{"id":"https://openalex.org/W2967501580","doi":"https://doi.org/10.1007/978-981-13-6504-1_28","title":"Image Enhancement of Finger Vein Patterns Based on the Guided Filter","display_name":"Image Enhancement of Finger Vein Patterns Based on the Guided Filter","publication_year":2019,"publication_date":"2019-08-13","ids":{"openalex":"https://openalex.org/W2967501580","doi":"https://doi.org/10.1007/978-981-13-6504-1_28","mag":"2967501580"},"language":"en","primary_location":{"id":"doi:10.1007/978-981-13-6504-1_28","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-13-6504-1_28","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040618725","display_name":"Tao Zhan","orcid":"https://orcid.org/0000-0002-9283-4488"},"institutions":[{"id":"https://openalex.org/I55022517","display_name":"Heilongjiang University","ror":"https://ror.org/04zyhq975","country_code":"CN","type":"education","lineage":["https://openalex.org/I55022517"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Tao Zhan","raw_affiliation_strings":["College of Electronic Engineering, Heilongjiang University, Harbin, 150080, China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Engineering, Heilongjiang University, Harbin, 150080, China","institution_ids":["https://openalex.org/I55022517"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079274590","display_name":"Hui Ma","orcid":"https://orcid.org/0000-0002-0513-2462"},"institutions":[{"id":"https://openalex.org/I55022517","display_name":"Heilongjiang University","ror":"https://ror.org/04zyhq975","country_code":"CN","type":"education","lineage":["https://openalex.org/I55022517"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Ma","raw_affiliation_strings":["College of Electronic Engineering, Heilongjiang University, Harbin, 150080, China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Engineering, Heilongjiang University, Harbin, 150080, China","institution_ids":["https://openalex.org/I55022517"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100685461","display_name":"Na Hu","orcid":"https://orcid.org/0000-0001-6362-0969"},"institutions":[{"id":"https://openalex.org/I55022517","display_name":"Heilongjiang University","ror":"https://ror.org/04zyhq975","country_code":"CN","type":"education","lineage":["https://openalex.org/I55022517"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Na Hu","raw_affiliation_strings":["College of Electronic Engineering, Heilongjiang University, Harbin, 150080, China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Engineering, Heilongjiang University, Harbin, 150080, China","institution_ids":["https://openalex.org/I55022517"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5040618725"],"corresponding_institution_ids":["https://openalex.org/I55022517"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15893398,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"218","last_page":"226"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9801999926567078,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10616","display_name":"Smart Agriculture and AI","score":0.9674000144004822,"subfield":{"id":"https://openalex.org/subfields/1110","display_name":"Plant Science"},"field":{"id":"https://openalex.org/fields/11","display_name":"Agricultural and Biological Sciences"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.7642806768417358},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7332727909088135},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6861569285392761},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5172610878944397},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.50209641456604},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.49678853154182434},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.48948729038238525},{"id":"https://openalex.org/keywords/gabor-filter","display_name":"Gabor filter","score":0.48926684260368347},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.47961318492889404},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.44227489829063416},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.40944215655326843},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3693501949310303},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.06724146008491516}],"concepts":[{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.7642806768417358},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7332727909088135},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6861569285392761},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5172610878944397},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.50209641456604},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.49678853154182434},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.48948729038238525},{"id":"https://openalex.org/C2779883129","wikidata":"https://www.wikidata.org/wiki/Q2447890","display_name":"Gabor filter","level":3,"score":0.48926684260368347},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.47961318492889404},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.44227489829063416},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.40944215655326843},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3693501949310303},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.06724146008491516},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-981-13-6504-1_28","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-13-6504-1_28","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2048801036","https://openalex.org/W2083692129","https://openalex.org/W2099244020","https://openalex.org/W2125188192","https://openalex.org/W2128254161","https://openalex.org/W2144531167","https://openalex.org/W2153173504","https://openalex.org/W2284769384","https://openalex.org/W2412616286","https://openalex.org/W2765829720","https://openalex.org/W3144254431","https://openalex.org/W6647720530","https://openalex.org/W7038397428"],"related_works":["https://openalex.org/W2375786911","https://openalex.org/W2388882557","https://openalex.org/W2367630196","https://openalex.org/W756944427","https://openalex.org/W2349547031","https://openalex.org/W2358871510","https://openalex.org/W278619663","https://openalex.org/W2387796150","https://openalex.org/W4385061335","https://openalex.org/W1563306970"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}