{"id":"https://openalex.org/W173573284","doi":"https://doi.org/10.1007/978-94-007-6738-6_70","title":"Analysis and Study on RFID Tag Failure Phenomenon","display_name":"Analysis and Study on RFID Tag Failure Phenomenon","publication_year":2013,"publication_date":"2013-01-01","ids":{"openalex":"https://openalex.org/W173573284","doi":"https://doi.org/10.1007/978-94-007-6738-6_70","mag":"173573284"},"language":"en","primary_location":{"id":"doi:10.1007/978-94-007-6738-6_70","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-94-007-6738-6_70","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012776263","display_name":"Seongsoo Cho","orcid":"https://orcid.org/0000-0002-4527-7447"},"institutions":[{"id":"https://openalex.org/I161024014","display_name":"Kwangwoon University","ror":"https://ror.org/02e9zc863","country_code":"KR","type":"education","lineage":["https://openalex.org/I161024014"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Seongsoo Cho","raw_affiliation_strings":["Department of Electronic Engineering, Kwangwoon University, Seoul, Korea","Kwangwoon University,"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kwangwoon University, Seoul, Korea","institution_ids":["https://openalex.org/I161024014"]},{"raw_affiliation_string":"Kwangwoon University,","institution_ids":["https://openalex.org/I161024014"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014643485","display_name":"Son Kwang Chul","orcid":null},"institutions":[{"id":"https://openalex.org/I161024014","display_name":"Kwangwoon University","ror":"https://ror.org/02e9zc863","country_code":"KR","type":"education","lineage":["https://openalex.org/I161024014"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Son Kwang Chul","raw_affiliation_strings":["Department of Electronic Engineering, Kwangwoon University, Seoul, Korea","Kwangwoon University,"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kwangwoon University, Seoul, Korea","institution_ids":["https://openalex.org/I161024014"]},{"raw_affiliation_string":"Kwangwoon University,","institution_ids":["https://openalex.org/I161024014"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100319930","display_name":"Jong-Hyun Park","orcid":"https://orcid.org/0000-0001-7479-9992"},"institutions":[{"id":"https://openalex.org/I161024014","display_name":"Kwangwoon University","ror":"https://ror.org/02e9zc863","country_code":"KR","type":"education","lineage":["https://openalex.org/I161024014"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jong-Hyun Park","raw_affiliation_strings":["Department of Electronic Engineering, Kwangwoon University, Seoul, Korea","Kwangwoon University,"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kwangwoon University, Seoul, Korea","institution_ids":["https://openalex.org/I161024014"]},{"raw_affiliation_string":"Kwangwoon University,","institution_ids":["https://openalex.org/I161024014"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102818809","display_name":"Bong\u2010Hwa Hong","orcid":"https://orcid.org/0000-0001-7386-8669"},"institutions":[{"id":"https://openalex.org/I160888826","display_name":"Kyung Hee Cyber University","ror":"https://ror.org/01bxb0563","country_code":"KR","type":"education","lineage":["https://openalex.org/I160888826"]},{"id":"https://openalex.org/I207169309","display_name":"Cyber University","ror":"https://ror.org/038sdcw17","country_code":"JP","type":"education","lineage":["https://openalex.org/I207169309"]}],"countries":["JP","KR"],"is_corresponding":false,"raw_author_name":"Bonghwa Hong","raw_affiliation_strings":["Department of Information Communication, Kyunghee Cyber University, Seoul, Korea","KyungHee Cyber University"],"affiliations":[{"raw_affiliation_string":"Department of Information Communication, Kyunghee Cyber University, Seoul, Korea","institution_ids":[]},{"raw_affiliation_string":"KyungHee Cyber University","institution_ids":["https://openalex.org/I207169309","https://openalex.org/I160888826"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5012776263"],"corresponding_institution_ids":["https://openalex.org/I161024014"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.08338519,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"575","last_page":"583"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10986","display_name":"RFID technology advancements","score":0.9835000038146973,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10986","display_name":"RFID technology advancements","score":0.9835000038146973,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14484","display_name":"Technology and Data Analysis","score":0.9419999718666077,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14156","display_name":"Engineering Applied Research","score":0.9190999865531921,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/failure-causes","display_name":"Failure causes","score":0.7613202333450317},{"id":"https://openalex.org/keywords/failure-mechanism","display_name":"Failure mechanism","score":0.7469212412834167},{"id":"https://openalex.org/keywords/mechanism","display_name":"Mechanism (biology)","score":0.6668362617492676},{"id":"https://openalex.org/keywords/interpretation","display_name":"Interpretation (philosophy)","score":0.5415087342262268},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4596945345401764},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3630750775337219},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30173787474632263},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.07299509644508362},{"id":"https://openalex.org/keywords/epistemology","display_name":"Epistemology","score":0.05201292037963867}],"concepts":[{"id":"https://openalex.org/C28944875","wikidata":"https://www.wikidata.org/wiki/Q1925224","display_name":"Failure causes","level":2,"score":0.7613202333450317},{"id":"https://openalex.org/C3018344627","wikidata":"https://www.wikidata.org/wiki/Q1925224","display_name":"Failure mechanism","level":2,"score":0.7469212412834167},{"id":"https://openalex.org/C89611455","wikidata":"https://www.wikidata.org/wiki/Q6804646","display_name":"Mechanism (biology)","level":2,"score":0.6668362617492676},{"id":"https://openalex.org/C527412718","wikidata":"https://www.wikidata.org/wiki/Q855395","display_name":"Interpretation (philosophy)","level":2,"score":0.5415087342262268},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4596945345401764},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3630750775337219},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30173787474632263},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.07299509644508362},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.05201292037963867},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-94-007-6738-6_70","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-94-007-6738-6_70","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1513751997","https://openalex.org/W1865728529","https://openalex.org/W1880243453","https://openalex.org/W1983971854","https://openalex.org/W2005615234","https://openalex.org/W2047171924","https://openalex.org/W2118809972","https://openalex.org/W2134538629","https://openalex.org/W2167721656","https://openalex.org/W4205204540"],"related_works":["https://openalex.org/W173573284","https://openalex.org/W1976197845","https://openalex.org/W4386858859","https://openalex.org/W4245145435","https://openalex.org/W2461380704","https://openalex.org/W2520599748","https://openalex.org/W2364801790","https://openalex.org/W2135637858","https://openalex.org/W2519290936","https://openalex.org/W2392821195"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}