{"id":"https://openalex.org/W2777190621","doi":"https://doi.org/10.1007/978-981-10-7605-3_198","title":"Reliability and Control Theory: An Integration Approach for Safety Analysis","display_name":"Reliability and Control Theory: An Integration Approach for Safety Analysis","publication_year":2017,"publication_date":"2017-12-19","ids":{"openalex":"https://openalex.org/W2777190621","doi":"https://doi.org/10.1007/978-981-10-7605-3_198","mag":"2777190621"},"language":"en","primary_location":{"id":"doi:10.1007/978-981-10-7605-3_198","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-10-7605-3_198","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052384978","display_name":"Anit Thapaliya","orcid":"https://orcid.org/0000-0003-2886-0961"},"institutions":[{"id":"https://openalex.org/I28615091","display_name":"Kyonggi University","ror":"https://ror.org/032xf8h46","country_code":"KR","type":"education","lineage":["https://openalex.org/I28615091"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Anit Thapaliya","raw_affiliation_strings":["Department of Computer Science, Kyonggi University, Suwon, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Kyonggi University, Suwon, South Korea","institution_ids":["https://openalex.org/I28615091"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075396667","display_name":"Gihwon Kwon","orcid":"https://orcid.org/0000-0002-8221-4939"},"institutions":[{"id":"https://openalex.org/I28615091","display_name":"Kyonggi University","ror":"https://ror.org/032xf8h46","country_code":"KR","type":"education","lineage":["https://openalex.org/I28615091"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Gihwon Kwon","raw_affiliation_strings":["Department of Computer Science, Kyonggi University, Suwon, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Kyonggi University, Suwon, South Korea","institution_ids":["https://openalex.org/I28615091"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5052384978"],"corresponding_institution_ids":["https://openalex.org/I28615091"],"apc_list":null,"apc_paid":null,"fwci":1.4935,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.87566845,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1244","last_page":"1249"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10809","display_name":"Occupational Health and Safety Research","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3614","display_name":"Radiological and Ultrasound Technology"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},"topics":[{"id":"https://openalex.org/T10809","display_name":"Occupational Health and Safety Research","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3614","display_name":"Radiological and Ultrasound Technology"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9905999898910522,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hazard-and-operability-study","display_name":"Hazard and operability study","score":0.915716290473938},{"id":"https://openalex.org/keywords/fault-tree-analysis","display_name":"Fault tree analysis","score":0.8850216269493103},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.680298924446106},{"id":"https://openalex.org/keywords/system-safety","display_name":"System safety","score":0.6327170729637146},{"id":"https://openalex.org/keywords/hazard-analysis","display_name":"Hazard analysis","score":0.6015608906745911},{"id":"https://openalex.org/keywords/failure-mode-and-effects-analysis","display_name":"Failure mode and effects analysis","score":0.594996452331543},{"id":"https://openalex.org/keywords/operability","display_name":"Operability","score":0.5381684303283691},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5288066864013672},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4869433641433716},{"id":"https://openalex.org/keywords/safety-engineering","display_name":"Safety engineering","score":0.4479255676269531},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.41130828857421875},{"id":"https://openalex.org/keywords/hazard","display_name":"Hazard","score":0.4102783203125},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.34623080492019653},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.33302730321884155}],"concepts":[{"id":"https://openalex.org/C125174871","wikidata":"https://www.wikidata.org/wiki/Q1683210","display_name":"Hazard and operability study","level":3,"score":0.915716290473938},{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.8850216269493103},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.680298924446106},{"id":"https://openalex.org/C132835097","wikidata":"https://www.wikidata.org/wiki/Q7663745","display_name":"System safety","level":2,"score":0.6327170729637146},{"id":"https://openalex.org/C206355099","wikidata":"https://www.wikidata.org/wiki/Q3614972","display_name":"Hazard analysis","level":2,"score":0.6015608906745911},{"id":"https://openalex.org/C66283442","wikidata":"https://www.wikidata.org/wiki/Q1389268","display_name":"Failure mode and effects analysis","level":2,"score":0.594996452331543},{"id":"https://openalex.org/C126231374","wikidata":"https://www.wikidata.org/wiki/Q1061298","display_name":"Operability","level":2,"score":0.5381684303283691},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5288066864013672},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4869433641433716},{"id":"https://openalex.org/C94279714","wikidata":"https://www.wikidata.org/wiki/Q6496962","display_name":"Safety engineering","level":2,"score":0.4479255676269531},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41130828857421875},{"id":"https://openalex.org/C49261128","wikidata":"https://www.wikidata.org/wiki/Q1132455","display_name":"Hazard","level":2,"score":0.4102783203125},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.34623080492019653},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.33302730321884155},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-981-10-7605-3_198","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-10-7605-3_198","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W642120166","https://openalex.org/W1602378215","https://openalex.org/W1980383963","https://openalex.org/W2134732423","https://openalex.org/W2529855495","https://openalex.org/W2611976072","https://openalex.org/W2615918301","https://openalex.org/W4240030094"],"related_works":["https://openalex.org/W336863576","https://openalex.org/W3022900404","https://openalex.org/W2384772537","https://openalex.org/W2989812972","https://openalex.org/W2735922559","https://openalex.org/W4252534093","https://openalex.org/W2763916043","https://openalex.org/W2367525463","https://openalex.org/W2167025002","https://openalex.org/W2780093075"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}