{"id":"https://openalex.org/W58550665","doi":"https://doi.org/10.1007/978-3-642-21219-2_13","title":"Diagnosis of Partial Discharge Using Self Organizing Maps and Hierarchical Clustering \u2013 An Approach","display_name":"Diagnosis of Partial Discharge Using Self Organizing Maps and Hierarchical Clustering \u2013 An Approach","publication_year":2011,"publication_date":"2011-01-01","ids":{"openalex":"https://openalex.org/W58550665","doi":"https://doi.org/10.1007/978-3-642-21219-2_13","mag":"58550665"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-21219-2_13","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-21219-2_13","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059942243","display_name":"Rub\u00e9n Jaramillo-Vacio","orcid":null},"institutions":[{"id":"https://openalex.org/I4388891832","display_name":"Centro de Innovaci\u00f3n Aplicada en Tecnolog\u00edas Competitivas","ror":"https://ror.org/039zdhk64","country_code":"MX","type":"facility","lineage":["https://openalex.org/I4210163111","https://openalex.org/I4388891832"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Rub\u00e9n Jaramillo-Vacio","raw_affiliation_strings":["CFE-LAPEM, Mexico","Centro de Innovaci\u00f3n Aplicada en Tecnolog\u00edas Competitivas (CIATEC), Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CFE-LAPEM, Mexico","institution_ids":[]},{"raw_affiliation_string":"Centro de Innovaci\u00f3n Aplicada en Tecnolog\u00edas Competitivas (CIATEC), Mexico","institution_ids":["https://openalex.org/I4388891832"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086190427","display_name":"Alberto Ochoa","orcid":"https://orcid.org/0000-0002-9183-6086"},"institutions":[{"id":"https://openalex.org/I114756412","display_name":"Universidad Aut\u00f3noma de Ciudad Ju\u00e1rez","ror":"https://ror.org/05fj8cf83","country_code":"MX","type":"education","lineage":["https://openalex.org/I114756412"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Alberto Ochoa-Zezzatti","raw_affiliation_strings":["Universidad Aut\u00f3noma de Ciudad Ju\u00e1rez, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidad Aut\u00f3noma de Ciudad Ju\u00e1rez, Mexico","institution_ids":["https://openalex.org/I114756412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016818254","display_name":"S. J\u00f6ns","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. J\u00f6ns","raw_affiliation_strings":["CFE-LAPEM, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CFE-LAPEM, Mexico","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026890065","display_name":"Sergio Ledezma-Orozco","orcid":null},"institutions":[{"id":"https://openalex.org/I129858807","display_name":"Universidad de Guanajuato","ror":"https://ror.org/058cjye32","country_code":"MX","type":"education","lineage":["https://openalex.org/I129858807"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Sergio Ledezma-Orozco","raw_affiliation_strings":["Divisi\u00f3n de Ingenier\u00edas, Universidad de Guanajuato, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Divisi\u00f3n de Ingenier\u00edas, Universidad de Guanajuato, Mexico","institution_ids":["https://openalex.org/I129858807"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009798916","display_name":"Camelia Chira","orcid":"https://orcid.org/0000-0002-1949-1298"},"institutions":[{"id":"https://openalex.org/I3125347698","display_name":"Babe\u0219-Bolyai University","ror":"https://ror.org/02rmd1t30","country_code":"RO","type":"education","lineage":["https://openalex.org/I3125347698"]}],"countries":["RO"],"is_corresponding":false,"raw_author_name":"Camelia Chira","raw_affiliation_strings":["Babes-Bolyai University, Cluj-Napoca, Romania"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Babes-Bolyai University, Cluj-Napoca, Romania","institution_ids":["https://openalex.org/I3125347698"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":2.0958,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.85955754,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"91","last_page":"98"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9728000164031982,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14249","display_name":"Water Quality Monitoring and Analysis","score":0.949999988079071,"subfield":{"id":"https://openalex.org/subfields/2311","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8154404163360596},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.8015282154083252},{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.8000355958938599},{"id":"https://openalex.org/keywords/hierarchical-clustering","display_name":"Hierarchical clustering","score":0.6198623776435852},{"id":"https://openalex.org/keywords/self-organizing-map","display_name":"Self-organizing map","score":0.6119328737258911},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.539539098739624},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.492570698261261},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4922563135623932},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.4537808895111084},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4230976700782776},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.061769187450408936}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8154404163360596},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.8015282154083252},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.8000355958938599},{"id":"https://openalex.org/C92835128","wikidata":"https://www.wikidata.org/wiki/Q1277447","display_name":"Hierarchical clustering","level":3,"score":0.6198623776435852},{"id":"https://openalex.org/C111168008","wikidata":"https://www.wikidata.org/wiki/Q1136838","display_name":"Self-organizing map","level":3,"score":0.6119328737258911},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.539539098739624},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.492570698261261},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4922563135623932},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.4537808895111084},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4230976700782776},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.061769187450408936},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-642-21219-2_13","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-21219-2_13","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W27895563","https://openalex.org/W1545057399","https://openalex.org/W2110802877","https://openalex.org/W2112440119","https://openalex.org/W2140401736","https://openalex.org/W2140785014","https://openalex.org/W2153736474","https://openalex.org/W2161660876","https://openalex.org/W2171209182","https://openalex.org/W2494852501","https://openalex.org/W2531315881","https://openalex.org/W4301773902"],"related_works":["https://openalex.org/W2393409683","https://openalex.org/W4282008660","https://openalex.org/W2834849852","https://openalex.org/W2955994650","https://openalex.org/W2066632781","https://openalex.org/W2536936696","https://openalex.org/W2016042781","https://openalex.org/W2294135824","https://openalex.org/W3200375535","https://openalex.org/W1485794011"],"abstract_inverted_index":null,"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}