{"id":"https://openalex.org/W55410218","doi":"https://doi.org/10.1007/978-3-642-19853-3_64","title":"Calibration Model for Electrical Capacitance Tomography Sensor with Thin Radial Guards","display_name":"Calibration Model for Electrical Capacitance Tomography Sensor with Thin Radial Guards","publication_year":2011,"publication_date":"2011-01-01","ids":{"openalex":"https://openalex.org/W55410218","doi":"https://doi.org/10.1007/978-3-642-19853-3_64","mag":"55410218"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-19853-3_64","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-19853-3_64","pdf_url":null,"source":{"id":"https://openalex.org/S2764900261","display_name":"Communications in computer and information science","issn_l":"1865-0929","issn":["1865-0929","1865-0937"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Computer and Information Science","raw_type":"book-chapter"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101515761","display_name":"Xiangyuan Dong","orcid":"https://orcid.org/0000-0002-9739-9550"},"institutions":[{"id":"https://openalex.org/I132586189","display_name":"Zhongyuan University of Technology","ror":"https://ror.org/0360zcg91","country_code":"CN","type":"education","lineage":["https://openalex.org/I132586189"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangyuan Dong","raw_affiliation_strings":["Zhongyuan University of Technology, Zhengzhou, 450007, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhongyuan University of Technology, Zhengzhou, 450007, China","institution_ids":["https://openalex.org/I132586189"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051202669","display_name":"Shuqing Guo","orcid":"https://orcid.org/0000-0003-2542-9682"},"institutions":[{"id":"https://openalex.org/I132586189","display_name":"Zhongyuan University of Technology","ror":"https://ror.org/0360zcg91","country_code":"CN","type":"education","lineage":["https://openalex.org/I132586189"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuqing Guo","raw_affiliation_strings":["Zhongyuan University of Technology, Zhengzhou, 450007, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhongyuan University of Technology, Zhengzhou, 450007, China","institution_ids":["https://openalex.org/I132586189"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I132586189"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"438","last_page":"443"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.9861999750137329,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-capacitance-tomography","display_name":"Electrical capacitance tomography","score":0.7976861000061035},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.742641806602478},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7281538844108582},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.51722252368927},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4219813942909241},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40554118156433105},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4042518138885498},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4009823203086853},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.30610477924346924},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23726844787597656}],"concepts":[{"id":"https://openalex.org/C2777418626","wikidata":"https://www.wikidata.org/wiki/Q2584887","display_name":"Electrical capacitance tomography","level":4,"score":0.7976861000061035},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.742641806602478},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7281538844108582},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.51722252368927},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4219813942909241},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40554118156433105},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4042518138885498},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4009823203086853},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.30610477924346924},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23726844787597656},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-642-19853-3_64","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-19853-3_64","pdf_url":null,"source":{"id":"https://openalex.org/S2764900261","display_name":"Communications in computer and information science","issn_l":"1865-0929","issn":["1865-0929","1865-0937"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Computer and Information Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.800000011920929,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1969121263","https://openalex.org/W1978679709","https://openalex.org/W1984325836","https://openalex.org/W2070046128","https://openalex.org/W2080428027","https://openalex.org/W2089292080","https://openalex.org/W2354975618","https://openalex.org/W4236040086"],"related_works":["https://openalex.org/W2065013354","https://openalex.org/W1974831921","https://openalex.org/W2362942457","https://openalex.org/W2056641994","https://openalex.org/W2364971604","https://openalex.org/W2009640073","https://openalex.org/W1971900134","https://openalex.org/W1973400749","https://openalex.org/W2393881606","https://openalex.org/W1969121263"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}