{"id":"https://openalex.org/W65354074","doi":"https://doi.org/10.1007/978-3-642-24136-9_24","title":"A Novel Approach to Image Assessment by Seeking Unification of Subjective and Objective Criteria Based on Supervised Learning","display_name":"A Novel Approach to Image Assessment by Seeking Unification of Subjective and Objective Criteria Based on Supervised Learning","publication_year":2011,"publication_date":"2011-01-01","ids":{"openalex":"https://openalex.org/W65354074","doi":"https://doi.org/10.1007/978-3-642-24136-9_24","mag":"65354074"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-24136-9_24","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-24136-9_24","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059615376","display_name":"Pipei Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Pipei Huang","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","School of Automation Science and Electrical Engineering, BEIHANG University, Beijing, China#TAB#"],"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, BEIHANG University, Beijing, China#TAB#","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058280770","display_name":"Shiyin Qin","orcid":"https://orcid.org/0000-0002-2663-3813"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shiyin Qin","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","School of Automation Science and Electrical Engineering, BEIHANG University, Beijing, China#TAB#"],"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, BEIHANG University, Beijing, China#TAB#","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014222179","display_name":"Donghuan Lu","orcid":"https://orcid.org/0000-0002-8399-7410"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Donghuan Lu","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","School of Automation Science and Electrical Engineering, BEIHANG University, Beijing, China#TAB#"],"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, BEIHANG University, Beijing, China#TAB#","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5059615376"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.04132791,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"274","last_page":"285"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10057","display_name":"Face and Expression Recognition","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10057","display_name":"Face and Expression Recognition","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7873488068580627},{"id":"https://openalex.org/keywords/unification","display_name":"Unification","score":0.7755194902420044},{"id":"https://openalex.org/keywords/boosting","display_name":"Boosting (machine learning)","score":0.7729304432868958},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6499102115631104},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.6330077648162842},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.5238376259803772},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5110162496566772},{"id":"https://openalex.org/keywords/fuse","display_name":"Fuse (electrical)","score":0.454742431640625},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.40896308422088623}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7873488068580627},{"id":"https://openalex.org/C96146094","wikidata":"https://www.wikidata.org/wiki/Q609057","display_name":"Unification","level":2,"score":0.7755194902420044},{"id":"https://openalex.org/C46686674","wikidata":"https://www.wikidata.org/wiki/Q466303","display_name":"Boosting (machine learning)","level":2,"score":0.7729304432868958},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6499102115631104},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.6330077648162842},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.5238376259803772},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5110162496566772},{"id":"https://openalex.org/C141353440","wikidata":"https://www.wikidata.org/wiki/Q182221","display_name":"Fuse (electrical)","level":2,"score":0.454742431640625},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.40896308422088623},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-642-24136-9_24","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-24136-9_24","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W56894658","https://openalex.org/W1540371141","https://openalex.org/W1583837637","https://openalex.org/W1983341671","https://openalex.org/W2013558814","https://openalex.org/W2024046085","https://openalex.org/W2072419029","https://openalex.org/W2112076978","https://openalex.org/W2117504046","https://openalex.org/W2145073242","https://openalex.org/W2159680539","https://openalex.org/W2912676594"],"related_works":["https://openalex.org/W2367630557","https://openalex.org/W101666983","https://openalex.org/W3000097931","https://openalex.org/W2354322770","https://openalex.org/W2183792531","https://openalex.org/W2595286499","https://openalex.org/W2794344379","https://openalex.org/W4237547500","https://openalex.org/W1570848052","https://openalex.org/W2373192430"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}