{"id":"https://openalex.org/W96551105","doi":"https://doi.org/10.1007/978-3-642-33675-1_28","title":"Electronic Reliability Estimation: How Reliable Are the Results?","display_name":"Electronic Reliability Estimation: How Reliable Are the Results?","publication_year":2012,"publication_date":"2012-01-01","ids":{"openalex":"https://openalex.org/W96551105","doi":"https://doi.org/10.1007/978-3-642-33675-1_28","mag":"96551105"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-33675-1_28","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-33675-1_28","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101962105","display_name":"Nuno Silva","orcid":"https://orcid.org/0000-0002-8653-1499"},"institutions":[{"id":"https://openalex.org/I188522409","display_name":"Critical Software (Portugal)","ror":"https://ror.org/03er2hr05","country_code":"PT","type":"company","lineage":["https://openalex.org/I188522409"]}],"countries":["PT"],"is_corresponding":true,"raw_author_name":"Nuno Silva","raw_affiliation_strings":["Critical Software S.A, Parque Industrial de Taveiro, Lote 48, 3045-504, Coimbra, Portugal"],"affiliations":[{"raw_affiliation_string":"Critical Software S.A, Parque Industrial de Taveiro, Lote 48, 3045-504, Coimbra, Portugal","institution_ids":["https://openalex.org/I188522409"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055542939","display_name":"Rui L. Lopes","orcid":"https://orcid.org/0000-0002-1579-1330"},"institutions":[{"id":"https://openalex.org/I188522409","display_name":"Critical Software (Portugal)","ror":"https://ror.org/03er2hr05","country_code":"PT","type":"company","lineage":["https://openalex.org/I188522409"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"Rui Lopes","raw_affiliation_strings":["Critical Software S.A, Parque Industrial de Taveiro, Lote 48, 3045-504, Coimbra, Portugal"],"affiliations":[{"raw_affiliation_string":"Critical Software S.A, Parque Industrial de Taveiro, Lote 48, 3045-504, Coimbra, Portugal","institution_ids":["https://openalex.org/I188522409"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5101962105"],"corresponding_institution_ids":["https://openalex.org/I188522409"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.07571288,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"319","last_page":"327"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9747999906539917,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9747999906539917,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9075999855995178,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7894093990325928},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7035955786705017},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6125500798225403},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.5667382478713989},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.5216365456581116},{"id":"https://openalex.org/keywords/electronic-systems","display_name":"Electronic systems","score":0.5056695938110352},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.47122251987457275},{"id":"https://openalex.org/keywords/plan","display_name":"Plan (archaeology)","score":0.45704182982444763},{"id":"https://openalex.org/keywords/estimation","display_name":"Estimation","score":0.45645543932914734},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.36856725811958313},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11822810769081116}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7894093990325928},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7035955786705017},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6125500798225403},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.5667382478713989},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.5216365456581116},{"id":"https://openalex.org/C2983266536","wikidata":"https://www.wikidata.org/wiki/Q3509543","display_name":"Electronic systems","level":2,"score":0.5056695938110352},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.47122251987457275},{"id":"https://openalex.org/C2776505523","wikidata":"https://www.wikidata.org/wiki/Q4785468","display_name":"Plan (archaeology)","level":2,"score":0.45704182982444763},{"id":"https://openalex.org/C96250715","wikidata":"https://www.wikidata.org/wiki/Q965330","display_name":"Estimation","level":2,"score":0.45645543932914734},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.36856725811958313},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11822810769081116},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-642-33675-1_28","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-33675-1_28","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2030653642","https://openalex.org/W2503613079"],"related_works":["https://openalex.org/W2576994247","https://openalex.org/W2608353378","https://openalex.org/W2072180474","https://openalex.org/W1960052459","https://openalex.org/W4249206767","https://openalex.org/W2563559453","https://openalex.org/W2382330008","https://openalex.org/W2375707231","https://openalex.org/W2092058600","https://openalex.org/W2369909760"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}