{"id":"https://openalex.org/W2806935090","doi":"https://doi.org/10.1007/978-981-10-6571-2_83","title":"Fault Diagnosis and Health Assessment for Super-Heterodyne Receivers Based on ITD-SVD and LR","display_name":"Fault Diagnosis and Health Assessment for Super-Heterodyne Receivers Based on ITD-SVD and LR","publication_year":2018,"publication_date":"2018-06-06","ids":{"openalex":"https://openalex.org/W2806935090","doi":"https://doi.org/10.1007/978-981-10-6571-2_83","mag":"2806935090"},"language":"en","primary_location":{"id":"doi:10.1007/978-981-10-6571-2_83","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-10-6571-2_83","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016406393","display_name":"Manxi Wang","orcid":"https://orcid.org/0000-0001-9266-8611"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I4391767685","display_name":"State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System","ror":"https://ror.org/012ajw921","country_code":null,"type":"facility","lineage":["https://openalex.org/I170215575","https://openalex.org/I4391767685"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Manxi Wang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, 100191, China","Science and Technology on Reliability and Environmental Engineering Laboratory, Beijing, 100191, China","State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System, No. 33, 085 mailbox, Luoyang, Henan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Science and Technology on Reliability and Environmental Engineering Laboratory, Beijing, 100191, China","institution_ids":[]},{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System, No. 33, 085 mailbox, Luoyang, Henan, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I4391767685"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100747498","display_name":"Jinwen Sun","orcid":"https://orcid.org/0000-0001-9237-009X"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I4391767685","display_name":"State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System","ror":"https://ror.org/012ajw921","country_code":null,"type":"facility","lineage":["https://openalex.org/I170215575","https://openalex.org/I4391767685"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinwen Sun","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, 100191, China","Science and Technology on Reliability and Environmental Engineering Laboratory, Beijing, 100191, China","State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System, No. 33, 085 mailbox, Luoyang, Henan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Science and Technology on Reliability and Environmental Engineering Laboratory, Beijing, 100191, China","institution_ids":[]},{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System, No. 33, 085 mailbox, Luoyang, Henan, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I4391767685"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100605099","display_name":"Chen L\u00fc","orcid":"https://orcid.org/0000-0003-1927-2391"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I4391767685","display_name":"State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System","ror":"https://ror.org/012ajw921","country_code":null,"type":"facility","lineage":["https://openalex.org/I170215575","https://openalex.org/I4391767685"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chen Lu","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, 100191, China","Science and Technology on Reliability and Environmental Engineering Laboratory, Beijing, 100191, China","State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System, No. 33, 085 mailbox, Luoyang, Henan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Science and Technology on Reliability and Environmental Engineering Laboratory, Beijing, 100191, China","institution_ids":[]},{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System, No. 33, 085 mailbox, Luoyang, Henan, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I4391767685"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063896279","display_name":"Le Qi","orcid":"https://orcid.org/0000-0002-8351-6103"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I4391767685","display_name":"State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System","ror":"https://ror.org/012ajw921","country_code":null,"type":"facility","lineage":["https://openalex.org/I170215575","https://openalex.org/I4391767685"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Le Qi","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, 100191, China","Science and Technology on Reliability and Environmental Engineering Laboratory, Beijing, 100191, China","State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System, No. 33, 085 mailbox, Luoyang, Henan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Science and Technology on Reliability and Environmental Engineering Laboratory, Beijing, 100191, China","institution_ids":[]},{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System, No. 33, 085 mailbox, Luoyang, Henan, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I4391767685"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5063896279"],"corresponding_institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I4391767685","https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.04620418,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"677","last_page":"685"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/singular-value-decomposition","display_name":"Singular value decomposition","score":0.8194975852966309},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.713456392288208},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6253699660301208},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5179558992385864},{"id":"https://openalex.org/keywords/heterodyne","display_name":"Heterodyne (poetry)","score":0.4794689416885376},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.47327494621276855},{"id":"https://openalex.org/keywords/observer","display_name":"Observer (physics)","score":0.44711703062057495},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4469083845615387},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.44433870911598206},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4132287800312042},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4053565561771393},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08432319760322571},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.07944753766059875}],"concepts":[{"id":"https://openalex.org/C22789450","wikidata":"https://www.wikidata.org/wiki/Q420904","display_name":"Singular value decomposition","level":2,"score":0.8194975852966309},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.713456392288208},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6253699660301208},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5179558992385864},{"id":"https://openalex.org/C2780497637","wikidata":"https://www.wikidata.org/wiki/Q16938394","display_name":"Heterodyne (poetry)","level":2,"score":0.4794689416885376},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.47327494621276855},{"id":"https://openalex.org/C2780704645","wikidata":"https://www.wikidata.org/wiki/Q9251458","display_name":"Observer (physics)","level":2,"score":0.44711703062057495},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4469083845615387},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.44433870911598206},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4132287800312042},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4053565561771393},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08432319760322571},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.07944753766059875},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-981-10-6571-2_83","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-10-6571-2_83","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2086989791","https://openalex.org/W2096125904","https://openalex.org/W2116059961","https://openalex.org/W2383278523","https://openalex.org/W2533394141","https://openalex.org/W2884472893"],"related_works":["https://openalex.org/W3121932492","https://openalex.org/W4232638561","https://openalex.org/W2560215812","https://openalex.org/W1997544008","https://openalex.org/W2949601986","https://openalex.org/W2788972299","https://openalex.org/W3004137470","https://openalex.org/W1607100495","https://openalex.org/W2521347458","https://openalex.org/W131378092"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-08-04T08:18:43.703281","created_date":"2025-10-10T00:00:00"}