{"id":"https://openalex.org/W159313773","doi":"https://doi.org/10.1007/978-3-642-24270-0_1","title":"The Effect of Correlated Failure Rates on Reliability of Continuous Time 1-Out-of-2 Software","display_name":"The Effect of Correlated Failure Rates on Reliability of Continuous Time 1-Out-of-2 Software","publication_year":2011,"publication_date":"2011-01-01","ids":{"openalex":"https://openalex.org/W159313773","doi":"https://doi.org/10.1007/978-3-642-24270-0_1","mag":"159313773"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-24270-0_1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-24270-0_1","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076873745","display_name":"Peter Popov","orcid":"https://orcid.org/0000-0002-3434-5272"},"institutions":[{"id":"https://openalex.org/I35870678","display_name":"University of Northampton","ror":"https://ror.org/04jp2hx10","country_code":"GB","type":"education","lineage":["https://openalex.org/I35870678"]},{"id":"https://openalex.org/I180825142","display_name":"City, University of London","ror":"https://ror.org/04489at23","country_code":"GB","type":"education","lineage":["https://openalex.org/I124357947","https://openalex.org/I180825142"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Peter Popov","raw_affiliation_strings":["Centre for Software Reliability, City University, Northampton Square, London, UK","Centre for Software Reliability, City University, London, UK"],"affiliations":[{"raw_affiliation_string":"Centre for Software Reliability, City University, Northampton Square, London, UK","institution_ids":["https://openalex.org/I35870678"]},{"raw_affiliation_string":"Centre for Software Reliability, City University, London, UK","institution_ids":["https://openalex.org/I180825142"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084078677","display_name":"Gabriele Manno","orcid":null},"institutions":[{"id":"https://openalex.org/I39063666","display_name":"University of Catania","ror":"https://ror.org/03a64bh57","country_code":"IT","type":"education","lineage":["https://openalex.org/I39063666"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Gabriele Manno","raw_affiliation_strings":["Department of Mathematics and Informatics, University of Catania, Viale Andrea Doria 6, Catania, Italy","Department of Mathematics and Informatics, University of Catania, Catania, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Mathematics and Informatics, University of Catania, Viale Andrea Doria 6, Catania, Italy","institution_ids":["https://openalex.org/I39063666"]},{"raw_affiliation_string":"Department of Mathematics and Informatics, University of Catania, Catania, Italy","institution_ids":["https://openalex.org/I39063666"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5076873745"],"corresponding_institution_ids":["https://openalex.org/I180825142","https://openalex.org/I35870678"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":1.7966,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.83398899,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7137081623077393},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6576752066612244},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.6286516785621643},{"id":"https://openalex.org/keywords/markov-model","display_name":"Markov model","score":0.5145418047904968},{"id":"https://openalex.org/keywords/correlation","display_name":"Correlation","score":0.508604884147644},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5077232122421265},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5040156245231628},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.49280837178230286},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.49074921011924744},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.48956260085105896},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.42487892508506775},{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.42242830991744995},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.3018541932106018},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21819007396697998},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08393603563308716},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07785594463348389},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07559722661972046}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7137081623077393},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6576752066612244},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.6286516785621643},{"id":"https://openalex.org/C163836022","wikidata":"https://www.wikidata.org/wiki/Q6771326","display_name":"Markov model","level":3,"score":0.5145418047904968},{"id":"https://openalex.org/C117220453","wikidata":"https://www.wikidata.org/wiki/Q5172842","display_name":"Correlation","level":2,"score":0.508604884147644},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5077232122421265},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5040156245231628},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.49280837178230286},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.49074921011924744},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.48956260085105896},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.42487892508506775},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.42242830991744995},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3018541932106018},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21819007396697998},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08393603563308716},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07785594463348389},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07559722661972046},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-642-24270-0_1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-24270-0_1","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1829945313","https://openalex.org/W1979868167","https://openalex.org/W1999823724","https://openalex.org/W2038710499","https://openalex.org/W2062120771","https://openalex.org/W2065769320","https://openalex.org/W2090926309","https://openalex.org/W2109930173","https://openalex.org/W2110584518","https://openalex.org/W2129262519","https://openalex.org/W2135687303","https://openalex.org/W2164404425","https://openalex.org/W2332529192","https://openalex.org/W4236792424"],"related_works":["https://openalex.org/W2053233382","https://openalex.org/W2034080945","https://openalex.org/W2337334590","https://openalex.org/W2006898677","https://openalex.org/W167642385","https://openalex.org/W2162366020","https://openalex.org/W912168359","https://openalex.org/W1030923862","https://openalex.org/W2345792680","https://openalex.org/W2766464071"],"abstract_inverted_index":null,"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}