{"id":"https://openalex.org/W201184180","doi":"https://doi.org/10.1007/978-81-322-1768-8_60","title":"A Low Cost Electrical Impedance Tomography (EIT) Instrumentation for Impedance Imaging of Practical Phantoms: A Laboratory Study","display_name":"A Low Cost Electrical Impedance Tomography (EIT) Instrumentation for Impedance Imaging of Practical Phantoms: A Laboratory Study","publication_year":2014,"publication_date":"2014-01-01","ids":{"openalex":"https://openalex.org/W201184180","doi":"https://doi.org/10.1007/978-81-322-1768-8_60","mag":"201184180"},"language":"en","primary_location":{"id":"doi:10.1007/978-81-322-1768-8_60","is_oa":true,"landing_page_url":"https://doi.org/10.1007/978-81-322-1768-8_60","pdf_url":null,"source":{"id":"https://openalex.org/S2764905038","display_name":"Advances in intelligent systems and computing","issn_l":"2194-5357","issn":["2194-5357","2194-5365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":"cc-by-nc-sa","license_id":"https://openalex.org/licenses/cc-by-nc-sa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in Intelligent Systems and Computing","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1007/978-81-322-1768-8_60","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090651602","display_name":"Tushar Kanti Bera","orcid":"https://orcid.org/0000-0002-1912-4551"},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Tushar Kanti Bera","raw_affiliation_strings":["Department of Instrumentation and Applied Physics, Indian Institute of Science, Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Department of Instrumentation and Applied Physics, Indian Institute of Science, Bangalore, India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033607140","display_name":"J. Nagaraju","orcid":null},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"J. Nagaraju","raw_affiliation_strings":["Department of Instrumentation and Applied Physics, Indian Institute of Science, Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Department of Instrumentation and Applied Physics, Indian Institute of Science, Bangalore, India","institution_ids":["https://openalex.org/I59270414"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5090651602"],"corresponding_institution_ids":["https://openalex.org/I59270414"],"apc_list":null,"apc_paid":null,"fwci":1.241,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.78171593,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"689","last_page":"701"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9749000072479248,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9700999855995178,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.9248309135437012},{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.6433748006820679},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5954792499542236},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.42154461145401},{"id":"https://openalex.org/keywords/biomedical-engineering","display_name":"Biomedical engineering","score":0.4043367803096771},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.399235337972641},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3721631169319153},{"id":"https://openalex.org/keywords/medical-physics","display_name":"Medical physics","score":0.33905160427093506},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3353612422943115},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.31086495518684387},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2913357615470886},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.22699245810508728},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17414745688438416}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.9248309135437012},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.6433748006820679},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5954792499542236},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.42154461145401},{"id":"https://openalex.org/C136229726","wikidata":"https://www.wikidata.org/wiki/Q327092","display_name":"Biomedical engineering","level":1,"score":0.4043367803096771},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.399235337972641},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3721631169319153},{"id":"https://openalex.org/C19527891","wikidata":"https://www.wikidata.org/wiki/Q1120908","display_name":"Medical physics","level":1,"score":0.33905160427093506},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3353612422943115},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.31086495518684387},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2913357615470886},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.22699245810508728},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17414745688438416},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-81-322-1768-8_60","is_oa":true,"landing_page_url":"https://doi.org/10.1007/978-81-322-1768-8_60","pdf_url":null,"source":{"id":"https://openalex.org/S2764905038","display_name":"Advances in intelligent systems and computing","issn_l":"2194-5357","issn":["2194-5357","2194-5365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":"cc-by-nc-sa","license_id":"https://openalex.org/licenses/cc-by-nc-sa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in Intelligent Systems and Computing","raw_type":"book-chapter"}],"best_oa_location":{"id":"doi:10.1007/978-81-322-1768-8_60","is_oa":true,"landing_page_url":"https://doi.org/10.1007/978-81-322-1768-8_60","pdf_url":null,"source":{"id":"https://openalex.org/S2764905038","display_name":"Advances in intelligent systems and computing","issn_l":"2194-5357","issn":["2194-5357","2194-5365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":"cc-by-nc-sa","license_id":"https://openalex.org/licenses/cc-by-nc-sa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in Intelligent Systems and Computing","raw_type":"book-chapter"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5299999713897705}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":56,"referenced_works":["https://openalex.org/W60884445","https://openalex.org/W65555594","https://openalex.org/W75338135","https://openalex.org/W102828062","https://openalex.org/W385197366","https://openalex.org/W1586692934","https://openalex.org/W1966747756","https://openalex.org/W1967041499","https://openalex.org/W1970411574","https://openalex.org/W1984055618","https://openalex.org/W1990937418","https://openalex.org/W1992312940","https://openalex.org/W1996704477","https://openalex.org/W2005681075","https://openalex.org/W2008492643","https://openalex.org/W2011703263","https://openalex.org/W2012454583","https://openalex.org/W2016645906","https://openalex.org/W2026031640","https://openalex.org/W2028912824","https://openalex.org/W2029396252","https://openalex.org/W2033119851","https://openalex.org/W2036673119","https://openalex.org/W2039003339","https://openalex.org/W2046926778","https://openalex.org/W2047765714","https://openalex.org/W2052221220","https://openalex.org/W2053510218","https://openalex.org/W2053721064","https://openalex.org/W2054962225","https://openalex.org/W2055550304","https://openalex.org/W2055571910","https://openalex.org/W2055635525","https://openalex.org/W2069376037","https://openalex.org/W2070314539","https://openalex.org/W2076775639","https://openalex.org/W2078097192","https://openalex.org/W2092402081","https://openalex.org/W2095534447","https://openalex.org/W2106616447","https://openalex.org/W2112041173","https://openalex.org/W2137376807","https://openalex.org/W2156959390","https://openalex.org/W2164230066","https://openalex.org/W2164383633","https://openalex.org/W2169378207","https://openalex.org/W2198488435","https://openalex.org/W2492858599","https://openalex.org/W2495733141","https://openalex.org/W2495921537","https://openalex.org/W2537138046","https://openalex.org/W2575007773","https://openalex.org/W2950044372","https://openalex.org/W2986673352","https://openalex.org/W3122482465","https://openalex.org/W6601125836"],"related_works":["https://openalex.org/W2359871536","https://openalex.org/W1992681652","https://openalex.org/W2991320615","https://openalex.org/W1979972895","https://openalex.org/W2051428347","https://openalex.org/W2944246511","https://openalex.org/W2215273690","https://openalex.org/W2553917976","https://openalex.org/W2526896022","https://openalex.org/W1935435487"],"abstract_inverted_index":{"A":[0,144],"low":[1],"cost":[2],"Electrical":[3],"Impedance":[4],"Tomography":[5],"(EIT)":[6],"instrumentation":[7,20,70,167],"is":[8,21,65,100,155,168],"developed":[9,22,86,101,150],"for":[10,112,170],"studying":[11],"the":[12,109,117,126,136,152,161,166],"impedance":[13],"imaging":[14,154,175],"of":[15,43,68,146],"practical":[16,147,173],"phantoms.":[17],"The":[18,38,61,96],"EIT":[19],"with":[23],"a":[24,32,44,52,73,80,93],"constant":[25,39],"current":[26,40,114],"injector,":[27],"signal":[28,62],"conditioner":[29,63],"block":[30,64],"and":[31,51,79,92,115,125,141,151],"DIP":[33,103],"switch":[34,104,108],"based":[35,55,105,172],"multiplexer":[36],"module.":[37],"injector":[41],"consists":[42],"variable":[45],"frequency":[46,123],"Voltage":[47,56],"Controlled":[48],"Oscillator":[49],"(VCO)":[50],"modified":[53],"Howland":[54],"Control":[57],"Current":[58],"Source":[59],"(VCCS).":[60],"made":[66],"up":[67],"an":[69],"amplifier":[71],"(IAmp),":[72],"50":[74],"Hz":[75],"notch":[76],"filter":[77,84,91],"(NF)":[78],"narrow":[81],"band":[82],"pass":[83],"(NBPF)":[85],"by":[87],"cascading":[88],"one":[89],"lowpass":[90],"highpass":[94],"filter.":[95],"electrode":[97],"switching":[98],"module":[99],"using":[102],"multiplexers":[106],"to":[107,134,159],"electrodes":[110],"sequentially":[111],"injecting":[113],"measuring":[116],"boundary":[118],"voltage":[119],"data.":[120],"Load":[121],"response,":[122],"response":[124],"Fast":[127],"Fourier":[128],"Transform":[129],"(FFT)":[130],"studies":[131],"are":[132,149],"conducted":[133],"evaluate":[135,160],"VCO,":[137],"VCCS,":[138],"IAmp,":[139],"NF":[140],"NBPF":[142],"performance.":[143],"number":[145],"phantoms":[148],"resistivity":[153],"studied":[156],"in":[157],"EIDORS":[158],"instrumentation.":[162],"Result":[163],"shows":[164],"that":[165],"suitable":[169],"laboratory":[171],"phantom":[174],"studies.":[176]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2016,"cited_by_count":1}],"updated_date":"2026-04-22T08:38:42.863108","created_date":"2025-10-10T00:00:00"}
