{"id":"https://openalex.org/W137981594","doi":"https://doi.org/10.1007/978-3-642-45037-2_21","title":"Reliability Analysis Method Using Dynamic Reliability Block Diagram Based on DEVS Formalism","display_name":"Reliability Analysis Method Using Dynamic Reliability Block Diagram Based on DEVS Formalism","publication_year":2013,"publication_date":"2013-01-01","ids":{"openalex":"https://openalex.org/W137981594","doi":"https://doi.org/10.1007/978-3-642-45037-2_21","mag":"137981594"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-45037-2_21","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-45037-2_21","pdf_url":null,"source":{"id":"https://openalex.org/S2764900261","display_name":"Communications in computer and information science","issn_l":"1865-0929","issn":["1865-0929","1865-0937"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Computer and Information Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111890844","display_name":"Sol Ha","orcid":"https://orcid.org/0000-0003-2004-4126"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sol Ha","raw_affiliation_strings":["Engineering Research Institute, Seoul National University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Engineering Research Institute, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079377962","display_name":"Namkug Ku","orcid":"https://orcid.org/0000-0003-0364-1279"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Namkug Ku","raw_affiliation_strings":["Engineering Research Institute, Seoul National University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Engineering Research Institute, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025176891","display_name":"Myung-Il Roh","orcid":"https://orcid.org/0000-0001-7972-6848"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Myung-Il Roh","raw_affiliation_strings":["Department of Naval Architecture and Ocean Engineering, Seoul National University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Naval Architecture and Ocean Engineering, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060413241","display_name":"Ju-Hwan Cha","orcid":"https://orcid.org/0000-0003-2874-7459"},"institutions":[{"id":"https://openalex.org/I11893660","display_name":"Mokpo National University","ror":"https://ror.org/00v81k483","country_code":"KR","type":"education","lineage":["https://openalex.org/I11893660"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ju-Hwan Cha","raw_affiliation_strings":["Department of Ocean Engineering, Mokpo National University, Muan-gun, Jeollanam-do, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Ocean Engineering, Mokpo National University, Muan-gun, Jeollanam-do, South Korea","institution_ids":["https://openalex.org/I11893660"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5111890844"],"corresponding_institution_ids":["https://openalex.org/I139264467"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05569155,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"219","last_page":"230"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/devs","display_name":"DEVS","score":0.9192425012588501},{"id":"https://openalex.org/keywords/reliability-block-diagram","display_name":"Reliability block diagram","score":0.9097949266433716},{"id":"https://openalex.org/keywords/formalism","display_name":"Formalism (music)","score":0.7066597938537598},{"id":"https://openalex.org/keywords/block-diagram","display_name":"Block diagram","score":0.6973980069160461},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6865947842597961},{"id":"https://openalex.org/keywords/fault-tree-analysis","display_name":"Fault tree analysis","score":0.6627122759819031},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5778599381446838},{"id":"https://openalex.org/keywords/tree-diagram","display_name":"Tree diagram","score":0.562856137752533},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5509626865386963},{"id":"https://openalex.org/keywords/raid","display_name":"RAID","score":0.44384831190109253},{"id":"https://openalex.org/keywords/modeling-and-simulation","display_name":"Modeling and simulation","score":0.2491399347782135},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.20363855361938477},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1436280608177185},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.10209017992019653},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08405762910842896},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.06306740641593933}],"concepts":[{"id":"https://openalex.org/C68757728","wikidata":"https://www.wikidata.org/wiki/Q911082","display_name":"DEVS","level":3,"score":0.9192425012588501},{"id":"https://openalex.org/C18074226","wikidata":"https://www.wikidata.org/wiki/Q7310986","display_name":"Reliability block diagram","level":3,"score":0.9097949266433716},{"id":"https://openalex.org/C73301696","wikidata":"https://www.wikidata.org/wiki/Q5469984","display_name":"Formalism (music)","level":3,"score":0.7066597938537598},{"id":"https://openalex.org/C149227320","wikidata":"https://www.wikidata.org/wiki/Q884718","display_name":"Block diagram","level":2,"score":0.6973980069160461},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6865947842597961},{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.6627122759819031},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5778599381446838},{"id":"https://openalex.org/C84780729","wikidata":"https://www.wikidata.org/wiki/Q7837579","display_name":"Tree diagram","level":4,"score":0.562856137752533},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5509626865386963},{"id":"https://openalex.org/C133320665","wikidata":"https://www.wikidata.org/wiki/Q179299","display_name":"RAID","level":2,"score":0.44384831190109253},{"id":"https://openalex.org/C167343916","wikidata":"https://www.wikidata.org/wiki/Q6888384","display_name":"Modeling and simulation","level":2,"score":0.2491399347782135},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.20363855361938477},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1436280608177185},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.10209017992019653},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08405762910842896},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.06306740641593933},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C558565934","wikidata":"https://www.wikidata.org/wiki/Q2743","display_name":"Musical","level":2,"score":0.0},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C57830394","wikidata":"https://www.wikidata.org/wiki/Q278079","display_name":"Posterior probability","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-642-45037-2_21","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-45037-2_21","pdf_url":null,"source":{"id":"https://openalex.org/S2764900261","display_name":"Communications in computer and information science","issn_l":"1865-0929","issn":["1865-0929","1865-0937"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Computer and Information Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1543835543","https://openalex.org/W1552009975","https://openalex.org/W1584783710","https://openalex.org/W1673754799","https://openalex.org/W1976102130","https://openalex.org/W2001598892","https://openalex.org/W2082435859","https://openalex.org/W2150298155","https://openalex.org/W2739331291"],"related_works":["https://openalex.org/W162387073","https://openalex.org/W2576400083","https://openalex.org/W2023383111","https://openalex.org/W172268995","https://openalex.org/W2066973364","https://openalex.org/W2086782250","https://openalex.org/W4242319996","https://openalex.org/W2005279557","https://openalex.org/W75857945","https://openalex.org/W137981594"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}