{"id":"https://openalex.org/W59294937","doi":"https://doi.org/10.1007/978-3-642-40349-1_6","title":"A High Reliability PUF Using Hot Carrier Injection Based Response Reinforcement","display_name":"A High Reliability PUF Using Hot Carrier Injection Based Response Reinforcement","publication_year":2013,"publication_date":"2013-01-01","ids":{"openalex":"https://openalex.org/W59294937","doi":"https://doi.org/10.1007/978-3-642-40349-1_6","mag":"59294937"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-40349-1_6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-40349-1_6","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089769405","display_name":"Mudit Bhargava","orcid":"https://orcid.org/0000-0003-4503-2260"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Mudit Bhargava","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Carnegie Mellon University, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Carnegie Mellon University, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000377660","display_name":"Ken Mai","orcid":"https://orcid.org/0000-0002-9096-8757"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ken Mai","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Carnegie Mellon University, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Carnegie Mellon University, USA","institution_ids":["https://openalex.org/I74973139"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5089769405"],"corresponding_institution_ids":["https://openalex.org/I74973139"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":7.3369,"has_fulltext":false,"cited_by_count":58,"citation_normalized_percentile":{"value":0.9689441,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"90","last_page":"106"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7581787109375},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6859798431396484},{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.4922284185886383},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4421147108078003},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4354178309440613},{"id":"https://openalex.org/keywords/randomness","display_name":"Randomness","score":0.42961585521698},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.34158849716186523},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20005068182945251},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11395210027694702},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.09958687424659729}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7581787109375},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6859798431396484},{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.4922284185886383},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4421147108078003},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4354178309440613},{"id":"https://openalex.org/C125112378","wikidata":"https://www.wikidata.org/wiki/Q176640","display_name":"Randomness","level":2,"score":0.42961585521698},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34158849716186523},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20005068182945251},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11395210027694702},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.09958687424659729},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-642-40349-1_6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-40349-1_6","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/15","score":0.4699999988079071,"display_name":"Life in Land"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":43,"referenced_works":["https://openalex.org/W35428663","https://openalex.org/W37385681","https://openalex.org/W89245623","https://openalex.org/W1532483809","https://openalex.org/W1559083062","https://openalex.org/W1582313396","https://openalex.org/W1870293527","https://openalex.org/W1894646615","https://openalex.org/W1921186091","https://openalex.org/W1922829621","https://openalex.org/W1967952963","https://openalex.org/W1981555606","https://openalex.org/W1986323640","https://openalex.org/W2000171858","https://openalex.org/W2017174041","https://openalex.org/W2053877171","https://openalex.org/W2077300005","https://openalex.org/W2082937818","https://openalex.org/W2102010849","https://openalex.org/W2102729267","https://openalex.org/W2109265351","https://openalex.org/W2112995947","https://openalex.org/W2113322447","https://openalex.org/W2116374153","https://openalex.org/W2123482651","https://openalex.org/W2124874986","https://openalex.org/W2129004891","https://openalex.org/W2129267471","https://openalex.org/W2130351941","https://openalex.org/W2140823559","https://openalex.org/W2146813141","https://openalex.org/W2151401917","https://openalex.org/W2151759197","https://openalex.org/W2246315406","https://openalex.org/W2486348220","https://openalex.org/W2486433473","https://openalex.org/W2487822210","https://openalex.org/W2570008916","https://openalex.org/W2619633776","https://openalex.org/W2785506110","https://openalex.org/W3140757139","https://openalex.org/W3151293064","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W3034924094","https://openalex.org/W1488708774","https://openalex.org/W3094954546","https://openalex.org/W2981906196","https://openalex.org/W1513698804","https://openalex.org/W4310560702","https://openalex.org/W2029712093","https://openalex.org/W1982811510","https://openalex.org/W4255503743","https://openalex.org/W52943787"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":9},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":9},{"year":2014,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}