{"id":"https://openalex.org/W2954161582","doi":"https://doi.org/10.1007/978-981-13-6508-9_66","title":"The Design of Low-Power and High-Precision Electronic Scale Based on Single Chip","display_name":"The Design of Low-Power and High-Precision Electronic Scale Based on Single Chip","publication_year":2019,"publication_date":"2019-06-13","ids":{"openalex":"https://openalex.org/W2954161582","doi":"https://doi.org/10.1007/978-981-13-6508-9_66","mag":"2954161582"},"language":"en","primary_location":{"id":"doi:10.1007/978-981-13-6508-9_66","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-13-6508-9_66","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100616362","display_name":"Dun Liu","orcid":"https://orcid.org/0000-0002-1768-4598"},"institutions":[{"id":"https://openalex.org/I133270356","display_name":"Tianjin University of Technology and Education","ror":"https://ror.org/035gwtk09","country_code":"CN","type":"education","lineage":["https://openalex.org/I133270356"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dun Liu","raw_affiliation_strings":["School of Electronic Engineering, Tianjin University of Technology and Education (TUTE), Tianjin, 300222, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Engineering, Tianjin University of Technology and Education (TUTE), Tianjin, 300222, China","institution_ids":["https://openalex.org/I133270356"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031402097","display_name":"Qu Fang","orcid":null},"institutions":[{"id":"https://openalex.org/I133270356","display_name":"Tianjin University of Technology and Education","ror":"https://ror.org/035gwtk09","country_code":"CN","type":"education","lineage":["https://openalex.org/I133270356"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fang Qu","raw_affiliation_strings":["School of Electronic Engineering, Tianjin University of Technology and Education (TUTE), Tianjin, 300222, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Engineering, Tianjin University of Technology and Education (TUTE), Tianjin, 300222, China","institution_ids":["https://openalex.org/I133270356"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I133270356"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.12306358,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"549","last_page":"557"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.8827000260353088,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.8827000260353088,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14225","display_name":"Advanced Sensor and Control Systems","score":0.8744000196456909,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14163","display_name":"Astronomical Observations and Instrumentation","score":0.7914999723434448,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6901071071624756},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6492976546287537},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.5864476561546326},{"id":"https://openalex.org/keywords/strain-gauge","display_name":"Strain gauge","score":0.531333327293396},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5057013034820557},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4879264533519745},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.41681358218193054},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3619748651981354},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3539317846298218}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6901071071624756},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6492976546287537},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.5864476561546326},{"id":"https://openalex.org/C60584519","wikidata":"https://www.wikidata.org/wiki/Q610723","display_name":"Strain gauge","level":2,"score":0.531333327293396},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5057013034820557},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4879264533519745},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41681358218193054},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3619748651981354},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3539317846298218},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-981-13-6508-9_66","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-13-6508-9_66","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8899999856948853,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2601018298"],"related_works":["https://openalex.org/W2278574869","https://openalex.org/W4205398706","https://openalex.org/W4385658569","https://openalex.org/W1492000841","https://openalex.org/W1968336058","https://openalex.org/W4206704705","https://openalex.org/W2088454087","https://openalex.org/W2913316996","https://openalex.org/W2125911763","https://openalex.org/W574007661"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}