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.4887657165527344},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.48312804102897644},{"id":"https://openalex.org/C192126672","wikidata":"https://www.wikidata.org/wiki/Q1068715","display_name":"Telecommunications network","level":2,"score":0.43344366550445557},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4127707779407501},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2010146677494049},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15284395217895508},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-981-16-8129-5_53","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-16-8129-5_53","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1886161614","https://openalex.org/W1997080377","https://openalex.org/W2020786402","https://openalex.org/W2056636551","https://openalex.org/W2116279256","https://openalex.org/W2344903959","https://openalex.org/W2752734004","https://openalex.org/W2792889392","https://openalex.org/W2794445911","https://openalex.org/W2795678459","https://openalex.org/W2808286649","https://openalex.org/W2885275709","https://openalex.org/W2889001642","https://openalex.org/W2889729614","https://openalex.org/W2895691141","https://openalex.org/W2897016432","https://openalex.org/W2927922269","https://openalex.org/W2944046938","https://openalex.org/W2955002187","https://openalex.org/W2984985057","https://openalex.org/W2990772620","https://openalex.org/W2996350667","https://openalex.org/W3003724466","https://openalex.org/W3009966096","https://openalex.org/W3037508536","https://openalex.org/W3041849698","https://openalex.org/W3088797026","https://openalex.org/W3089061528","https://openalex.org/W3092558381"],"related_works":["https://openalex.org/W1985257614","https://openalex.org/W2129278710","https://openalex.org/W2180313337","https://openalex.org/W1583498368","https://openalex.org/W2097113102","https://openalex.org/W2772326242","https://openalex.org/W2097209991","https://openalex.org/W2162956301","https://openalex.org/W2512818062","https://openalex.org/W2102647849"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}