{"id":"https://openalex.org/W3014924047","doi":"https://doi.org/10.1007/978-981-13-9409-6_27","title":"An On-Line EMC Test System for Liquid Flow Meters","display_name":"An On-Line EMC Test System for Liquid Flow Meters","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3014924047","doi":"https://doi.org/10.1007/978-981-13-9409-6_27","mag":"3014924047"},"language":"en","primary_location":{"id":"doi:10.1007/978-981-13-9409-6_27","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-13-9409-6_27","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049340467","display_name":"Haijiao An","orcid":null},"institutions":[{"id":"https://openalex.org/I4210143001","display_name":"Tianjin Institute of Metrological Supervision Testing","ror":"https://ror.org/03pydxa09","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210143001"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Haijiao An","raw_affiliation_strings":["Tianjin Institute of Metrological Supervision and Testing, No.4, Keyanxi Road, Nankai District, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tianjin Institute of Metrological Supervision and Testing, No.4, Keyanxi Road, Nankai District, Tianjin, China","institution_ids":["https://openalex.org/I4210143001"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101936887","display_name":"Xin Shi","orcid":"https://orcid.org/0000-0003-1198-2882"},"institutions":[{"id":"https://openalex.org/I4210143001","display_name":"Tianjin Institute of Metrological Supervision Testing","ror":"https://ror.org/03pydxa09","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210143001"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Shi","raw_affiliation_strings":["Tianjin Institute of Metrological Supervision and Testing, No.4, Keyanxi Road, Nankai District, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tianjin Institute of Metrological Supervision and Testing, No.4, Keyanxi Road, Nankai District, Tianjin, China","institution_ids":["https://openalex.org/I4210143001"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032194891","display_name":"Xigang Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210143001","display_name":"Tianjin Institute of Metrological Supervision Testing","ror":"https://ror.org/03pydxa09","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210143001"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xigang Wang","raw_affiliation_strings":["Tianjin Institute of Metrological Supervision and Testing, No.4, Keyanxi Road, Nankai District, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tianjin Institute of Metrological Supervision and Testing, No.4, Keyanxi Road, Nankai District, Tianjin, China","institution_ids":["https://openalex.org/I4210143001"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5049340467"],"corresponding_institution_ids":["https://openalex.org/I4210143001"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"223","last_page":"230"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11220","display_name":"Water Systems and Optimization","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11192","display_name":"Underwater Vehicles and Communication Systems","score":0.9890000224113464,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"Electromagnetic compatibility","score":0.9013287425041199},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.6925684809684753},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.6287493705749512},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.590811014175415},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.533836305141449},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.49861931800842285},{"id":"https://openalex.org/keywords/flow-measurement","display_name":"Flow measurement","score":0.47499409317970276},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4716814160346985},{"id":"https://openalex.org/keywords/liquid-flow","display_name":"Liquid flow","score":0.46929603815078735},{"id":"https://openalex.org/keywords/flow","display_name":"Flow (mathematics)","score":0.4677935242652893},{"id":"https://openalex.org/keywords/test-equipment","display_name":"Test equipment","score":0.41179099678993225},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33922410011291504},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.21289461851119995},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1287100613117218},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.09501087665557861},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.07539647817611694},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.07206791639328003}],"concepts":[{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.9013287425041199},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.6925684809684753},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.6287493705749512},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.590811014175415},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.533836305141449},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.49861931800842285},{"id":"https://openalex.org/C16302685","wikidata":"https://www.wikidata.org/wiki/Q15091623","display_name":"Flow measurement","level":2,"score":0.47499409317970276},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4716814160346985},{"id":"https://openalex.org/C2986674422","wikidata":"https://www.wikidata.org/wiki/Q216320","display_name":"Liquid flow","level":2,"score":0.46929603815078735},{"id":"https://openalex.org/C38349280","wikidata":"https://www.wikidata.org/wiki/Q1434290","display_name":"Flow (mathematics)","level":2,"score":0.4677935242652893},{"id":"https://openalex.org/C2983725658","wikidata":"https://www.wikidata.org/wiki/Q7705768","display_name":"Test equipment","level":2,"score":0.41179099678993225},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33922410011291504},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.21289461851119995},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1287100613117218},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.09501087665557861},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.07539647817611694},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.07206791639328003},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-981-13-9409-6_27","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-13-9409-6_27","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2043433209"],"related_works":["https://openalex.org/W1921091955","https://openalex.org/W4230660276","https://openalex.org/W1589192924","https://openalex.org/W2041511579","https://openalex.org/W3045840497","https://openalex.org/W2169413733","https://openalex.org/W3011975419","https://openalex.org/W2077896430","https://openalex.org/W4312812552","https://openalex.org/W101509408"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}