{"id":"https://openalex.org/W117708828","doi":"https://doi.org/10.1007/978-3-642-27207-3_44","title":"Estimating Software Reliability Using Extreme Value Distribution","display_name":"Estimating Software Reliability Using Extreme Value Distribution","publication_year":2011,"publication_date":"2011-01-01","ids":{"openalex":"https://openalex.org/W117708828","doi":"https://doi.org/10.1007/978-3-642-27207-3_44","mag":"117708828"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-27207-3_44","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-27207-3_44","pdf_url":null,"source":{"id":"https://openalex.org/S2764900261","display_name":"Communications in computer and information science","issn_l":"1865-0929","issn":["1865-0929","1865-0937"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Computer and Information Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047657701","display_name":"Xiao Xiao","orcid":"https://orcid.org/0000-0003-4698-5194"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Xiao Xiao","raw_affiliation_strings":["Department of Information Engineering, Graduate School of Engineering, Hiroshima University, 1\u20134\u20131 Kagamiyama, Higashi-Hiroshima, 739\u20138527, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Graduate School of Engineering, Hiroshima University, 1\u20134\u20131 Kagamiyama, Higashi-Hiroshima, 739\u20138527, Japan","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077724142","display_name":"Tadashi Dohi","orcid":"https://orcid.org/0000-0003-2954-0388"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tadashi Dohi","raw_affiliation_strings":["Department of Information Engineering, Graduate School of Engineering, Hiroshima University, 1\u20134\u20131 Kagamiyama, Higashi-Hiroshima, 739\u20138527, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Graduate School of Engineering, Hiroshima University, 1\u20134\u20131 Kagamiyama, Higashi-Hiroshima, 739\u20138527, Japan","institution_ids":["https://openalex.org/I113306721"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5047657701"],"corresponding_institution_ids":["https://openalex.org/I113306721"],"apc_list":null,"apc_paid":null,"fwci":1.3475,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.80173092,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"399","last_page":"406"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6386160850524902},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5572068095207214},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5548916459083557},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.5149374604225159},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4629766345024109},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.35566583275794983},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.25557202100753784},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11643418669700623},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08937826752662659},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.07827386260032654},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.0726499855518341},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.054753273725509644}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6386160850524902},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5572068095207214},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5548916459083557},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.5149374604225159},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4629766345024109},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.35566583275794983},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.25557202100753784},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11643418669700623},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08937826752662659},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.07827386260032654},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0726499855518341},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.054753273725509644},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-642-27207-3_44","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-27207-3_44","pdf_url":null,"source":{"id":"https://openalex.org/S2764900261","display_name":"Communications in computer and information science","issn_l":"1865-0929","issn":["1865-0929","1865-0937"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Computer and Information Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W625509508","https://openalex.org/W1554758995","https://openalex.org/W1968903302","https://openalex.org/W1980595883","https://openalex.org/W2008752549","https://openalex.org/W2090186803","https://openalex.org/W2117039703","https://openalex.org/W2121400627","https://openalex.org/W2142635246","https://openalex.org/W2153242493","https://openalex.org/W2168175751","https://openalex.org/W2171242934","https://openalex.org/W2914956942","https://openalex.org/W4293256909"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-03-18T14:38:29.013473","created_date":"2025-10-10T00:00:00"}