{"id":"https://openalex.org/W1811272112","doi":"https://doi.org/10.1007/978-3-642-76930-6_34","title":"Testing Fault-Tolerant Protocols by Heuristic Fault Injection","display_name":"Testing Fault-Tolerant Protocols by Heuristic Fault Injection","publication_year":1991,"publication_date":"1991-01-01","ids":{"openalex":"https://openalex.org/W1811272112","doi":"https://doi.org/10.1007/978-3-642-76930-6_34","mag":"1811272112"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-76930-6_34","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-76930-6_34","pdf_url":null,"source":{"id":"https://openalex.org/S4210212548","display_name":"Informatik-Fachberichte","issn_l":"0343-3005","issn":["0343-3005"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Informatik-Fachberichte","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034774132","display_name":"Yinong Chen","orcid":"https://orcid.org/0000-0002-8780-3994"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Yinong Chen","raw_affiliation_strings":["Inst. f\u00fcr Rechnerentwurf und Fehlertoleranz, Universit\u00e4t Karlsruhe, Postfach 6980, W-7500, Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Inst. f\u00fcr Rechnerentwurf und Fehlertoleranz, Universit\u00e4t Karlsruhe, Postfach 6980, W-7500, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036127280","display_name":"Klaus Echtle","orcid":null},"institutions":[{"id":"https://openalex.org/I200332995","display_name":"TU Dortmund University","ror":"https://ror.org/01k97gp34","country_code":"DE","type":"education","lineage":["https://openalex.org/I200332995"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Klaus Echtle","raw_affiliation_strings":["Fachbereich Informatik, Universit\u00e4t Dortmund, Postfach 500 500, W-4600, Dortmund 50, Germany"],"affiliations":[{"raw_affiliation_string":"Fachbereich Informatik, Universit\u00e4t Dortmund, Postfach 500 500, W-4600, Dortmund 50, Germany","institution_ids":["https://openalex.org/I200332995"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065774890","display_name":"Winfried G\u00f6rke","orcid":null},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Winfried G\u00f6rke","raw_affiliation_strings":["Inst. f\u00fcr Rechnerentwurf und Fehlertoleranz, Universit\u00e4t Karlsruhe, Postfach 6980, W-7500, Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Inst. f\u00fcr Rechnerentwurf und Fehlertoleranz, Universit\u00e4t Karlsruhe, Postfach 6980, W-7500, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5034774132"],"corresponding_institution_ids":["https://openalex.org/I102335020"],"apc_list":null,"apc_paid":null,"fwci":1.7474,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.854,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"407","last_page":"418"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/heuristic","display_name":"Heuristic","score":0.7497811317443848},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6845455765724182},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6530499458312988},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6116862297058105},{"id":"https://openalex.org/keywords/protocol","display_name":"Protocol (science)","score":0.5558018684387207},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5319234132766724},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.5265322327613831},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.4810914695262909},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.44499433040618896},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4398695230484009},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4153691232204437},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2308359146118164},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10815232992172241},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.0828000009059906},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.07233992218971252}],"concepts":[{"id":"https://openalex.org/C173801870","wikidata":"https://www.wikidata.org/wiki/Q201413","display_name":"Heuristic","level":2,"score":0.7497811317443848},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6845455765724182},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6530499458312988},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6116862297058105},{"id":"https://openalex.org/C2780385302","wikidata":"https://www.wikidata.org/wiki/Q367158","display_name":"Protocol (science)","level":3,"score":0.5558018684387207},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5319234132766724},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.5265322327613831},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.4810914695262909},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.44499433040618896},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4398695230484009},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4153691232204437},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2308359146118164},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10815232992172241},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0828000009059906},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.07233992218971252},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-642-76930-6_34","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-76930-6_34","pdf_url":null,"source":{"id":"https://openalex.org/S4210212548","display_name":"Informatik-Fachberichte","issn_l":"0343-3005","issn":["0343-3005"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Informatik-Fachberichte","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.699999988079071,"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W171247437","https://openalex.org/W1486127232","https://openalex.org/W1553526993","https://openalex.org/W1564490543","https://openalex.org/W1811272112","https://openalex.org/W2038606994","https://openalex.org/W2079267582","https://openalex.org/W2120860555","https://openalex.org/W2127809586","https://openalex.org/W2140945213","https://openalex.org/W2148751582","https://openalex.org/W2164836255","https://openalex.org/W4252969536"],"related_works":["https://openalex.org/W4256030018","https://openalex.org/W2147400189","https://openalex.org/W2340957901","https://openalex.org/W2568949342","https://openalex.org/W1555400249","https://openalex.org/W2031110496","https://openalex.org/W2130922779","https://openalex.org/W2157154381","https://openalex.org/W433800193","https://openalex.org/W3147038789"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}