{"id":"https://openalex.org/W2778622277","doi":"https://doi.org/10.1007/978-981-10-7470-7_44","title":"LISOCHIN: An NBTI Degradation Monitoring Sensor for Reliable CMOS Circuits","display_name":"LISOCHIN: An NBTI Degradation Monitoring Sensor for Reliable CMOS Circuits","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2778622277","doi":"https://doi.org/10.1007/978-981-10-7470-7_44","mag":"2778622277"},"language":"en","primary_location":{"id":"doi:10.1007/978-981-10-7470-7_44","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-10-7470-7_44","pdf_url":null,"source":{"id":"https://openalex.org/S2764900261","display_name":"Communications in computer and information science","issn_l":"1865-0929","issn":["1865-0929","1865-0937"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Computer and Information Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035985978","display_name":"Ambika Prasad Shah","orcid":"https://orcid.org/0000-0003-0810-814X"},"institutions":[{"id":"https://openalex.org/I64295750","display_name":"Indian Institute of Technology Indore","ror":"https://ror.org/01hhf7w52","country_code":"IN","type":"education","lineage":["https://openalex.org/I64295750"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Ambika Prasad Shah","raw_affiliation_strings":["Nanoscale Devices, VLSI Circuit and System Design Lab, Electrical Engineering Department, Indian Institute of Technology, Indore, 453552, M.P., India"],"affiliations":[{"raw_affiliation_string":"Nanoscale Devices, VLSI Circuit and System Design Lab, Electrical Engineering Department, Indian Institute of Technology, Indore, 453552, M.P., India","institution_ids":["https://openalex.org/I64295750"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046369853","display_name":"Nandakishor Yadav","orcid":"https://orcid.org/0000-0002-8270-1366"},"institutions":[{"id":"https://openalex.org/I64295750","display_name":"Indian Institute of Technology Indore","ror":"https://ror.org/01hhf7w52","country_code":"IN","type":"education","lineage":["https://openalex.org/I64295750"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Nandakishor Yadav","raw_affiliation_strings":["Nanoscale Devices, VLSI Circuit and System Design Lab, Electrical Engineering Department, Indian Institute of Technology, Indore, 453552, M.P., India"],"affiliations":[{"raw_affiliation_string":"Nanoscale Devices, VLSI Circuit and System Design Lab, Electrical Engineering Department, Indian Institute of Technology, Indore, 453552, M.P., India","institution_ids":["https://openalex.org/I64295750"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068792760","display_name":"Santosh Kumar Vishvakarma","orcid":"https://orcid.org/0000-0003-4223-0077"},"institutions":[{"id":"https://openalex.org/I64295750","display_name":"Indian Institute of Technology Indore","ror":"https://ror.org/01hhf7w52","country_code":"IN","type":"education","lineage":["https://openalex.org/I64295750"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Santosh Kumar Vishvakarma","raw_affiliation_strings":["Nanoscale Devices, VLSI Circuit and System Design Lab, Electrical Engineering Department, Indian Institute of Technology, Indore, 453552, M.P., India"],"affiliations":[{"raw_affiliation_string":"Nanoscale Devices, VLSI Circuit and System Design Lab, Electrical Engineering Department, Indian Institute of Technology, Indore, 453552, M.P., India","institution_ids":["https://openalex.org/I64295750"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5035985978"],"corresponding_institution_ids":["https://openalex.org/I64295750"],"apc_list":null,"apc_paid":null,"fwci":0.9161,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.77492157,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"441","last_page":"451"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/negative-bias-temperature-instability","display_name":"Negative-bias temperature instability","score":0.8824840784072876},{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.8483204245567322},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6494668126106262},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6129777431488037},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5798814296722412},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5562959909439087},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5301932692527771},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5183483362197876},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5051358342170715},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.48593440651893616},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.47590264678001404},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4425179362297058},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40922287106513977},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.36258363723754883},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3444126546382904},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33983278274536133},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.23649883270263672},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1728416085243225},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.11192041635513306},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09529730677604675}],"concepts":[{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.8824840784072876},{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.8483204245567322},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6494668126106262},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6129777431488037},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5798814296722412},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5562959909439087},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5301932692527771},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5183483362197876},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5051358342170715},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.48593440651893616},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.47590264678001404},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4425179362297058},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40922287106513977},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.36258363723754883},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3444126546382904},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33983278274536133},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.23649883270263672},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1728416085243225},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.11192041635513306},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09529730677604675},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-981-10-7470-7_44","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-10-7470-7_44","pdf_url":null,"source":{"id":"https://openalex.org/S2764900261","display_name":"Communications in computer and information science","issn_l":"1865-0929","issn":["1865-0929","1865-0937"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Computer and Information Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6100000143051147}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1966360870","https://openalex.org/W1981529299","https://openalex.org/W1983334556","https://openalex.org/W1995561044","https://openalex.org/W2047325217","https://openalex.org/W2068397550","https://openalex.org/W2069452468","https://openalex.org/W2081382200","https://openalex.org/W2089587802","https://openalex.org/W2095823567","https://openalex.org/W2108598232","https://openalex.org/W2110134128","https://openalex.org/W2137509664","https://openalex.org/W2142947567","https://openalex.org/W2143363156","https://openalex.org/W2144154842","https://openalex.org/W2152422320","https://openalex.org/W2338322289","https://openalex.org/W4254196936"],"related_works":["https://openalex.org/W1999919743","https://openalex.org/W2081382200","https://openalex.org/W2100282217","https://openalex.org/W2157278395","https://openalex.org/W2730314563","https://openalex.org/W2164047446","https://openalex.org/W2126351224","https://openalex.org/W2058541779","https://openalex.org/W3033168326","https://openalex.org/W2609002938"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}