{"id":"https://openalex.org/W1471857801","doi":"https://doi.org/10.1007/978-3-642-27579-1_1","title":"Optimization of a Magnetic Flux Leakage Measurement Set\u2013Up Using FEM\u2013Simulations","display_name":"Optimization of a Magnetic Flux Leakage Measurement Set\u2013Up Using FEM\u2013Simulations","publication_year":2012,"publication_date":"2012-01-01","ids":{"openalex":"https://openalex.org/W1471857801","doi":"https://doi.org/10.1007/978-3-642-27579-1_1","mag":"1471857801"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-27579-1_1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-27579-1_1","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074328272","display_name":"Johannes Atzlesberger","orcid":null},"institutions":[{"id":"https://openalex.org/I121883995","display_name":"Johannes Kepler University of Linz","ror":"https://ror.org/052r2xn60","country_code":"AT","type":"education","lineage":["https://openalex.org/I121883995"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Johannes Atzlesberger","raw_affiliation_strings":["Institute for Measurement Technology, Johannes Kepler University, Altenbergerstr. 69, 4040, Linz, Austria","Institute for Measurement Technology, Johannes Kepler University, Linz, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Measurement Technology, Johannes Kepler University, Altenbergerstr. 69, 4040, Linz, Austria","institution_ids":["https://openalex.org/I121883995"]},{"raw_affiliation_string":"Institute for Measurement Technology, Johannes Kepler University, Linz, Austria","institution_ids":["https://openalex.org/I121883995"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076185486","display_name":"Bernhard G. Zagar","orcid":"https://orcid.org/0000-0002-0695-2657"},"institutions":[{"id":"https://openalex.org/I121883995","display_name":"Johannes Kepler University of Linz","ror":"https://ror.org/052r2xn60","country_code":"AT","type":"education","lineage":["https://openalex.org/I121883995"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Bernhard G. Zagar","raw_affiliation_strings":["Institute for Measurement Technology, Johannes Kepler University, Altenbergerstr. 69, 4040, Linz, Austria","Institute for Measurement Technology, Johannes Kepler University, Linz, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Measurement Technology, Johannes Kepler University, Altenbergerstr. 69, 4040, Linz, Austria","institution_ids":["https://openalex.org/I121883995"]},{"raw_affiliation_string":"Institute for Measurement Technology, Johannes Kepler University, Linz, Austria","institution_ids":["https://openalex.org/I121883995"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5074328272"],"corresponding_institution_ids":["https://openalex.org/I121883995"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":4.336,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.93554148,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.6527701020240784},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.6400309801101685},{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.6328631043434143},{"id":"https://openalex.org/keywords/anisotropy","display_name":"Anisotropy","score":0.5810340642929077},{"id":"https://openalex.org/keywords/magnetic-flux-leakage","display_name":"Magnetic flux leakage","score":0.5719249248504639},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5663860440254211},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.5333449840545654},{"id":"https://openalex.org/keywords/magnetic-flux","display_name":"Magnetic flux","score":0.5215765833854675},{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.5071792602539062},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4787170886993408},{"id":"https://openalex.org/keywords/conductivity","display_name":"Conductivity","score":0.4329746663570404},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.42030584812164307},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4174196720123291},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2962701916694641},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.28956371545791626},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2332620918750763},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.2120523750782013},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.151868999004364},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.06615903973579407}],"concepts":[{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.6527701020240784},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.6400309801101685},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.6328631043434143},{"id":"https://openalex.org/C85725439","wikidata":"https://www.wikidata.org/wiki/Q466686","display_name":"Anisotropy","level":2,"score":0.5810340642929077},{"id":"https://openalex.org/C20892748","wikidata":"https://www.wikidata.org/wiki/Q4390394","display_name":"Magnetic flux leakage","level":3,"score":0.5719249248504639},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5663860440254211},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.5333449840545654},{"id":"https://openalex.org/C157479481","wikidata":"https://www.wikidata.org/wiki/Q177831","display_name":"Magnetic flux","level":3,"score":0.5215765833854675},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.5071792602539062},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4787170886993408},{"id":"https://openalex.org/C131540310","wikidata":"https://www.wikidata.org/wiki/Q907564","display_name":"Conductivity","level":2,"score":0.4329746663570404},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.42030584812164307},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4174196720123291},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2962701916694641},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.28956371545791626},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2332620918750763},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.2120523750782013},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.151868999004364},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.06615903973579407},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-642-27579-1_1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-27579-1_1","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2011069414","https://openalex.org/W2048836754","https://openalex.org/W2075097451","https://openalex.org/W2089071924","https://openalex.org/W2108090112","https://openalex.org/W2494077320"],"related_works":["https://openalex.org/W2762598285","https://openalex.org/W2030770589","https://openalex.org/W2018855351","https://openalex.org/W3005508687","https://openalex.org/W4383333701","https://openalex.org/W2120417348","https://openalex.org/W2993285375","https://openalex.org/W2015574894","https://openalex.org/W2972622007","https://openalex.org/W3161862903"],"abstract_inverted_index":null,"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}