{"id":"https://openalex.org/W2466706860","doi":"https://doi.org/10.1007/978-3-662-48838-6_6","title":"Evaluation of Model-Based Condition Monitoring Systems in Industrial Application Cases","display_name":"Evaluation of Model-Based Condition Monitoring Systems in Industrial Application Cases","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W2466706860","doi":"https://doi.org/10.1007/978-3-662-48838-6_6","mag":"2466706860"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-662-48838-6_6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-662-48838-6_6","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Machine Learning for Cyber Physical Systems","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://publica.fraunhofer.de/documents/N-370137.html","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017548759","display_name":"Stefan Windmann","orcid":"https://orcid.org/0000-0002-4030-0839"},"institutions":[{"id":"https://openalex.org/I4210111500","display_name":"Fraunhofer Institute of Optronics, System Technologies and Image Exploitation","ror":"https://ror.org/01zx97922","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210111500","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"S. Windmann","raw_affiliation_strings":["Fraunhofer Application Center IOSB-INA, Lemgo, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Application Center IOSB-INA, Lemgo, Germany","institution_ids":["https://openalex.org/I4210111500"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081336041","display_name":"Jens Eickmeyer","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111500","display_name":"Fraunhofer Institute of Optronics, System Technologies and Image Exploitation","ror":"https://ror.org/01zx97922","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210111500","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J. Eickmeyer","raw_affiliation_strings":["Fraunhofer Application Center IOSB-INA, Lemgo, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Application Center IOSB-INA, Lemgo, Germany","institution_ids":["https://openalex.org/I4210111500"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050294055","display_name":"Frauke Jungbluth","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111500","display_name":"Fraunhofer Institute of Optronics, System Technologies and Image Exploitation","ror":"https://ror.org/01zx97922","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210111500","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"F. Jungbluth","raw_affiliation_strings":["Fraunhofer Application Center IOSB-INA, Lemgo, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Application Center IOSB-INA, Lemgo, Germany","institution_ids":["https://openalex.org/I4210111500"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046035119","display_name":"Johann Badinger","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Badinger","raw_affiliation_strings":["Institute Industrial IT (inIT), Lemgo, Germany"],"affiliations":[{"raw_affiliation_string":"Institute Industrial IT (inIT), Lemgo, Germany","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012395966","display_name":"Oliver Niggemann","orcid":"https://orcid.org/0000-0001-8747-3596"},"institutions":[{"id":"https://openalex.org/I5209920","display_name":"Ostwestfalen-Lippe University of Applied Sciences and Arts","ror":"https://ror.org/04eka8j06","country_code":"DE","type":"education","lineage":["https://openalex.org/I5209920"]},{"id":"https://openalex.org/I4210111500","display_name":"Fraunhofer Institute of Optronics, System Technologies and Image Exploitation","ror":"https://ror.org/01zx97922","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210111500","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"O. Niggemann","raw_affiliation_strings":["Fraunhofer Application Center IOSB-INA, Lemgo, Germany","Institute Industrial IT (inIT), Lemgo, Germany","inIT, Hochschule Ostwestfalen-Lippe, Lemgo, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Application Center IOSB-INA, Lemgo, Germany","institution_ids":["https://openalex.org/I4210111500"]},{"raw_affiliation_string":"Institute Industrial IT (inIT), Lemgo, Germany","institution_ids":[]},{"raw_affiliation_string":"inIT, Hochschule Ostwestfalen-Lippe, Lemgo, Germany","institution_ids":["https://openalex.org/I5209920"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5017548759"],"corresponding_institution_ids":["https://openalex.org/I4210111500"],"apc_list":null,"apc_paid":null,"fwci":1.4143,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.78586279,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"45","last_page":"50"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9873999953269958,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/principal-component-analysis","display_name":"Principal component analysis","score":0.6317704916000366},{"id":"https://openalex.org/keywords/glue","display_name":"GLUE","score":0.6302547454833984},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6209045052528381},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5758454203605652},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.5425669550895691},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5198719501495361},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.44751617312431335},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.4168710708618164},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39585649967193604},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16537147760391235},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.0720454752445221}],"concepts":[{"id":"https://openalex.org/C27438332","wikidata":"https://www.wikidata.org/wiki/Q2873","display_name":"Principal component analysis","level":2,"score":0.6317704916000366},{"id":"https://openalex.org/C2779937294","wikidata":"https://www.wikidata.org/wiki/Q5513666","display_name":"GLUE","level":2,"score":0.6302547454833984},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6209045052528381},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5758454203605652},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.5425669550895691},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5198719501495361},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.44751617312431335},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.4168710708618164},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39585649967193604},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16537147760391235},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0720454752445221},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1007/978-3-662-48838-6_6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-662-48838-6_6","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Machine Learning for Cyber Physical Systems","raw_type":"book-chapter"},{"id":"pmh:oai:fraunhofer.de:N-370137","is_oa":true,"landing_page_url":"http://publica.fraunhofer.de/documents/N-370137.html","pdf_url":null,"source":{"id":"https://openalex.org/S4306400318","display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Fraunhofer IOSB","raw_type":"Conference Paper"},{"id":"pmh:oai:fraunhofer.de:N-379583","is_oa":false,"landing_page_url":"http://publica.fraunhofer.de/documents/N-379583.html","pdf_url":null,"source":{"id":"https://openalex.org/S4306400801","display_name":"Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Fraunhofer IOSB","raw_type":"Conference Paper"},{"id":"pmh:oai:publica.fraunhofer.de:publica/391059","is_oa":false,"landing_page_url":"https://publica.fraunhofer.de/handle/publica/391059","pdf_url":null,"source":{"id":"https://openalex.org/S4306400318","display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"conference paper"}],"best_oa_location":{"id":"pmh:oai:fraunhofer.de:N-370137","is_oa":true,"landing_page_url":"http://publica.fraunhofer.de/documents/N-370137.html","pdf_url":null,"source":{"id":"https://openalex.org/S4306400318","display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Fraunhofer IOSB","raw_type":"Conference Paper"},"sustainable_development_goals":[{"score":0.8700000047683716,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1505479406","https://openalex.org/W1514932080","https://openalex.org/W1899291908","https://openalex.org/W1985545639","https://openalex.org/W2109559642","https://openalex.org/W2119208370","https://openalex.org/W2125838338","https://openalex.org/W2129039806","https://openalex.org/W2147941026","https://openalex.org/W2164069175","https://openalex.org/W2166146957","https://openalex.org/W2403998935"],"related_works":["https://openalex.org/W1975401649","https://openalex.org/W2106011737","https://openalex.org/W2388885029","https://openalex.org/W1976956594","https://openalex.org/W2099329408","https://openalex.org/W2919952534","https://openalex.org/W2359636213","https://openalex.org/W2388713340","https://openalex.org/W1988831724","https://openalex.org/W3036432495"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}