{"id":"https://openalex.org/W2911591439","doi":"https://doi.org/10.1007/978-981-13-5950-7_34","title":"LEADER: Leakage Currents Estimation Technique for Aging Degradation Aware 16\u00a0nm CMOS Circuits","display_name":"LEADER: Leakage Currents Estimation Technique for Aging Degradation Aware 16\u00a0nm CMOS Circuits","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2911591439","doi":"https://doi.org/10.1007/978-981-13-5950-7_34","mag":"2911591439"},"language":"en","primary_location":{"id":"doi:10.1007/978-981-13-5950-7_34","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-13-5950-7_34","pdf_url":null,"source":{"id":"https://openalex.org/S2764900261","display_name":"Communications in computer and information science","issn_l":"1865-0929","issn":["1865-0929","1865-0937"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Computer and Information Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060396811","display_name":"Zia Abbas","orcid":"https://orcid.org/0000-0002-3747-3640"},"institutions":[{"id":"https://openalex.org/I65181880","display_name":"Indian Institute of Technology Hyderabad","ror":"https://ror.org/01j4v3x97","country_code":"IN","type":"education","lineage":["https://openalex.org/I65181880"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Zia Abbas","raw_affiliation_strings":["Center for VLSI and Embedded System Technologies (CVEST), IIIT Hyderabad, Hyderabad, India"],"affiliations":[{"raw_affiliation_string":"Center for VLSI and Embedded System Technologies (CVEST), IIIT Hyderabad, Hyderabad, India","institution_ids":["https://openalex.org/I65181880"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109414323","display_name":"Andleeb Zahra","orcid":null},"institutions":[{"id":"https://openalex.org/I861853513","display_name":"Sapienza University of Rome","ror":"https://ror.org/02be6w209","country_code":"IT","type":"education","lineage":["https://openalex.org/I861853513"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Andleeb Zahra","raw_affiliation_strings":["DIET, Sapienza University of Rome, Rome, Italy"],"affiliations":[{"raw_affiliation_string":"DIET, Sapienza University of Rome, Rome, Italy","institution_ids":["https://openalex.org/I861853513"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067054447","display_name":"Mauro Olivieri","orcid":"https://orcid.org/0000-0002-0214-9904"},"institutions":[{"id":"https://openalex.org/I861853513","display_name":"Sapienza University of Rome","ror":"https://ror.org/02be6w209","country_code":"IT","type":"education","lineage":["https://openalex.org/I861853513"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Mauro Olivieri","raw_affiliation_strings":["DIET, Sapienza University of Rome, Rome, Italy"],"affiliations":[{"raw_affiliation_string":"DIET, Sapienza University of Rome, Rome, Italy","institution_ids":["https://openalex.org/I861853513"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5060396811"],"corresponding_institution_ids":["https://openalex.org/I65181880"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.01882376,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"394","last_page":"407"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.7887240052223206},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7388347387313843},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.506330132484436},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5034467577934265},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.49048563838005066},{"id":"https://openalex.org/keywords/vhdl","display_name":"VHDL","score":0.49011310935020447},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.48721450567245483},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3441319465637207},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24046334624290466},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.22651886940002441},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.15046250820159912}],"concepts":[{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.7887240052223206},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7388347387313843},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.506330132484436},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5034467577934265},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.49048563838005066},{"id":"https://openalex.org/C36941000","wikidata":"https://www.wikidata.org/wiki/Q209455","display_name":"VHDL","level":3,"score":0.49011310935020447},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.48721450567245483},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3441319465637207},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24046334624290466},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.22651886940002441},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.15046250820159912},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/978-981-13-5950-7_34","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-13-5950-7_34","pdf_url":null,"source":{"id":"https://openalex.org/S2764900261","display_name":"Communications in computer and information science","issn_l":"1865-0929","issn":["1865-0929","1865-0937"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Computer and Information Science","raw_type":"book-chapter"},{"id":"pmh:oai:iris.uniroma1.it:11573/1292106","is_oa":false,"landing_page_url":"http://hdl.handle.net/11573/1292106","pdf_url":null,"source":{"id":"https://openalex.org/S4377196107","display_name":"IRIS Research product catalog (Sapienza University of Rome)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W604474622","https://openalex.org/W1829868563","https://openalex.org/W1968204888","https://openalex.org/W1982303956","https://openalex.org/W1991891926","https://openalex.org/W2027385314","https://openalex.org/W2029364567","https://openalex.org/W2041424982","https://openalex.org/W2108014737","https://openalex.org/W2113996606","https://openalex.org/W2122330963","https://openalex.org/W2125858563","https://openalex.org/W2173889950","https://openalex.org/W2486399482","https://openalex.org/W2538731448","https://openalex.org/W2786237995","https://openalex.org/W3148658919"],"related_works":["https://openalex.org/W2389800961","https://openalex.org/W1995389502","https://openalex.org/W2082283494","https://openalex.org/W2622383884","https://openalex.org/W174432695","https://openalex.org/W2393637001","https://openalex.org/W2991739378","https://openalex.org/W95651076","https://openalex.org/W2471648397","https://openalex.org/W2770163697"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}