{"id":"https://openalex.org/W52716467","doi":"https://doi.org/10.1007/978-3-642-28163-1_1","title":"Development of a Micro-scale Assembly Facility with a Three Fingered, Self-aware Assembly Tool and Electro-chemical Etching Capabilities","display_name":"Development of a Micro-scale Assembly Facility with a Three Fingered, Self-aware Assembly Tool and Electro-chemical Etching Capabilities","publication_year":2012,"publication_date":"2012-01-01","ids":{"openalex":"https://openalex.org/W52716467","doi":"https://doi.org/10.1007/978-3-642-28163-1_1","mag":"52716467"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-28163-1_1","is_oa":true,"landing_page_url":"https://doi.org/10.1007/978-3-642-28163-1_1","pdf_url":"https://link.springer.com/content/pdf/10.1007/978-3-642-28163-1_1.pdf","source":{"id":"https://openalex.org/S4210175514","display_name":"IFIP International Federation for Information Processing/IFIP","issn_l":"1571-5736","issn":["1571-5736","1861-2288"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IFIP Advances in Information and Communication Technology","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://link.springer.com/content/pdf/10.1007/978-3-642-28163-1_1.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079537585","display_name":"Jacob W. Chesna","orcid":null},"institutions":[{"id":"https://openalex.org/I102149020","display_name":"University of North Carolina at Charlotte","ror":"https://ror.org/04dawnj30","country_code":"US","type":"education","lineage":["https://openalex.org/I102149020"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jacob W. Chesna","raw_affiliation_strings":["Center for Precision Metrology, University of North Carolina at Charlotte, NC, 28223, USA","University of North Carolina at Charlotte*"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Precision Metrology, University of North Carolina at Charlotte, NC, 28223, USA","institution_ids":["https://openalex.org/I102149020"]},{"raw_affiliation_string":"University of North Carolina at Charlotte*","institution_ids":["https://openalex.org/I102149020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081789094","display_name":"Stuart T. Smith","orcid":"https://orcid.org/0000-0003-4713-4834"},"institutions":[{"id":"https://openalex.org/I102149020","display_name":"University of North Carolina at Charlotte","ror":"https://ror.org/04dawnj30","country_code":"US","type":"education","lineage":["https://openalex.org/I102149020"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Stuart T. Smith","raw_affiliation_strings":["Center for Precision Metrology, University of North Carolina at Charlotte, NC, 28223, USA","University of North Carolina at Charlotte*"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Precision Metrology, University of North Carolina at Charlotte, NC, 28223, USA","institution_ids":["https://openalex.org/I102149020"]},{"raw_affiliation_string":"University of North Carolina at Charlotte*","institution_ids":["https://openalex.org/I102149020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000729759","display_name":"D. J. Hastings","orcid":null},"institutions":[{"id":"https://openalex.org/I102149020","display_name":"University of North Carolina at Charlotte","ror":"https://ror.org/04dawnj30","country_code":"US","type":"education","lineage":["https://openalex.org/I102149020"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. J. Hastings","raw_affiliation_strings":["Center for Precision Metrology, University of North Carolina at Charlotte, NC, 28223, USA","University of North Carolina at Charlotte*"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Precision Metrology, University of North Carolina at Charlotte, NC, 28223, USA","institution_ids":["https://openalex.org/I102149020"]},{"raw_affiliation_string":"University of North Carolina at Charlotte*","institution_ids":["https://openalex.org/I102149020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046619844","display_name":"Borja de la Maza","orcid":null},"institutions":[{"id":"https://openalex.org/I4210157210","display_name":"Innovalia (Spain)","ror":"https://ror.org/05czwfr97","country_code":"ES","type":"company","lineage":["https://openalex.org/I4210157210"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Borja de la Maza","raw_affiliation_strings":["Innovalia Metrology, Rodr\u00edguez arias 6, 48008, Bilbao-Vizcaya, Spain","Innovalia Metrology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Innovalia Metrology, Rodr\u00edguez arias 6, 48008, Bilbao-Vizcaya, Spain","institution_ids":["https://openalex.org/I4210157210"]},{"raw_affiliation_string":"Innovalia Metrology","institution_ids":["https://openalex.org/I4210157210"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104349928","display_name":"Bartoz K. Nowakowski","orcid":null},"institutions":[{"id":"https://openalex.org/I102149020","display_name":"University of North Carolina at Charlotte","ror":"https://ror.org/04dawnj30","country_code":"US","type":"education","lineage":["https://openalex.org/I102149020"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bartoz K. Nowakowski","raw_affiliation_strings":["Center for Precision Metrology, University of North Carolina at Charlotte, NC, 28223, USA","University of North Carolina at Charlotte*"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Precision Metrology, University of North Carolina at Charlotte, NC, 28223, USA","institution_ids":["https://openalex.org/I102149020"]},{"raw_affiliation_string":"University of North Carolina at Charlotte*","institution_ids":["https://openalex.org/I102149020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018862164","display_name":"Feilong Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I102149020","display_name":"University of North Carolina at Charlotte","ror":"https://ror.org/04dawnj30","country_code":"US","type":"education","lineage":["https://openalex.org/I102149020"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Feilong Lin","raw_affiliation_strings":["Center for Precision Metrology, University of North Carolina at Charlotte, NC, 28223, USA","University of North Carolina at Charlotte*"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Precision Metrology, University of North Carolina at Charlotte, NC, 28223, USA","institution_ids":["https://openalex.org/I102149020"]},{"raw_affiliation_string":"University of North Carolina at Charlotte*","institution_ids":["https://openalex.org/I102149020"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.3904,"has_fulltext":true,"cited_by_count":4,"citation_normalized_percentile":{"value":0.92727273,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.5808162689208984},{"id":"https://openalex.org/keywords/etching","display_name":"Etching (microfabrication)","score":0.5313701629638672},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4789174795150757},{"id":"https://openalex.org/keywords/isotropic-etching","display_name":"Isotropic etching","score":0.41446158289909363},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3999972641468048},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.35984665155410767}],"concepts":[{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.5808162689208984},{"id":"https://openalex.org/C100460472","wikidata":"https://www.wikidata.org/wiki/Q2368605","display_name":"Etching (microfabrication)","level":3,"score":0.5313701629638672},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4789174795150757},{"id":"https://openalex.org/C33220542","wikidata":"https://www.wikidata.org/wiki/Q6086567","display_name":"Isotropic etching","level":4,"score":0.41446158289909363},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3999972641468048},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.35984665155410767},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/978-3-642-28163-1_1","is_oa":true,"landing_page_url":"https://doi.org/10.1007/978-3-642-28163-1_1","pdf_url":"https://link.springer.com/content/pdf/10.1007/978-3-642-28163-1_1.pdf","source":{"id":"https://openalex.org/S4210175514","display_name":"IFIP International Federation for Information Processing/IFIP","issn_l":"1571-5736","issn":["1571-5736","1861-2288"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IFIP Advances in Information and Communication Technology","raw_type":"book-chapter"},{"id":"pmh:oai:HAL:hal-01363871v1","is_oa":true,"landing_page_url":"https://inria.hal.science/hal-01363871","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"6th International Precision Assembly Seminar (IPAS), Feb 2012, Chamonix, France. pp.1-8, ⟨10.1007/978-3-642-28163-1_1⟩","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"doi:10.1007/978-3-642-28163-1_1","is_oa":true,"landing_page_url":"https://doi.org/10.1007/978-3-642-28163-1_1","pdf_url":"https://link.springer.com/content/pdf/10.1007/978-3-642-28163-1_1.pdf","source":{"id":"https://openalex.org/S4210175514","display_name":"IFIP International Federation for Information Processing/IFIP","issn_l":"1571-5736","issn":["1571-5736","1861-2288"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IFIP Advances in Information and Communication Technology","raw_type":"book-chapter"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W52716467.pdf","grobid_xml":"https://content.openalex.org/works/W52716467.grobid-xml"},"referenced_works_count":5,"referenced_works":["https://openalex.org/W2021398417","https://openalex.org/W2058497402","https://openalex.org/W2059001917","https://openalex.org/W2120087375","https://openalex.org/W2486466545"],"related_works":["https://openalex.org/W2128494206","https://openalex.org/W2074502480","https://openalex.org/W2148274155","https://openalex.org/W2788903434","https://openalex.org/W2606133557","https://openalex.org/W1972608542","https://openalex.org/W2091008601","https://openalex.org/W2990644426","https://openalex.org/W581292172","https://openalex.org/W1482397683"],"abstract_inverted_index":null,"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}