{"id":"https://openalex.org/W2779854439","doi":"https://doi.org/10.1007/978-981-10-7605-3_188","title":"Towards Recovering Fault Traceability Links by Using Information Retrieval Technique","display_name":"Towards Recovering Fault Traceability Links by Using Information Retrieval Technique","publication_year":2017,"publication_date":"2017-12-19","ids":{"openalex":"https://openalex.org/W2779854439","doi":"https://doi.org/10.1007/978-981-10-7605-3_188","mag":"2779854439"},"language":"en","primary_location":{"id":"doi:10.1007/978-981-10-7605-3_188","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-10-7605-3_188","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068011716","display_name":"Seungsuk Baek","orcid":null},"institutions":[{"id":"https://openalex.org/I124633538","display_name":"University of Seoul","ror":"https://ror.org/05en5nh73","country_code":"KR","type":"education","lineage":["https://openalex.org/I124633538"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Seungsuk Baek","raw_affiliation_strings":["Department of Computer Science, University of Seoul, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of Seoul, Seoul, South Korea","institution_ids":["https://openalex.org/I124633538"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100331815","display_name":"Jungwon Lee","orcid":"https://orcid.org/0000-0001-8922-063X"},"institutions":[{"id":"https://openalex.org/I57664883","display_name":"Ajou University","ror":"https://ror.org/03tzb2h73","country_code":"KR","type":"education","lineage":["https://openalex.org/I57664883"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jung-Won Lee","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Ajou University, Suwon, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Ajou University, Suwon, South Korea","institution_ids":["https://openalex.org/I57664883"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059972333","display_name":"Byungjeong Lee","orcid":"https://orcid.org/0000-0002-2750-7608"},"institutions":[{"id":"https://openalex.org/I124633538","display_name":"University of Seoul","ror":"https://ror.org/05en5nh73","country_code":"KR","type":"education","lineage":["https://openalex.org/I124633538"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byungjeong Lee","raw_affiliation_strings":["Department of Computer Science, University of Seoul, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of Seoul, Seoul, South Korea","institution_ids":["https://openalex.org/I124633538"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5068011716"],"corresponding_institution_ids":["https://openalex.org/I124633538"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.24103586,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1180","last_page":"1185"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9866999983787537,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/traceability","display_name":"Traceability","score":0.7372356057167053},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6557393670082092},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.595583975315094},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.547394871711731},{"id":"https://openalex.org/keywords/unit-testing","display_name":"Unit testing","score":0.531731367111206},{"id":"https://openalex.org/keywords/trace","display_name":"TRACE (psycholinguistics)","score":0.5008177757263184},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.49337640404701233},{"id":"https://openalex.org/keywords/source-code","display_name":"Source code","score":0.4734572768211365},{"id":"https://openalex.org/keywords/verification-and-validation","display_name":"Verification and validation","score":0.45077136158943176},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.4256012737751007},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3334158957004547},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.24248775839805603},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2204320728778839}],"concepts":[{"id":"https://openalex.org/C153876917","wikidata":"https://www.wikidata.org/wiki/Q899704","display_name":"Traceability","level":2,"score":0.7372356057167053},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6557393670082092},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.595583975315094},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.547394871711731},{"id":"https://openalex.org/C148027188","wikidata":"https://www.wikidata.org/wiki/Q907375","display_name":"Unit testing","level":3,"score":0.531731367111206},{"id":"https://openalex.org/C75291252","wikidata":"https://www.wikidata.org/wiki/Q1315756","display_name":"TRACE (psycholinguistics)","level":2,"score":0.5008177757263184},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.49337640404701233},{"id":"https://openalex.org/C43126263","wikidata":"https://www.wikidata.org/wiki/Q128751","display_name":"Source code","level":2,"score":0.4734572768211365},{"id":"https://openalex.org/C48002344","wikidata":"https://www.wikidata.org/wiki/Q2919644","display_name":"Verification and validation","level":2,"score":0.45077136158943176},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.4256012737751007},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3334158957004547},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.24248775839805603},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2204320728778839},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-981-10-7605-3_188","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-10-7605-3_188","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.5}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W294418456","https://openalex.org/W2005927790","https://openalex.org/W2140264852","https://openalex.org/W2146639726","https://openalex.org/W2460591548"],"related_works":["https://openalex.org/W2982483023","https://openalex.org/W2893321311","https://openalex.org/W128313926","https://openalex.org/W2502220298","https://openalex.org/W1518851379","https://openalex.org/W2727164922","https://openalex.org/W2023346118","https://openalex.org/W1515148232","https://openalex.org/W2316872043","https://openalex.org/W94015702"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}