{"id":"https://openalex.org/W2560303980","doi":"https://doi.org/10.1007/978-981-10-3159-5_19","title":"Sub-threshold Performance Driven Choice in Tunneling CNFETs","display_name":"Sub-threshold Performance Driven Choice in Tunneling CNFETs","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W2560303980","doi":"https://doi.org/10.1007/978-981-10-3159-5_19","mag":"2560303980"},"language":"en","primary_location":{"id":"doi:10.1007/978-981-10-3159-5_19","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-10-3159-5_19","pdf_url":null,"source":{"id":"https://openalex.org/S2764900261","display_name":"Communications in computer and information science","issn_l":"1865-0929","issn":["1865-0929","1865-0937"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Computer and Information Science","raw_type":"book-chapter"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102243527","display_name":"Hailiang Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hailiang Zhou","raw_affiliation_strings":["The School of Computering, National University of Defense Technology, Changsha, 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The School of Computering, National University of Defense Technology, Changsha, 410073, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070981370","display_name":"Xiantuo Tang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210159156","display_name":"System Equipment (China)","ror":"https://ror.org/04m2bcn74","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210159156"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiantuo Tang","raw_affiliation_strings":["China National Digital Switching System Engineering and Technological Research and Design Center, Zhengzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China National Digital Switching System Engineering and Technological Research and Design Center, Zhengzhou, China","institution_ids":["https://openalex.org/I4210159156"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110908049","display_name":"Minxuan Zhang","orcid":"https://orcid.org/0009-0001-1340-6638"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]},{"id":"https://openalex.org/I4210159156","display_name":"System Equipment (China)","ror":"https://ror.org/04m2bcn74","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210159156"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Minxuan Zhang","raw_affiliation_strings":["China National Digital Switching System Engineering and Technological Research and Design Center, Zhengzhou, China","The School of Computering, National University of Defense Technology, Changsha, 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China National Digital Switching System Engineering and Technological Research and Design Center, Zhengzhou, China","institution_ids":["https://openalex.org/I4210159156"]},{"raw_affiliation_string":"The School of Computering, National University of Defense Technology, Changsha, 410073, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100750974","display_name":"Yue Hao","orcid":"https://orcid.org/0000-0002-8081-2919"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]},{"id":"https://openalex.org/I4210159156","display_name":"System Equipment (China)","ror":"https://ror.org/04m2bcn74","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210159156"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yue Hao","raw_affiliation_strings":["China National Digital Switching System Engineering and Technological Research and Design Center, Zhengzhou, China","The School of Computering, National University of Defense Technology, Changsha, 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China National Digital Switching System Engineering and Technological Research and Design Center, Zhengzhou, China","institution_ids":["https://openalex.org/I4210159156"]},{"raw_affiliation_string":"The School of Computering, National University of Defense Technology, Changsha, 410073, China","institution_ids":["https://openalex.org/I170215575"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5102243527"],"corresponding_institution_ids":["https://openalex.org/I170215575"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"200","last_page":"211"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/quantum-tunnelling","display_name":"Quantum tunnelling","score":0.8104041814804077},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.6641415357589722},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.584399938583374},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5403651595115662},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5120463967323303},{"id":"https://openalex.org/keywords/doping","display_name":"Doping","score":0.49883270263671875},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4558710753917694},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.43886786699295044},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.43772631883621216},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.27808940410614014},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2455325722694397}],"concepts":[{"id":"https://openalex.org/C120398109","wikidata":"https://www.wikidata.org/wiki/Q175751","display_name":"Quantum tunnelling","level":2,"score":0.8104041814804077},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.6641415357589722},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.584399938583374},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5403651595115662},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5120463967323303},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.49883270263671875},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4558710753917694},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.43886786699295044},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.43772631883621216},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.27808940410614014},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2455325722694397},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-981-10-3159-5_19","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-981-10-3159-5_19","pdf_url":null,"source":{"id":"https://openalex.org/S2764900261","display_name":"Communications in computer and information science","issn_l":"1865-0929","issn":["1865-0929","1865-0937"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Computer and Information Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1508277320","https://openalex.org/W1542414267","https://openalex.org/W1566902365","https://openalex.org/W1641627032","https://openalex.org/W1912902203","https://openalex.org/W1989683911","https://openalex.org/W1991353080","https://openalex.org/W2028667486","https://openalex.org/W2043917332","https://openalex.org/W2047886252","https://openalex.org/W2048432227","https://openalex.org/W2050134241","https://openalex.org/W2070509553","https://openalex.org/W2102045202","https://openalex.org/W2117894613","https://openalex.org/W2135466786","https://openalex.org/W2143451736","https://openalex.org/W2145546338","https://openalex.org/W2156502402","https://openalex.org/W2534335129","https://openalex.org/W2542613239","https://openalex.org/W2787607414","https://openalex.org/W3099612905"],"related_works":["https://openalex.org/W3039175621","https://openalex.org/W3150517143","https://openalex.org/W3101010189","https://openalex.org/W3007305066","https://openalex.org/W3097674720","https://openalex.org/W1995726614","https://openalex.org/W2901805343","https://openalex.org/W2955516363","https://openalex.org/W2507974052","https://openalex.org/W2380169184","https://openalex.org/W1978337140","https://openalex.org/W3128016532","https://openalex.org/W2989720346","https://openalex.org/W2896011465","https://openalex.org/W2940964922","https://openalex.org/W2537962524","https://openalex.org/W1994730822","https://openalex.org/W2398098844","https://openalex.org/W2058541718","https://openalex.org/W2910987144"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}