{"id":"https://openalex.org/W1848099926","doi":"https://doi.org/10.1007/978-3-642-45628-2_8","title":"Fault Detection by Consumption Measurement in CMOS Circuits","display_name":"Fault Detection by Consumption Measurement in CMOS Circuits","publication_year":1987,"publication_date":"1987-01-01","ids":{"openalex":"https://openalex.org/W1848099926","doi":"https://doi.org/10.1007/978-3-642-45628-2_8","mag":"1848099926"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-45628-2_8","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-45628-2_8","pdf_url":null,"source":{"id":"https://openalex.org/S4210212548","display_name":"Informatik-Fachberichte","issn_l":"0343-3005","issn":["0343-3005"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Informatik-Fachberichte","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112559893","display_name":"Mireille Jacomino","orcid":null},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Mireille Jacomino","raw_affiliation_strings":["Laboratoire d\u2019Automatique de Grenoble, INPG, UA 228 CNRS, BP 46, 38402, Saint-Martin-d\u2019H\u00e8res, France","Laboratoire d\u2019Automatique de Grenoble, INPG, UA 228 CNRS, Saint-Martin-d\u2019H\u00e8res, France"],"affiliations":[{"raw_affiliation_string":"Laboratoire d\u2019Automatique de Grenoble, INPG, UA 228 CNRS, BP 46, 38402, Saint-Martin-d\u2019H\u00e8res, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I106785703"]},{"raw_affiliation_string":"Laboratoire d\u2019Automatique de Grenoble, INPG, UA 228 CNRS, Saint-Martin-d\u2019H\u00e8res, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108587614","display_name":"Jean Luc Rainard","orcid":null},"institutions":[{"id":"https://openalex.org/I19370010","display_name":"Orange (France)","ror":"https://ror.org/035j0tq82","country_code":"FR","type":"company","lineage":["https://openalex.org/I19370010"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Jean Luc Rainard","raw_affiliation_strings":["Centre National d\u2019Etudes des T\u00e9l\u00e9communications, CNS, Chemin du Vieux-Ch\u00eane, 38243, Meylan, France","Centre National d'Etudes des T\u00e9l\u00e9communications, CNS, Chemin du Vieux Ch\u00eane, MEYLAN, France"],"affiliations":[{"raw_affiliation_string":"Centre National d\u2019Etudes des T\u00e9l\u00e9communications, CNS, Chemin du Vieux-Ch\u00eane, 38243, Meylan, France","institution_ids":["https://openalex.org/I19370010"]},{"raw_affiliation_string":"Centre National d'Etudes des T\u00e9l\u00e9communications, CNS, Chemin du Vieux Ch\u00eane, MEYLAN, France","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110117316","display_name":"Ren\u00e9 David","orcid":null},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Ren\u00e9 David","raw_affiliation_strings":["Laboratoire d\u2019Automatique de Grenoble, INPG, UA 228 CNRS, BP 46, 38402, Saint-Martin-d\u2019H\u00e8res, France","Laboratoire d\u2019Automatique de Grenoble, INPG, UA 228 CNRS, Saint-Martin-d\u2019H\u00e8res, France"],"affiliations":[{"raw_affiliation_string":"Laboratoire d\u2019Automatique de Grenoble, INPG, UA 228 CNRS, BP 46, 38402, Saint-Martin-d\u2019H\u00e8res, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I106785703"]},{"raw_affiliation_string":"Laboratoire d\u2019Automatique de Grenoble, INPG, UA 228 CNRS, Saint-Martin-d\u2019H\u00e8res, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I1294671590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5112559893"],"corresponding_institution_ids":["https://openalex.org/I106785703","https://openalex.org/I1294671590"],"apc_list":null,"apc_paid":null,"fwci":0.6,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.69924812,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"83","last_page":"94"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9799000024795532,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.96670001745224,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7850968837738037},{"id":"https://openalex.org/keywords/controllability","display_name":"Controllability","score":0.7077750563621521},{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.6887723207473755},{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.6083164215087891},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6044335961341858},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5538825988769531},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4900728464126587},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.42047086358070374},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.41931912302970886},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.417039155960083},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3556719422340393},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3226468563079834},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3221907913684845},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08490714430809021}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7850968837738037},{"id":"https://openalex.org/C48209547","wikidata":"https://www.wikidata.org/wiki/Q1331104","display_name":"Controllability","level":2,"score":0.7077750563621521},{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.6887723207473755},{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.6083164215087891},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6044335961341858},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5538825988769531},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4900728464126587},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.42047086358070374},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41931912302970886},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.417039155960083},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3556719422340393},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3226468563079834},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3221907913684845},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08490714430809021},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-642-45628-2_8","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-45628-2_8","pdf_url":null,"source":{"id":"https://openalex.org/S4210212548","display_name":"Informatik-Fachberichte","issn_l":"0343-3005","issn":["0343-3005"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Informatik-Fachberichte","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4300000071525574,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W33238586","https://openalex.org/W122496158","https://openalex.org/W1598175676","https://openalex.org/W1967417417","https://openalex.org/W2046817879","https://openalex.org/W4255251068","https://openalex.org/W6604992875"],"related_works":["https://openalex.org/W2332386680","https://openalex.org/W1983142522","https://openalex.org/W1986570998","https://openalex.org/W2782529250","https://openalex.org/W2037921533","https://openalex.org/W2508171592","https://openalex.org/W2801563517","https://openalex.org/W2130864543","https://openalex.org/W2068126039","https://openalex.org/W2041749520"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}